公开(公告)号：US09666302B1

公开(公告)日：2017-05-30

申请号：US14980390

申请日：2015-12-28

Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

Inventor： Ming-Hung Chang ,  Chia-Cheng Chen ,  Ching-Wei Wu

IPC: G01R31/28 ,  G11C29/38 ,  G11C29/44 ,  G11C11/419 ,  G11C11/418

CPC classification number: G11C7/10 ,  G11C7/1045 ,  G11C29/12 ,  G11C29/54 ,  G11C29/70

Abstract: An IC includes a memory core logic unit, an output unit, and an input unit. The memory logic unit is coupled to a plurality of bit cells configured to control read and write of data to and from the plurality of bit cells. The input unit is formed on the integrated circuit. The output unit is formed on the integrated circuit. The input unit includes a second plurality of multiplexers for signal selection, at least one lock up latch for storing data and configured to increase a hold time for the data, and at least one shadow latch configured to store a copy of the data stored in the at least one lock up latch. The output unit includes a first plurality of multiplexers for signal selection and at least one high phase pass latch for storing data.

公开(公告)号：US10705934B2

公开(公告)日：2020-07-07

申请号：US15700877

申请日：2017-09-11

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Ming-Hung Chang ,  Atul Katoch ,  Chia-En Huang ,  Ching-Wei Wu ,  Donald G. Mikan, Jr. ,  Hao-I Yang ,  Kao-Cheng Lin ,  Ming-Chien Tsai ,  Saman M. I. Adham ,  Tsung-Yung Chang ,  Uppu Sharath Chandra

IPC: G06F11/263 ,  G06F1/10 ,  G06F11/22 ,  G06F11/267 ,  G11C29/48 ,  G11C29/32 ,  G11C29/12

Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device. The memory device thereafter passes through the serial input sequence of data or the parallel input sequence of data to provide an output sequence of data in the shift mode of operation or the capture mode of operation or passes through the serial input sequence of data to provide a serial output sequence of scan data in the scan mode of operation.

公开(公告)号：US11256588B2

公开(公告)日：2022-02-22

申请号：US16888013

申请日：2020-05-29

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Ming-Hung Chang ,  Atul Katoch ,  Chia-En Huang ,  Ching-Wei Wu ,  Donald G. Mikan, Jr. ,  Hao-I Yang ,  Kao-Cheng Lin ,  Ming-Chien Tsai ,  Saman M. I. Adham ,  Tsung-Yung Chang ,  Uppu Sharath Chandra

IPC: G06F11/263 ,  G06F1/10 ,  G06F11/22 ,  G06F11/267 ,  G11C29/48 ,  G11C29/32 ,  G11C29/12

Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device. The memory device thereafter passes through the serial input sequence of data or the parallel input sequence of data to provide an output sequence of data in the shift mode of operation or the capture mode of operation or passes through the serial input sequence of data to provide a serial output sequence of scan data in the scan mode of operation.

公开(公告)号：US11734142B2

公开(公告)日：2023-08-22

申请号：US17651595

申请日：2022-02-18

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Ming-Hung Chang ,  Atul Katoch ,  Chia-En Huang ,  Ching-Wei Wu ,  Donald G. Mikan, Jr. ,  Hao-I Yang ,  Kao-Cheng Lin ,  Ming-Chien Tsai ,  Saman M. I. Adham ,  Tsung-Yung Chang ,  Uppu Sharath Chandra

IPC: G06F11/263 ,  G06F1/10 ,  G06F11/22 ,  G06F11/267 ,  G11C29/12 ,  G11C29/32 ,  G11C29/48

CPC classification number: G06F11/263 ,  G06F1/10 ,  G06F11/2273 ,  G06F11/267 ,  G11C29/1201 ,  G11C29/32 ,  G11C29/48

Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device. The memory device thereafter passes through the serial input sequence of data or the parallel input sequence of data to provide an output sequence of data in the shift mode of operation or the capture mode of operation or passes through the serial input sequence of data to provide a serial output sequence of scan data in the scan mode of operation.