Impedance transformer and applications thereof
    3.
    发明授权
    Impedance transformer and applications thereof 失效
    阻抗变压器及其应用

    公开(公告)号:US07750787B2

    公开(公告)日:2010-07-06

    申请号:US11473810

    申请日:2006-06-22

    IPC分类号: H01F27/28

    摘要: An impedance transformer includes a first winding and a second winding. The first winding includes a first plurality of winding components, wherein each of the first plurality of winding components is on a corresponding layer of a first set of layers of a supporting substrate. The second winding includes a second plurality of winding components, wherein each of the second plurality of winding components is on a corresponding layer of a second set of layers of the supporting substrate and the first and second sets of layers are interleaved. The first winding has a first impedance within a desired frequency range and the second winding has a second impedance within the desired frequency range, where the first and second impedances are based on at least one of spacing, trace width, and trace length of the first and second plurality of winding components.

    摘要翻译: 阻抗变换器包括第一绕组和第二绕组。 第一绕组包括第一多个绕组部件,其中第一多个绕组部件中的每一个在支撑衬底的第一组层的相应层上。 第二绕组包括第二多个绕组部件,其中第二多个绕组部件中的每一个位于支撑衬底的第二组层的相应层上,并且第一和第二组层被交错。 第一绕组具有期望频率范围内的第一阻抗,并且第二绕组在期望频率范围内具有第二阻抗,其中第一和第二阻抗基于第一和第二阻抗的间隔,迹线宽度和迹线长度中的至少一个 和第二组绕组部件。

    Impedance transformer and applications thereof
    4.
    发明授权
    Impedance transformer and applications thereof 有权
    阻抗变压器及其应用

    公开(公告)号:US07973636B2

    公开(公告)日:2011-07-05

    申请号:US12789677

    申请日:2010-05-28

    IPC分类号: H01F27/28

    摘要: An impedance transformer includes a first winding and a second winding. The first winding includes a first plurality of winding components, wherein each of the first plurality of winding components is on a corresponding layer of a first set of layers of a supporting substrate. The second winding includes a second plurality of winding components, wherein each of the second plurality of winding components is on a corresponding layer of a second set of layers of the supporting substrate and the first and second sets of layers are interleaved. The first winding has a first impedance within a desired frequency range and the second winding has a second impedance within the desired frequency range, where the first and second impedances are based on at least one of spacing, trace width, and trace length of the first and second plurality of winding components.

    摘要翻译: 阻抗变换器包括第一绕组和第二绕组。 第一绕组包括第一多个绕组部件,其中第一多个绕组部件中的每一个在支撑衬底的第一组层的相应层上。 第二绕组包括第二多个绕组部件,其中第二多个绕组部件中的每一个位于支撑衬底的第二组层的相应层上,并且第一和第二组层被交错。 第一绕组具有期望频率范围内的第一阻抗,并且第二绕组在期望频率范围内具有第二阻抗,其中第一和第二阻抗基于第一和第二阻抗的间隔,迹线宽度和迹线长度中的至少一个 和第二组绕组部件。

    IMPEDANCE TRANSFORMER AND APPLICATIONS THEREOF
    5.
    发明申请
    IMPEDANCE TRANSFORMER AND APPLICATIONS THEREOF 有权
    阻抗变压器及其应用

    公开(公告)号:US20100237974A1

    公开(公告)日:2010-09-23

    申请号:US12789677

    申请日:2010-05-28

    IPC分类号: H01F27/28

    摘要: An impedance transformer includes a first winding and a second winding. The first winding includes a first plurality of winding components, wherein each of the first plurality of winding components is on a corresponding layer of a first set of layers of a supporting substrate. The second winding includes a second plurality of winding components, wherein each of the second plurality of winding components is on a corresponding layer of a second set of layers of the supporting substrate and the first and second sets of layers are interleaved. The first winding has a first impedance within a desired frequency range and the second winding has a second impedance within the desired frequency range, where the first and second impedances are based on at least one of spacing, trace width, and trace length of the first and second plurality of winding components.

    摘要翻译: 阻抗变换器包括第一绕组和第二绕组。 第一绕组包括第一多个绕组部件,其中第一多个绕组部件中的每一个在支撑衬底的第一组层的相应层上。 第二绕组包括第二多个绕组部件,其中第二多个绕组部件中的每一个位于支撑衬底的第二组层的相应层上,并且第一和第二组层被交错。 第一绕组具有期望频率范围内的第一阻抗,并且第二绕组在期望频率范围内具有第二阻抗,其中第一和第二阻抗基于第一和第二阻抗的间隔,迹线宽度和迹线长度中的至少一个 和第二组绕组部件。

    Creating a system on the fly and applications thereof
    6.
    发明授权
    Creating a system on the fly and applications thereof 有权
    快速创建系统及其应用

    公开(公告)号:US08995931B2

    公开(公告)日:2015-03-31

    申请号:US12877938

    申请日:2010-09-08

    摘要: Disclosed herein are systems, apparatuses, and methods for creating a system of wireless-enabled components (WECs). Such a system includes a server and a plurality of wireless-enabled component (WECs). Each WEC includes a functional resource (e.g., a processing resource and/or a memory resource) and is configured for wireless communication with the server and one or more other WECs. A first WEC is configured to wirelessly upload, to the server, an availability of the functional resource of the first WEC. The first WEC is further configured to wirelessly download, from the server, a linking resource for linking with one or more of the plurality of WECs. The plurality of WECs may be located on a single chip, on multiple chips of a single device, or on multiple chips of multiple devices.

    摘要翻译: 这里公开了用于创建无线组件(WEC)的系统的系统,设备和方法。 这样的系统包括服务器和多个无线使能组件(WEC)。 每个WEC包括功能资源(例如,处理资源和/或存储器资源),并且被配置用于与服务器和一个或多个其他WEC的无线通信。 第一WEC被配置为向服务器无线地上传第一WEC的功能资源的可用性。 第一WEC还被配置为从服务器无线地下载链接资源,用于与多个WEC中的一个或多个相关联。 多个WEC可以位于单个芯片上,在单个设备的多个芯片上,或者位于多个设备的多个芯片上。

    Tagging of functional blocks of a semiconductor component on a wafer
    7.
    发明授权
    Tagging of functional blocks of a semiconductor component on a wafer 有权
    标记晶片上半导体元件的功能块

    公开(公告)号:US08952712B2

    公开(公告)日:2015-02-10

    申请号:US13025665

    申请日:2011-02-11

    摘要: Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a self-contained testing operation to wireless automatic test equipment via a common communication channel. Multiple receiving antennas observe the outcomes from multiple directions in three dimensional space. The wireless automatic test equipment determines whether one or more of the semiconductor components operate as expected and, optionally, may use properties of the three dimensional space to determine a location of one or more of the semiconductor components. The wireless testing equipment may additionally determine performance of the semiconductor components by detecting infrared energy emitted, transmitted, and/or reflected by the semiconductor wafer before, during, and/or after a self-contained testing operation.

    摘要翻译: 公开了同时无线地测试形成在半导体晶片上的半导体元件的方法和装置。 半导体部件通过公共通信信道将各自的测试结果传送到无线自动测试设备。 多个接收天线在三维空间中观察多个方向的结果。 无线自动测试设备确定一个或多个半导体组件是否按预期运行,并且可选地,可以使用三维空间的属性来确定一个或多个半导体组件的位置。 无线测试设备还可以通过检测在独立测试操作之前,期间和/或之后由半导体晶片发射,传输和/或反射的红外能量来确定半导体组件的性能。

    Proximity coupling without Ohmic contact and applications thereof
    10.
    发明授权
    Proximity coupling without Ohmic contact and applications thereof 有权
    没有欧姆接触的接近耦合及其应用

    公开(公告)号:US08351855B2

    公开(公告)日:2013-01-08

    申请号:US12877942

    申请日:2010-09-08

    IPC分类号: H04B5/00

    摘要: Disclosed herein are systems, apparatuses, and methods for providing a proximity coupling without Ohmic contact. Such a system includes a plurality of wireless-enabled components (WECs) that are wirelessly coupled to each other. Each WEC includes a metal-based element, a substrate, and a semiconductor layer that separates the metal-based element from the substrate. A signal is configured to be transmitted via a proximity coupling (e.g., a magnetic coupling, an electric coupling, and/or an electromagnetic coupling) between the metal-based element and the substrate without an Ohmic contact between the metal-based element and the substrate. In an example, a first subset of the plurality of the WECs is co-located on a first chip, and a second subset of the plurality of the WECs is co-located on a second chip. The first chip and the second chip may be located in a single device or in separate devices.

    摘要翻译: 本文公开了用于在没有欧姆接触的情况下提供接近耦合的系统,装置和方法。 这样的系统包括彼此无线耦合的多个无线功能组件(WEC)。 每个WEC包括金属基元件,衬底和将金属基元件与衬底分离的半导体层。 信号被配置为通过金属基元件和衬底之间的邻近耦合(例如,磁耦合,电耦合和/或电磁耦合)传输,而在金属基元件和衬底之间没有欧姆接触 基质。 在一个示例中,多个WEC的第一子集共同位于第一芯片上,并且多个WEC的第二子集共同位于第二芯片上。 第一芯片和第二芯片可以位于单个设备中或者位于单独的设备中。