INTEGRATED CIRCUIT STRUCTURE
    3.
    发明公开

    公开(公告)号:US20230376672A1

    公开(公告)日:2023-11-23

    申请号:US18362946

    申请日:2023-07-31

    摘要: An IC structure includes a first cell and a first and second rail. The first cell includes a first and second active region and a first, a second and a third gate structure. The first active region having a first dopant type. The second active region having a second dopant type. The first gate structure extending in a second direction, overlapping the first or the second active region. The second gate structure extending in the second direction, and overlapping a first edge of the first or second active region. The third gate structure extending in the second direction, and overlapping at least a second edge of the first or second active region. The first rail extending in the first direction and overlapping a middle portion of the first active region. The second rail extending in the first direction and overlapping a middle portion of the second active region.

    METHOD OF FORMING SEMICONDUCTOR DEVICE INCLUDING DEEP VIAS

    公开(公告)号:US20230163066A1

    公开(公告)日:2023-05-25

    申请号:US18156711

    申请日:2023-01-19

    IPC分类号: H01L23/522 G06F30/394

    CPC分类号: H01L23/5226 G06F30/394

    摘要: A method of manufacturing a semiconductor device includes forming via structures in a first via layer over a transistor layer, the forming the via structures in the first via layer including forming a first via structure in the first via layer, the first via structure being included in a first deep via arrangement; forming conductive segments in a first metallization layer over the first via layer, the forming the conductive segments in the first metallization layer including forming M_1st routing segments at least a majority of which, relative to a first direction, have corresponding long axes with lengths which at least equal if not exceed a first permissible minimum value for routing segments in the first metallization layer; and forming an M_1st interconnection segment having a long axis which is less than the first permissible minimum value, the M_1st interconnection segment being included in the first deep via arrangement.

    INTEGRATED CIRCUIT DEVICE
    6.
    发明申请

    公开(公告)号:US20220271025A1

    公开(公告)日:2022-08-25

    申请号:US17740328

    申请日:2022-05-09

    摘要: An IC device includes a first active area extending away from a first endpoint in a first direction, a second active area extending away from a second endpoint in the first direction, a third active area positioned between the first and second active areas, and a gate structure perpendicular to the first through third active areas. The gate structure overlies each of the first and second endpoints and the third active area, and the third active area extends away from the gate structure in a second direction opposite the first direction.

    METHOD AND SYSTEM OF EXPANDING SET OF STANDARD CELLS WHICH COMPRISE A LIBRARY

    公开(公告)号:US20200272778A1

    公开(公告)日:2020-08-27

    申请号:US15930010

    申请日:2020-05-12

    IPC分类号: G06F30/327

    摘要: A method includes: identifying ad hoc groups of elementary standard cells recurrent in a layout diagram, selecting one of the recurrent ad hoc groups (selected group) such that: the elementary standard cells in the selected group have connections representing a corresponding logic circuit; each elementary standard cell representing a logic gate; each ad hoc group has a number of transistors and a first number of logic gates; and the selected group providing a logical function. The method includes generating one or more macro standard cells such that: each macro standard cell has a number of transistors which is smaller than the number of transistors of the corresponding ad hoc group; or each macro standard cell has a second number of logic gates different than the first number of logic gates of the corresponding ad hoc group. The method also includes adding macro standard cells to the set of standard cells.

    INTEGRATED CIRCUIT LAYOUT METHOD, DEVICE, AND SYSTEM

    公开(公告)号:US20200006316A1

    公开(公告)日:2020-01-02

    申请号:US16204678

    申请日:2018-11-29

    摘要: A method of generating a layout diagram of an IC cell includes defining a boundary recess in a boundary of the cell by extending a first portion of the boundary along a first direction, extending a second portion of the boundary away from the first portion in a second direction perpendicular to the first direction, the second portion being contiguous with the first portion, and extending a third portion of the boundary away from the first portion in the second direction, the third portion being contiguous with the first portion. An active region is positioned in the cell by extending the active region away from the first portion in a third direction opposite to the second direction. The layout diagram is stored on a non-transitory computer-readable medium.