Sterilizing method, apparatus and container of solid matter or liquid
matter containing solid matter
    1.
    发明授权
    Sterilizing method, apparatus and container of solid matter or liquid matter containing solid matter 失效
    含有固体物质的固体物质或液体物质的灭菌方法,装置和容器

    公开(公告)号:US5895626A

    公开(公告)日:1999-04-20

    申请号:US619517

    申请日:1996-09-23

    摘要: The invention presents a method, apparatus and container for sterilizing solid matter or liquid matter containing solid matter efficiently in a short time, while preventing deterioration of quality or decline of flavor.In this method, solid matter (a) and liquid matter (b) are separately heated and sterilized, and both are mixed after being sterilized, and put and sealed in a bag (c) or container. When heating and sterilizing the solid matter independently, the solid matter is weight and dispensed in each retainer (c) by the portion of one pack each, and sterilized, and is transferred, after being sterilized, from the retainer (d) into a bag (c) or container, and sealed. Sterilization is executed by rotating the retainer (d) and inducing an agitating action on the inside solid matter. The apparatus comprises a sterilizing tank 22 or 42 for receiving and supporting a plurality of retainers (d) by a plurality of guide rails 22e so as to allow to roll in an aligned state, and an oscillating device 40 or 72 for oscillating it like a seesaw. The retainer (d), that is, a container 81 is formed in a cylindrical cup form on the outer circumference so as to be easy to roll and rotate, and the inner circumference and inner bottom are provided with means for promoting agitation of the solid matter.

    摘要翻译: PCT No.PCT / JP95 / 01732 Sec。 371日期1996年9月23日 102(e)1996年9月23日PCT PCT 1995年8月30日PCT公布。 公开号WO96 / 06540 日期1996年3月7日本发明提供了一种在短时间内有效地消毒含有固体物质的固体物质或液体物质的方法,装置和容器,同时防止质量劣化或风味下降。 在这种方法中,将固体物质(a)和液体物质(b)分别加热灭菌,并在灭菌之后将它们混合,并放入并密封在袋(c)或容器中。 当独立地对固体物进行加热灭菌时,固体物质被重量分配在每个保持器(c)中,每个保持器(c)中的每一个的一部分被灭菌,并且被灭菌后从保持器(d)转移到袋 (c)或容器,并密封。 通过旋转保持器(d)并对内部固体物质引起搅拌作用来进行灭菌。 该装置包括用于通过多个导轨22e接收和支撑多个保持器(d)的消毒罐22或42,以允许以对准的状态滚动;以及振荡装置40或72,用于使其像 跷跷板。 保持器(d)即容器81在圆周杯形状上形成为易于卷绕和旋转,并且内周和内底设置有用于促进固体的搅动的装置 物。

    WAFER CONVEYANCE METHOD AND WAFER CONVEYANCE DEVICE
    3.
    发明申请
    WAFER CONVEYANCE METHOD AND WAFER CONVEYANCE DEVICE 审中-公开
    波浪输送方法和波浪输送装置

    公开(公告)号:US20090297302A1

    公开(公告)日:2009-12-03

    申请号:US12468576

    申请日:2009-05-19

    申请人: Shinji Sakamoto

    发明人: Shinji Sakamoto

    IPC分类号: H01L21/677

    摘要: In order to make it possible to reduce the occurrence of physical damage to wafers during conveyance, a state is established in which wafers W are contained in a wafer cassette 1 standing approximately vertically, and the wafer cassette 1 is conveyed, in this state in which the wafers W are contained in the wafer cassette 1 standing approximately vertically, so that the planes of the wafers W are approximately parallel to the direction of conveyance. Since the wafers are kept in the state of standing approximately vertically, it is possible to reduce the occurrence of bending, as happens when they are held horizontally. Moreover, since the wafer cassette 1 is conveyed while keeping the planes of the wafers approximately parallel to the direction of conveyance, accordingly it is possible to reduce the increase of weight which acts upon the wafers W in the direction perpendicular to their planes caused by acceleration due to vertical shifting, horizontal shifting, or vertical vibration; and therefore it is possible to reduce the occurrence of bending of the wafers W.

    摘要翻译: 为了减少在输送过程中对晶片的物理损坏的可能性,建立了一种状态,其中晶片盒1被容纳在大致垂直放置的晶片盒1中,晶片盒1被传送,在这种状态下 晶片盒1容纳在大致垂直放置的晶片盒1中,使得晶片W的平面大致平行于输送方向。 由于晶片保持大致垂直地站立的状态,因此可以在水平保持时发生弯曲的发生。 此外,由于晶片盒1被输送,同时保持晶片的平面大致平行于输送方向,因此可以减少由加速度引起的垂直于它们的平面的方向作用在晶片W上的重量的增加 由于垂直移动,水平移动或垂直振动; 因此可以减少晶片W的弯曲的发生。

    Method for measuring semiconductor wafer profile and device for measuring the same used therefor
    5.
    发明授权
    Method for measuring semiconductor wafer profile and device for measuring the same used therefor 有权
    用于测量半导体晶片轮廓的方法和用于测量其的装置

    公开(公告)号:US08339594B2

    公开(公告)日:2012-12-25

    申请号:US12953523

    申请日:2010-11-24

    申请人: Shinji Sakamoto

    发明人: Shinji Sakamoto

    IPC分类号: G01N21/00

    CPC分类号: G01B11/24

    摘要: Disclosed is a method for measuring a profile using a device for measuring the profile in which included are: a distance measuring means 2 for measuring the distance to an edge region of a semiconductor wafer 12 in such a manner that light is emitted to be reflected at the edge region and to be detected; a first swing mechanism swingably supporting the distance measuring means 2; and a second swing mechanism swingably supporting the first swing mechanism, the method comprising the steps of: locating angles of the first swing mechanism each of which gives a maximum intensity of received light at each of predetermined angles of the second swing mechanism thereof; calculating contour points using coordinate transformation, thereby enabling points-related data to be acquired to represent a contour profile of the edge region. Thus, the method can be used for edge profile measurement of large-diameter wafers.

    摘要翻译: 公开了一种使用用于测量轮廓的装置来测量轮廓的方法,其中包括:距离测量装置2,用于测量与半导体晶片12的边缘区域的距离,使得发射光以在 边缘区域并被检测; 可摆动地支撑距离测量装置2的第一摆动机构; 以及可摆动地支撑所述第一摆动机构的第二摆动机构,所述方法包括以下步骤:将所述第一摆动机构的角度定位,其中,所述第一摆动机构在其第二摆动机构的每个预定角度处给出最大的接收光强度; 使用坐标变换计算轮廓点,从而能够获取点相关数据以表示边缘区域的轮廓线。 因此,该方法可用于大直径晶片的边缘轮廓测量。

    Charged particle beam drawing apparatus and proximity effect correction method thereof
    6.
    发明授权
    Charged particle beam drawing apparatus and proximity effect correction method thereof 有权
    带电粒子束绘图装置及其接近效应校正方法

    公开(公告)号:US08207514B2

    公开(公告)日:2012-06-26

    申请号:US12882713

    申请日:2010-09-15

    IPC分类号: G21K5/10

    摘要: A charged particle beam drawing apparatus forms a map having meshes, forms representative figures, area of each representative figure in each mesh being equal to gross area of figures in each mesh, and calculates a proximity effect correction dose of the charged particle beam in each mesh on the basis of area of each representative figure in each mesh. If it is necessary to change the proximity effect correction dose of the charged particle beam for drawing at least one pattern corresponding to at least one figure, the charged particle beam drawing apparatus changes area of the at least one figure before the representative figures are formed by a representative figure forming portion, and changes the proximity effect correction dose of the charged particle beam for drawing the at least one pattern corresponding to the at least one figure, calculated by a proximity effect correction dose calculating portion.

    摘要翻译: 带电粒子束描绘装置形成具有网格的图,形成代表性图,每个网格中每个代表图的面积等于每个网格中的图形的总面积,并计算每个网格中的带电粒子束的邻近效应校正剂量 在每个网格中每个代表人物的面积的基础上。 如果需要改变带电粒子束的接近效应校正剂量以绘制与至少一个图形相对应的至少一个图案,则带电粒子束描绘装置在代表性图形形成之前改变至少一个图形的面积, 代表图形形成部分,并且改变用于绘制由邻近效应校正剂量计算部分计算的与至少一个图形相对应的至少一个图案的带电粒子束的邻近效应校正剂量。

    SPATIAL INFORMATION DETECTING APPARATUS
    7.
    发明申请
    SPATIAL INFORMATION DETECTING APPARATUS 有权
    空间信息检测装置

    公开(公告)号:US20090045359A1

    公开(公告)日:2009-02-19

    申请号:US12096019

    申请日:2007-10-10

    IPC分类号: G01N21/84

    摘要: In an apparatus using an intensity-modulated light for detection of spatial information based upon light intensity of light reflected from a target space, a timing synchronization circuit is provided to synchronize a phase of the intensity-modulated light from a light-emitting element with a timing of operating a light-receiving element receiving the intensity-modulated light. The light-receiving element is caused to operate for enabling the detection of intensity of the received light for each of a plurality of phase regions within one cycle of the intensity-modulated light. The timing synchronization circuit functions to compare a cyclic variation determining the operation of the light-receiving element with a cyclic variation associated with an output from a light-emitting element driving circuit in order to keep a constant phase difference between these two cyclic variations.

    摘要翻译: 在使用强度调制光用于基于从目标空间反射的光的光强度来检测空间信息的装置中,提供定时同步电路以使来自发光元件的强度调制光的相位与 操作接收强度调制光的光接收元件的定时。 导致光接收元件操作,以便能够在强度调制光的一个周期内检测多个相位区域中的每一个的接收光的强度。 定时同步电路用于将确定光接收元件的操作的循环变化与与发光元件驱动电路的输出相关联的循环变化进行比较,以便在这两个循环变化之间保持恒定的相位差。

    Figure data verification apparatus and method therefor
    10.
    发明授权
    Figure data verification apparatus and method therefor 有权
    图数据验证装置及其方法

    公开(公告)号:US08255441B2

    公开(公告)日:2012-08-28

    申请号:US11971445

    申请日:2008-01-09

    IPC分类号: G06F7/10

    CPC分类号: G06F17/5068 G06F17/5081

    摘要: A figure data verification apparatus includes an operation part configured to input design data and writing data converted from the design data and perform an exclusive OR operation between data of a figure included in the design data and data of a figure included in the writing data, a sorting part configured to sort figures produced as a result of the exclusive OR operation to at least one arbitrary-angle figure having at least one angle not being an integral multiple of 45 degrees and to at least one non-arbitrary-angle figure all angles of which are integral multiples of 45 degrees, a first removal part configured to remove a figure of a size smaller than a first allowable error value from the arbitrary-angle figure, and a second removal part configured to remove a figure of a size smaller than a second allowable error value from the non-arbitrary-angle figure.

    摘要翻译: 图形数据验证装置包括:操作部,被配置为输入设计数据并写入从设计数据转换的数据,并且在包括在设计数据中的图形的数据与包括在写入数据中的图形的数据之间进行异或运算; 分类部件,其被配置为将作为异或运算的结果产生的图形分类为具有至少一个角度不为45度的整数倍的至少一个任意角度图形,以及至少一个非任意角度图形 其是45度的整数倍,第一移除部件,被配置为从所述任意角度图形去除尺寸小于第一容许误差值的图形;以及第二移除部件,被配置为移除尺寸小于 来自非任意角度图的第二允许误差值。