Reaction and heat exchanger apparatus
    1.
    发明授权
    Reaction and heat exchanger apparatus 失效
    反应和热交换器装置

    公开(公告)号:US4552724A

    公开(公告)日:1985-11-12

    申请号:US599279

    申请日:1984-04-11

    摘要: A reaction vessel including a generally cylindrical center part and two plates or discs which are secured to and close the ends of the center part. The reactant is fed into the interior of the vessel where the polymerization or other chemical reaction takes place. A heat transfer or heat exchanger system is formed by a smooth liner that is mounted coaxially with and within the interior of the center part. The liner is spaced from the center part and it is secured to the center part by a plurality of support portions. The support portions serve both to brace the liner so that it can withstand the pressure of the reactant, and as partitions which form flow paths for a coolant, between the liner and the center part. Further, the liner includes a plurality of strip portions having a width which is substantially equal to the distance between said support portions, said strip portions extending substantially parallel to each other and to said support portions, and said strip portions extending between the radially inner edges of two support portions.

    摘要翻译: 反应容器包括大致圆柱形的中心部分和两个固定到中心部分的端部并封闭其中心部分的两个板或盘。 将反应物进料到聚合或其它化学反应发生的容器的内部。 传热或热交换器系统由与中心部分的内部同轴并在其内部安装的光滑衬套形成。 衬套与中心部分间隔开,并且通过多个支撑部分固定到中心部分。 支撑部分用于支撑衬套,使得其可承受反应物的压力,并且作为在衬套和中心部分之间形成用于冷却剂的流动路径的隔板。 此外,衬套包括多个带状部分,其宽度基本上等于所述支撑部分之间的距离,所述带状部分基本上彼此平行延伸并延伸到所述支撑部分,并且所述带状部分在径向内边缘 的两个支撑部分。

    Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
    2.
    发明授权
    Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method 有权
    探针装置,设置有探针装置的晶片检查装置和晶片检查方法

    公开(公告)号:US07446544B2

    公开(公告)日:2008-11-04

    申请号:US10593830

    申请日:2005-03-30

    IPC分类号: G01R31/02

    摘要: A probe device including a circuit board for inspection having a great number of inspection electrodes, a probe card having a circuit board for connection having a great number of terminal electrodes and a contact member, an anisotropically conductive connector arranged between the circuit board for inspection and the circuit board for connection and electrically connecting the respective inspection electrodes to the respective terminal electrodes, and a parallelism adjusting mechanism for adjusting a parallelism of the circuit board for inspection and the circuit board for connection to the wafer. The parallelism adjusting mechanism includes a location-varying mechanism, which relatively displaces the circuit board for inspection or the circuit board for connection in the thickness-wise direction of the anisotropically conductive connector. A wafer inspection apparatus can include the probe device.

    摘要翻译: 一种探针装置,包括具有大量检查电极的用于检查的电路板,具有多个端子电极的连接用电路板的探针卡和接触构件,配置在检查用电路基板之间的各向异性导电性连接器, 用于将各个检查电极连接到各个端子电极的电路板,以及用于调整用于检查的电路板的平行度的平行度调节机构和用于连接到晶片的电路板。 平行度调节机构包括相对位移用于检查的电路板或用于在各向异性导电连接器的厚度方向上连接的电路板的位置变化机构。 晶片检查装置可以包括探针装置。

    Die for molding disk substrate and method of manufacturing disk substrate
    3.
    发明授权
    Die for molding disk substrate and method of manufacturing disk substrate 失效
    用于成型盘基片的模具及其制造方法

    公开(公告)号:US07311516B2

    公开(公告)日:2007-12-25

    申请号:US10547552

    申请日:2004-02-25

    申请人: Kazuo Inoue

    发明人: Kazuo Inoue

    IPC分类号: B29C45/00

    摘要: A die for molding a disk substrate capable of forming fine recessed and projected pits and grooves up to the outer periphery of the disk substrate by preventing low heat conductive elements from peeling off and burrs from occurring on the outer periphery thereof. The die includes a first base die, a second base die disposed oppositely to the first base die, a first low heat conductive element fixed to the first base die, a stamper fixed onto the first low heat conductive element, a second low heat conductive element fixed onto the second base die, and a ring-like regulating member fitted to and in slidable contact with either of the first and second low heat conductive elements. The die is characterized in that the end part of the ring-shaped regulating member is positioned within the range of the outer peripheral side face of the low heat conductive element in slidable contact therewith.

    摘要翻译: 一种用于模制盘形基板的模具,其能够通过防止低热传导元件剥离并在其外周产生毛刺,从而能够形成到盘基板的外周的精细凹凸投影凹槽。 模具包括第一基模,与第一基模相对设置的第二基模,固定到第一基模的第一低导热元件,固定在第一低导热元件上的压模,第二低导热元件 固定到第二基模上,以及环形调节构件,其安装到第一和第二低导热元件中的任一个上并与之滑动接触。 模具的特征在于,环形调节构件的端部位于低导热元件的外周侧面的范围内,与滑动接触。

    Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
    4.
    发明申请
    Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method 有权
    探针装置,设置有探针装置的晶片检查装置和晶片检查方法

    公开(公告)号:US20070178727A1

    公开(公告)日:2007-08-02

    申请号:US10593830

    申请日:2005-03-30

    IPC分类号: H01R4/58

    摘要: A probe device including a circuit board for inspection having a great number of inspection electrodes, a probe card having a circuit board for connection having a great number of terminal electrodes and a contact member, an anisotropically conductive connector arranged between the circuit board for inspection and the circuit board for connection and electrically connecting the respective inspection electrodes to the respective terminal electrodes, and a parallelism adjusting mechanism for adjusting a parallelism of the circuit board for inspection and the circuit board for connection to the wafer. The parallelism adjusting mechanism includes a location-varying mechanism, which relatively displaces the circuit board for inspection or the circuit board for connection in the thickness-wise direction of the anisotropically conductive connector. A wafer inspection apparatus can include the probe device.

    摘要翻译: 一种探针装置,包括具有大量检查电极的用于检查的电路板,具有多个端子电极的连接用电路板的探针卡和接触构件,配置在检查用电路基板之间的各向异性导电性连接器, 用于将各个检查电极连接到各个端子电极的电路板,以及用于调整用于检查的电路板的平行度的平行度调节机构和用于连接到晶片的电路板。 平行度调节机构包括相对位移用于检查的电路板或用于在各向异性导电连接器的厚度方向上连接的电路板的位置变化机构。 晶片检查装置可以包括探针装置。

    Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method
    5.
    发明申请
    Anisotropic conductive connector, conductive paste composition, probe member, wafer inspection device and wafer inspection method 有权
    各向异性导电连接器,导电膏组合物,探针构件,晶片检查装置和晶圆检查方法

    公开(公告)号:US20060211280A1

    公开(公告)日:2006-09-21

    申请号:US10548832

    申请日:2004-03-23

    IPC分类号: H01R4/58

    摘要: Disclosed herein are an anisotropically conductive connector, by which good conductivity is retained over a long period of time even when it is used in electrical inspection of a plurality of integrated circuits formed on a wafer repeatedly over a great number of times, and thus high durability and long service life are achieved, and applications thereof. The anisotropically conductive connector of the invention comprises elastic anisotropically conductive films, in each of which a plurality of conductive parts for connection containing conductive particles and extending in a thickness-wise direction of the film have been formed. The conductive particles contained in the conductive parts for connection in the anisotropically conductive connector are obtained by laminating surfaces of core particles exhibiting magnetism with a coating layer formed of a high-conductive metal, and the coating layer is a coating layer having a high hardness.

    摘要翻译: 这里公开了各向异性导电连接器,即使在多次重复地形成在晶片上的多个集成电路的电气检查中,长时间保持良好的导电性,因此具有高耐久性 使用寿命长,使用寿命长。 本发明的各向异性导电连接器包括弹性各向异性导电膜,其中每个导电膜已形成多个用于连接的导电部件,其中包含导电颗粒并在膜的厚度方向上延伸。 包含在各向异性导电连接器中用于连接的导电部件中的导电颗粒通过将表现出磁性的芯颗粒的表面与由高导电性金属形成的涂层层压而获得,并且涂层是具有高硬度的涂层。

    Optical disk and method for producing the same
    7.
    发明申请
    Optical disk and method for producing the same 失效
    光盘及其制造方法

    公开(公告)号:US20050031778A1

    公开(公告)日:2005-02-10

    申请号:US10911665

    申请日:2004-08-05

    申请人: Kazuo Inoue

    发明人: Kazuo Inoue

    IPC分类号: B05D5/06 G11B7/24 G11B7/26

    摘要: An optical disk is constructed such that a thin film including a reflective layer is formed on a substrate, or on a thermoplastic resin layer on the substrate. A stamper having an asperity pattern corresponding to information signals is directly pressed against the thin film to transfer the asperity pattern on the thin film. Heat-pressing the stamper against the thin film makes it possible to further accurately transfer the asperity of the stamper to the reflective layer with less pressing force, in the case where the reflective layer is formed on the thermoplastic resin layer.

    摘要翻译: 构造光盘,使得在基板上或基板上的热塑性树脂层上形成包括反射层的薄膜。 将具有对应于信息信号的粗糙图案的压模直接压在薄膜上,以将薄片上的凹凸图案转印。 在热塑性树脂层上形成反射层的情况下,通过将压模热压到薄膜上,能够以较小的压力将精密凹凸的凹凸传递到反射层。

    Liquid-crystal panel of polymer dispersed type, method of manufacturing the same, and liquid-crystal display apparatus
    8.
    发明授权
    Liquid-crystal panel of polymer dispersed type, method of manufacturing the same, and liquid-crystal display apparatus 失效
    聚合物分散型液晶面板及其制造方法以及液晶显示装置

    公开(公告)号:US06246456B1

    公开(公告)日:2001-06-12

    申请号:US09206131

    申请日:1998-12-07

    IPC分类号: G02F11333

    CPC分类号: G02F1/1334 G02F1/13392

    摘要: A liquid-crystal panel comprises a pair of transparent glass substrates each being provided with an electrode. Between the glass substrates are disposed spacers for defining a space and a mixture of droplets of a liquid crystal having a mean diameter of 3.0 &mgr;m or less and of a photo-curing polymer. The edge portions of the glass substrates are sealed with a seal polymer. In curing the photo-curing polymer during the process of manufacturing the liquid-crystal panel, the dose of an ultraviolet ray is set to 500 mJ/cm2 or more so as to reduce the diameters of the droplets of the liquid crystal, thereby preventing light leakage in the state without a voltage applied and improving the contrast. If the spacers are colored, the effect of preventing light leakage is increased. If the spacers are subjected to a surface treatment for rejecting the liquid crystal or composed of a polymer material of the same type as that of the photo-curing polymer, variations in diameter of the droplets of the liquid crystal can be prevented. With the structure, it becomes possible to provide a liquid-crystal panel in which light leakage in the black mode is reduced and which presents uniform and high-contrast display of images.

    摘要翻译: 液晶面板包括一对透明玻璃基板,每个透明玻璃基板设置有电极。 在玻璃基板之间设置间隔物,用于限定平均直径为3.0μm以下的液晶的空间和液滴的混合物,以及光固化型聚合物。 玻璃基板的边缘部分用密封聚合物密封。 在制造液晶面板的过程中固化光固化聚合物时,将紫外线的剂量设定为500mJ / cm 2以上,以减小液晶的液滴的直径,从而防止光 在没有施加电压的状态下泄漏并改善对比度。 如果间隔物着色,则防止漏光的效果增加。 如果间隔物进行表面处理以排除液晶或由与光固化聚合物相同类型的聚合物材料组成,则可以防止液晶的液滴直径的变化。 利用该结构,可以提供一种液晶面板,其中黑模式中的漏光减少并且呈现均匀且高对比度的图像显示。

    Apparatus for making optical disk substrates
    10.
    发明授权
    Apparatus for making optical disk substrates 失效
    光盘基片制造装置

    公开(公告)号:US5820891A

    公开(公告)日:1998-10-13

    申请号:US893688

    申请日:1997-07-14

    申请人: Kazuo Inoue

    发明人: Kazuo Inoue

    摘要: A molding apparatus produces high-density thin type optical disk substrates having good replicability and birefringence sufficient for practical use. In filling the resin into the cavity, the stress on the resin is reduced by controlling the relation of the cavity width and the injection compression force to reduce birefringence. Further, the mirror surface of the mold is maintained at a certain temperature to facilitate the resin flow and a good replicability and reduction of birefringence is achieved by terminating the resin filling and starting the compression process at the time at which the pressure of the resin filling is at a minimum.

    摘要翻译: 成型装置生产具有足够实用的良好的可复制性和双折射率的高密度薄型光盘基片。 在将树脂填充到空腔中时,通过控制腔宽度和注射压缩力的关系来减小树脂上的应力以减少双折射。 此外,模具的镜面保持在一定温度以便于树脂流动,并且通过在树脂填充的压力下终止树脂填充并开始压缩过程来实现双折射的良好的复制性和降低双折射 是至少。