摘要:
[Problems to be solved] To provide a test-use individual substrate capable of improving testing accuracy and connecting reliability.[Means for solving the Problems] A test-use individual substrate 30 which is used for testing a semiconductor wafer, comprises a main body portion 31, thin portions 321, 322 extending from the main body portion 31 and being relatively thinner than the main body portion, and bumps 33 provided on the thin portions 321, 322. [Selected Drawing] FIG. 4
摘要:
A method and a structure of electrically connecting a conductive fiber in fabric to an external device electrically connects the conductive fiber to the external device by pressing a conductive member that is electrically connected to the external device against the fabric.
摘要:
A connection member which is electrically connected to a conductive fabric having conductive threads, a method for manufacturing the connection member, and a connection structure are provided. The connection member includes a band-shaped part including conductive wires which extend in a longitudinal direction, and a connection terminal which is attached to an end portion of the conductive wires. The method includes forming an original band-shaped member by weaving while using the conductive wires for a part of warp and using at least non-conductive threads for weft; exposing the conductive wires at an end portion of the original band-shaped member;and attaching a connection terminal to the exposed conductive wires. The connection structure includes the conductive fabric and the connection member, and the conductive wires of the connection member are electrically connected to the conductive threads exposed from the conductive fabric.
摘要:
A manufacturing method for a skin material of a vehicle interior equipment includes exposing a conductive wire material by removing a main fiber material from a first fabric material formed of the conductive wire material and the main fiber material that is weaker than the conductive wire material and electrically connecting a conductive member, which is used to supply electric power to the conductive wire material, to the exposed portion of the conductive wire material.
摘要:
A semiconductor device includes a first pattern and a plurality of second patterns arranged at equal intervals. When the distance of the space between the first pattern and the second pattern closet to the first pattern is larger than a first distance, a plurality of dummy patterns are arranged in the space with shapes and intervals similar to those of the second patterns. When the distance of the space is equal to or less than the first distance and larger than a second distance, the dummy pattern is spaced from the second pattern closest to the first pattern, and extends toward the first pattern to be brought into contact with the first pattern. When the distance of the space is equal to or less than the second distance, the dummy pattern is spaced from the second pattern closest to the first pattern, and is connected to the first pattern.
摘要:
In a skin material of vehicle interior equipment, which includes a first fabric material that is formed of a first conductive wire material and a main fiber material weaker than the first conductive wire material, and a manufacturing method for the skin material, part of the main fiber material is removed from the first fabric material, and a conductive member, which is used to supply electric power to the conductive wire material, is electrically connected to the exposed first conductive wire material.