公开(公告)号：USD448444S1

公开(公告)日：2001-09-25

申请号：US29104055

申请日：1999-04-27

申请人： Takashi Kondo ,  Yukio Ito ,  Wataru Tsutsumi ,  Shigeo Mimura

设计人： Takashi Kondo ,  Yukio Ito ,  Wataru Tsutsumi ,  Shigeo Mimura

公开(公告)号：USD539378S1

公开(公告)日：2007-03-27

申请号：US29252079

申请日：2006-01-19

申请人： Takashi Kondo ,  Wataru Tsutsumi ,  Masashi Fujioka ,  Masayoshi Fujii

设计人： Takashi Kondo ,  Wataru Tsutsumi ,  Masashi Fujioka ,  Masayoshi Fujii

公开(公告)号：USD467299S1

公开(公告)日：2002-12-17

申请号：US29156257

申请日：2002-02-27

申请人： Takashi Kondo ,  Masatoshi Katayama ,  Shigeo Mimura ,  Noriyasu Fukushima

设计人： Takashi Kondo ,  Masatoshi Katayama ,  Shigeo Mimura ,  Noriyasu Fukushima

公开(公告)号：US09049036B2

公开(公告)日：2015-06-02

申请号：US11071187

申请日：2005-03-04

申请人： Takashi Kondo ,  Kenichi Niwa

发明人： Takashi Kondo ,  Kenichi Niwa

IPC分类号： G09G5/00 ,  H04L12/24 ,  H04L12/26 ,  H04L29/08 ,  H04L29/14 ,  G06F19/00

CPC分类号： H04L12/24 ,  G16H40/40 ,  H04L41/00 ,  H04L41/147 ,  H04L43/0817 ,  H04L67/12 ,  H04L69/40

摘要： A computer system analyzing apparatus includes an acquiring unit which acquires information indicating at least use states of a plurality of computer resources, and a detecting unit which detects whether each of the use states of the computer resources which are indicated by the information corresponds to a state determined as an unreasonable state in advance.

摘要翻译： 计算机系统分析装置包括获取单元，获取指示多个计算机资源的至少使用状态的信息，以及检测单元，其检测由所述信息指示的计算机资源的每个使用状态是否对应于状态 提前确定为不合理的状态。

公开(公告)号：US08692264B2

公开(公告)日：2014-04-08

申请号：US13564295

申请日：2012-08-01

申请人： Taku Kinoshita ,  Michiaki Murata ,  Takashi Kondo ,  Kazutaka Takeda ,  Hideo Nakayama

发明人： Taku Kinoshita ,  Michiaki Murata ,  Takashi Kondo ,  Kazutaka Takeda ,  Hideo Nakayama

IPC分类号： H01L33/00 ,  H01L21/00

CPC分类号： H01L27/153 ,  B41J2/45 ,  H01L33/0016 ,  H01L33/0062 ,  H01L33/10 ,  H01L33/14

摘要： Provided is a light-emitting element including a semiconductor substrate, an island structure formed on the semiconductor substrate and including at least a current confining layer and p-type and n-type semiconductor layers, a light-emitting thyristor formed in the island structure and having a pnpn structure, and a shift thyristor formed in the island structure and having a pnpn structure, wherein the island structure includes a first side surface having a first depth such that the first side surface does not reach the current confining layer in a formation region of the shift thyristor and a second side surface having a second depth such that the second side surface reaches at least the current confining layer in a formation region of the light-emitting thyristor, and an oxidized region selectively oxidized from the second side surface is formed in the current confining layer in the formation region of the light-emitting thyristor.

摘要翻译： 提供了一种发光元件，包括半导体衬底，形成在半导体衬底上的岛状结构，至少包括电流限制层和p型和n型半导体层，形成在岛状结构中的发光晶闸管和 具有pnpn结构和形成在岛状结构中并具有pnpn结构的位移晶闸管，其中岛状结构包括具有第一深度的第一侧表面，使得第一侧表面在形成区域中不到达电流限制层 的第二侧表面和第二侧表面，使得第二侧表面至少达到发光晶闸管的形成区域中的电流限制层，并且形成从第二侧表面选择性氧化的氧化区域 在发光晶闸管的形成区域的电流限制层中。

公开(公告)号：US20130214930A1

公开(公告)日：2013-08-22

申请号：US13881809

申请日：2011-10-27

申请人： Masanao Shiraishi ,  Takashi Imai ,  Takashi Kondo ,  Takayasu Ikeda ,  Yohei Iwata

发明人： Masanao Shiraishi ,  Takashi Imai ,  Takashi Kondo ,  Takayasu Ikeda ,  Yohei Iwata

IPC分类号： G08B5/00 ,  H05K5/00

CPC分类号： G08B5/00 ,  E05F15/43 ,  E05F15/74 ,  E05Y2900/132 ,  G01V8/20 ,  H05K5/0021

摘要： An automatic door sensor includes: at least one sensor module unit (sensor module 11) configured to detect optically an object or a human body and to output, according to the detection results, a signal to a door controller for controlling an automatic door to open/close; an accommodation unit (profile 12) capable of accommodating the at least one sensor module unit; a cover member (front cover 13) that is transmissive to light for use for the detection performed by the sensor module unit and configured to cover the accommodation unit in which the sensor module unit is accommodated; and a functionality expansion module (LED module 14) either side of which can be joined to the cover member and that is configured to expand functionalities of the automatic door sensor by performing communication with the sensor module unit.

摘要翻译： 自动门传感器包括：至少一个传感器模块单元（传感器模块11），被配置为光学地检测物体或人体，并根据检测结果向门控制器输出信号，以控制自动门打开 /关; 能够容纳至少一个传感器模块单元的容纳单元（轮廓12）; 覆盖构件（前盖13），其对于由传感器模块单元执行的用于检测的光可透射并且被配置为覆盖其中容纳传感器模块单元的容纳单元; 以及功能扩展模块（LED模块14），其两侧可以连接到盖构件，并且被配置为通过与传感器模块单元进行通信来扩展自动门传感器的功能。

公开(公告)号：US08311073B2

公开(公告)日：2012-11-13

申请号：US12879541

申请日：2010-09-10

申请人： Kazutaka Takeda ,  Takashi Kondo ,  Hideaki Ozawa

发明人： Kazutaka Takeda ,  Takashi Kondo ,  Hideaki Ozawa

IPC分类号： H01S3/08

CPC分类号： H01S5/18388 ,  H01L2224/48091 ,  H01S5/0071 ,  H01S5/02284 ,  H01S5/026 ,  H01S5/18308 ,  H01S5/18313 ,  H01S5/18361 ,  H01S5/2215 ,  H01S5/3215 ,  H01L2924/00014

摘要： A semiconductor laser that includes: a substrate; a first semiconductor multilayer reflector of a first conductive type formed on the substrate; an active region formed on the first semiconductor multilayer reflector; a second semiconductor multilayer reflector of a second conductive type formed on the active region; and an intermediate semiconductor layer of a first conductive type or a second conductive type formed under the first semiconductor multilayer reflector or above the second semiconductor multilayer reflector. An oxidized region formed by oxidizing a part of the intermediate semiconductor layer and an un-oxidized region contacting with the oxidized region are formed in the intermediate semiconductor layer, the un-oxidized region is electrically connected to the first or second semiconductor multilayer reflector, and a beam generated in the active region is reflected at a boundary between the oxidized region and the un-oxidized region to a direction parallel to a principal surface of the substrate, and is emitted from a side surface of the intermediate semiconductor layer.

摘要翻译： 一种半导体激光器，包括：基板; 形成在所述基板上的第一导电类型的第一半导体多层反射器; 形成在所述第一半导体多层反射器上的有源区; 形成在有源区上的第二导电类型的第二半导体多层反射器; 以及形成在所述第一半导体多层反射器之下或所述第二半导体多层反射器之下的第一导电类型或第二导电类型的中间半导体层。 在中间半导体层中形成通过氧化中间半导体层的一部分而形成的氧化区域和与氧化区域接触的未氧化区域，未氧化区域与第一或第二半导体多层反射体电连接， 在有源区域中产生的光束在氧化区域和未氧化区域之间的边界处反射到与基板的主表面平行的方向，并且从中间半导体层的侧表面发射。

公开(公告)号：US08304732B2

公开(公告)日：2012-11-06

申请号：US13405651

申请日：2012-02-27

申请人： Seiji Kamba ,  Kazuhiro Takigawa ,  Takashi Kondo ,  Koji Tanaka

发明人： Seiji Kamba ,  Kazuhiro Takigawa ,  Takashi Kondo ,  Koji Tanaka

IPC分类号： G01J5/02

CPC分类号： G01N21/3581

摘要： A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen. The flat-plate periodic structure is a flat-plate structure in which at least two voids penetrating through the structure in a direction perpendicular to a principal surface thereof are periodically arrayed in at least one direction on the principal surface, and the electromagnetic wave is applied to the principal surface of the flat-plate periodic structure from the direction perpendicular to the principal surface.

摘要翻译： 一种测量方法，其包括将平板周期性结构上的测量样本保持在平板周期结构上，对平板周期结构施加线性偏振电磁波，通过平板周期性结构检测前后散射的电磁波， 并根据出现在前向散射电磁波的频率特性中的下降波形或出现在后向散射电磁波的频率特性中的峰值波形发生变化的现象，测量样本的特性， 标本。 平板周期性结构是平板结构，其中在垂直于其主表面的方向上贯穿结构的至少两个空隙在主表面上沿至少一个方向周期性排列，并且施加电磁波 从垂直于主表面的方向到平板周期性结构的主表面。

公开(公告)号：US08112197B2

公开(公告)日：2012-02-07

申请号：US12292079

申请日：2008-11-12

申请人： Toshiyuki Amagasa ,  Takashi Kondo ,  Toru Namiki

发明人： Toshiyuki Amagasa ,  Takashi Kondo ,  Toru Namiki

IPC分类号： A47L1/02 ,  B60S1/08 ,  B60S1/16 ,  B60S1/28

CPC分类号： B60S1/0814

摘要： A wiper apparatus includes: a wiper blade driven by a first motor; and a wiper blade driven by a second motor. The motors are drive-controlled by control microcomputers, respectively. The control microcomputers are connected to each other through a communication line. While exchanging position information of the wiper blades through the communication line, the control microcomputers synchronously drive the motors on the basis of a position relationship between both of the wiper blades. When an abnormality occurs in a communication state of an in-vehicle LAN, a setting state of a wiper switch is grasped through a switch signal line directly connected to the wiper switch, and wipers are prevented from being stopped when such communication abnormality occurs.

摘要翻译： 刮水器装置包括：由第一马达驱动的刮水片; 以及由第二电动机驱动的刮水片。 电机分别由控制微型计算机驱动控制。 控制微型计算机通过通信线路相互连接。 在通过通信线交换刮水片的位置信息的同时，控制微型计算机基于两个刮水片之间的位置关系来同步地驱动马达。 当在车内LAN的通信状态发生异常时，通过直接连接到刮水器开关的开关信号线来掌握刮水器开关的设定状态，并且当发生通信异常时，防止刮水器停止。

公开(公告)号：US20120008142A1

公开(公告)日：2012-01-12

申请号：US13239830

申请日：2011-09-22

申请人： Seiji Kamba ,  Takashi Kondo ,  Koji Tanaka ,  Kazuhiro Takigawa ,  Yuichi Ogawa

发明人： Seiji Kamba ,  Takashi Kondo ,  Koji Tanaka ,  Kazuhiro Takigawa ,  Yuichi Ogawa

IPC分类号： G01J3/28

CPC分类号： G01N21/4788 ,  G01N33/54373

摘要： A method of attaching an object to be measured to a structure causing a diffraction phenomenon; irradiating the structure to which the object to be measured is attached and which causes the diffraction phenomenon with an electromagnetic wave; detecting the electromagnetic wave scattered by the structure causing the diffraction phenomenon; and measuring a characteristic of the object to be measured from the frequency characteristic of the detected electromagnetic wave. The object to be measured is attached directly to the surface of the structure causing the diffraction phenomenon. Thus, the method for measuring the characteristic of an object to be measured exhibits an improved measurement sensitivity and high reproducibility. A structure causing a diffraction phenomenon and used for the method, and a measuring device are provided.

摘要翻译： 将测量对象附着到引起衍射现象的结构的方法; 照射被测定对象物的结构，并用电磁波引起衍射现象; 检测由结构散射的电磁波引起的衍射现象; 并根据检测到的电磁波的频率特性来测量待测物体的特性。 要测量的物体直接附着在结构的表面，引起衍射现象。 因此，用于测量待测物体的特性的方法具有改进的测量灵敏度和高再现性。 提供引起衍射现象并用于该方法的结构和测量装置。