STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS

    公开(公告)号:US20220406366A1

    公开(公告)日:2022-12-22

    申请号:US17653033

    申请日:2022-03-01

    申请人: TOHOKU UNIVERSITY

    摘要: A storage circuit includes a memory cell array of memory cells each including a variable resistance type element, a resistance-voltage conversion circuit RTj to convert a resistance value of a memory cell MCij to be read to a data voltage, a reference circuit and RTR to generate a reference voltage, a sense amplifier to determine read data by receiving the data voltage and the reference voltage via first and second input terminals, respectively, and comparing both voltages with each other, and an analog buffer circuit arranged between the resistance-voltage conversion circuit RTj and a first input terminal of the sense amplifier or between the reference circuit and RTR and a second input terminal of the sense amplifier. Current driving capability of the analog buffer circuit is large.

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    5.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 审中-公开
    半导体器件及其制造方法

    公开(公告)号:US20150194437A1

    公开(公告)日:2015-07-09

    申请号:US14662194

    申请日:2015-03-18

    IPC分类号: H01L27/115 H01L29/66

    摘要: A semiconductor device includes a channel layer protruding from a substrate and having protrusions extending from a sidewall thereof. Floating gates surrounding the channel layer are provided between the protrusions. Control gates surrounding the floating gates are stacked along the channel layer. Interlayer insulating layers are interposed between the control gates stacked along the channel layer. A level difference exists between a lateral surface of each of the floating gates, and a lateral surface of each of the protrusions.

    摘要翻译: 半导体器件包括从衬底突出并具有从其侧壁延伸的突起的沟道层。 围绕通道层的浮栅设置在突起之间。 沿着沟道层堆叠围绕浮动栅极的控制栅极。 层间绝缘层介于沿通道层堆叠的控制栅之间。 每个浮动栅极的侧表面和每个突起的侧表面之间存在水平差。

    MAGNETORESISTIVE ELEMENT AND MAGNETIC MEMORY DEVICE

    公开(公告)号:US20230147268A1

    公开(公告)日:2023-05-11

    申请号:US17899868

    申请日:2022-08-31

    申请人: TOHOKU UNIVERSITY

    IPC分类号: H10N52/80 H10B61/00 H10N52/85

    CPC分类号: H10N52/80 H10B61/00 H10N52/85

    摘要: A magnetoresistive effect element includes a reference layer, a barrier layer, a recording layer, and a channel layer that are disposed on top of one another, and a first terminal connected to the reference layer, and a second terminal and a third terminal connected to the channel layer. The channel layer includes a first channel layer and a second channel layer, the first channel layer has electrical resistance larger than electrical resistance of the second channel layer, the second terminal is connected to the first channel layer, and the third terminal is connected to the second channel layer, a write current flows between the second terminal and the third terminal via the first channel layer and the second channel layer, and a read current flows between the first terminal and the third terminal.

    STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS, AND ITS TEST DEVICE

    公开(公告)号:US20220172761A1

    公开(公告)日:2022-06-02

    申请号:US17395210

    申请日:2021-08-05

    申请人: TOHOKU UNIVERSITY

    IPC分类号: G11C11/16 G11C29/04

    摘要: A storage circuit includes: the array of a memory cell MC including a variable-resistance element; a conversion circuit that converts the resistance value of each memory cell into the signal level of an electric signal; a reference signal generation circuit that generates a reference signal common to a plurality of columns; a correction circuit that corrects one of the signal level of the reference signal and the signal level of the electric signal for each column of the array of the memory cell; and an RW circuit that determines data stored in the memory cell belonging to a corresponding column by comparing one of the reference level and the signal level of the electric signal, corrected by the correction circuit, and the other of the reference level and the signal level of the electric signal.

    MAGNETIC TUNNEL JUNCTION ELEMENT AND MAGNETIC MEMORY

    公开(公告)号:US20190304526A1

    公开(公告)日:2019-10-03

    申请号:US16308166

    申请日:2017-05-19

    申请人: TOHOKU UNIVERSITY

    IPC分类号: G11C11/16 H01L27/22 H01L43/10

    摘要: A magnetic tunnel junction element with a high MR ratio, and can prevent a recording layer from being damaged, and magnetic memory. A reference layer includes a ferromagnetic body, and has magnetization direction fixed in the vertical direction. A barrier layer includes non-magnetic body, and disposed on one surface side of the reference layer. A recording layer is disposed to sandwich barrier layer between itself and reference layer. The recording layer includes a first ferromagnetic layer including at least one of Co and Fe, and having a magnetization direction variable in vertical direction; a first non-magnetic layer including at least one of Mg, MgO, C, Li, Al, and Si, second non-magnetic layer including at least one of Ta, Hf, W, Mo, Nb, Zr, Y, Sc, Ti, V, and Cr, and second ferromagnetic layer including at least one of Co and Fe, and having a magnetization direction variable in vertical direction.