POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND
    2.
    发明申请
    POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND 有权
    正极性组合物,形成耐火模式的方法和聚合物

    公开(公告)号:US20100081086A1

    公开(公告)日:2010-04-01

    申请号:US12568549

    申请日:2009-09-28

    IPC分类号: G03F7/20 G03F7/004 C08F24/00

    摘要: A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) including a polymeric compound (A1′) containing an acid dissociable, dissolution inhibiting group within the structure thereof and including a structural unit (a0) represented by general formula (a0-1) (R2 represents a divalent linking group, and A″ represents an oxygen atom, a sulfur atom, or an alkylene group of 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom) and a structural unit (a2) derived from an acrylate ester containing a lactone-containing cyclic group; or a polymeric compound (Al) including the structural unit (a0) and a structural unit (al) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group.

    摘要翻译: 一种正性抗蚀剂组合物,其包含在酸的作用下在碱性显影液中显示出增加的溶解度的碱成分(A)和暴露时产生酸的酸产生剂组分(B),所述碱成分(A)包含高分子化合物 A1'),其包含在其结构内含有酸解离的溶解抑制基团,并且包含由通式(a0-1)表示的结构单元(a0)(R2表示二价连接基团,A“表示氧原子,硫 原子或可含有氧原子或硫原子的1〜5个碳原子的亚烷基)和由含有内酯的环状基团的丙烯酸酯衍生的结构单元(a2) 或包含结构单元(a0)的聚合化合物(A1)和由含有酸解离的溶解抑制基团的丙烯酸酯衍生的结构单元(a1)。

    Method of forming resist pattern and negative tone-development resist composition
    3.
    发明申请
    Method of forming resist pattern and negative tone-development resist composition 有权
    形成抗蚀剂图案和负色调显影抗蚀剂组合物的方法

    公开(公告)号:US20110262864A1

    公开(公告)日:2011-10-27

    申请号:US13028689

    申请日:2011-02-16

    IPC分类号: G03F7/20 G03F7/004

    摘要: A method of forming a resist pattern, including: forming a resist film on a substrate using a resist composition containing a base component (A) which exhibits decreased solubility in an organic solvent under action of an acid and an acid-generator component (B) which generates an acid upon exposure, conducting exposure of the resist film, and patterning the resist film by a negative tone development using a developing solution containing an organic solvent, wherein the base component (A) includes a resin component (A1) containing a structural unit (a0) derived from an acrylate ester containing an acid decomposable group which generates an alcoholic hydroxy group by the action of acid to thereby exhibit increased hydrophilicity.

    摘要翻译: 一种形成抗蚀剂图案的方法,包括:使用含有在酸和酸发生剂组分(B)的作用下在有机溶剂中表现出降低的溶解度的碱成分(A)的抗蚀剂组合物在基材上形成抗蚀剂膜, 其在曝光时产生酸,曝光抗蚀剂膜,并使用含有有机溶剂的显影液通过负色调显影对抗蚀剂膜进行图案化,其中所述基础组分(A)包括含有结构 单元(a0)衍生自含有通过酸作用产生醇羟基的可酸分解基团的丙烯酸酯,从而表现出增加的亲水性。

    METHOD OF FORMING RESIST PATTERN AND NEGATIVE TONE-DEVELOPMENT RESIST COMPOSITION
    5.
    发明申请
    METHOD OF FORMING RESIST PATTERN AND NEGATIVE TONE-DEVELOPMENT RESIST COMPOSITION 有权
    形成电阻图案和负极色调发展电阻组合物的方法

    公开(公告)号:US20110244399A1

    公开(公告)日:2011-10-06

    申请号:US13028594

    申请日:2011-02-16

    IPC分类号: G03F7/20

    摘要: A method of forming a resist pattern, including: forming a resist film on a substrate using a resist composition containing a base component (A) which exhibits decreased solubility in an organic solvent under action of an acid and an acid-generator component (B) which generates an acid upon exposure, conducting exposure of the resist film, and patterning the resist film by a negative tone development using a developing solution containing an organic solvent, wherein the base component (A) includes a resin component (A1) containing a structural unit (a1) derived from an acrylate ester containing an acid decomposable group which exhibits increased hydrophilicity by the action of an acid and a structural unit (a0) derived from an acrylate ester containing an —SO2— containing cyclic group.

    摘要翻译: 一种形成抗蚀剂图案的方法,包括:使用含有在酸和酸发生剂组分(B)的作用下在有机溶剂中表现出降低的溶解度的碱成分(A)的抗蚀剂组合物在基材上形成抗蚀剂膜, 其在曝光时产生酸,曝光抗蚀剂膜,并使用含有有机溶剂的显影液通过负色调显影对抗蚀剂膜进行图案化,其中所述基础组分(A)包括含有结构 来自含有酸分解性基团的丙烯酸酯的丙烯酸酯单元(a1),其通过酸的作用显示增加的亲水性和由含有-SO 2 - 的环状基团的丙烯酸酯衍生的结构单元(a0)。

    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    6.
    发明申请
    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN 有权
    正电阻组合物和形成电阻图案的方法

    公开(公告)号:US20110111343A1

    公开(公告)日:2011-05-12

    申请号:US12945526

    申请日:2010-11-12

    IPC分类号: G03F7/004 G03F7/20

    摘要: A positive resist composition including a resin component (A) which exhibits increased solubility in an alkali developing solution under the action of acid and an acid-generator component (B), the resin component (A) including a polymeric compound (A1) having a structural unit (a1) containing an acid dissociable, dissolution inhibiting group, a structural unit (a5) containing a base dissociable group an a structural unit (a6) represented by general formula (a6-1) (R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; each of R2 and R3 independently represents a hydrogen atom or an alkyl group that may contain an oxygen atom at an arbitrary position, or R2 and R3 are bonded together to form an alkylene group; and W represents a cyclic alkylene group that may include an oxygen atom at an arbitrary position).

    摘要翻译: 一种正性抗蚀剂组合物,其包含在酸和酸发生剂组分(B)的作用下在碱性显影液中显示增加的溶解性的树脂组分(A),所述树脂组分(A)包含具有 含有酸解离性溶解抑制基团的结构单元(a1),含有碱解离基团的结构单元(a5),由通式(a6-1)表示的结构单元(a6)(R表示氢原子,烷基 1至5个碳原子的基团或1至5个碳原子的卤代烷基; R 2和R 3各自独立地表示可以在任意位置含有氧原子的氢原子或烷基,或者R 2和R 3键合 一起形成亚烷基; W表示可以在任意位置包含氧原子的环状亚烷基。

    POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND
    7.
    发明申请
    POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN AND POLYMERIC COMPOUND 有权
    正电阻组合物,形成电阻型和聚合物的方法

    公开(公告)号:US20110244392A1

    公开(公告)日:2011-10-06

    申请号:US12979076

    申请日:2010-12-27

    IPC分类号: G03F7/004 G03F7/20 C08F228/06

    摘要: A positive resist composition including a base component (A′) which exhibits increased solubility in an alkali developing solution under the action of acid and generates acid upon exposure, the base component (A′) including a resin component (A1) having a structural unit (a0-1) represented by general formula (a0-1), a structural unit (a0-2) which generates acid upon exposure and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group (wherein R1 represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, R2 represents a divalent linking group, and R3 represents a cyclic group containing —SO2— within the ring skeleton thereof).

    摘要翻译: 一种正性抗蚀剂组合物,其包含在酸性作用下在碱性显影液中显示出增加的溶解性并在曝光时产生酸的基础组分(A'),所述基础组分(A')包括具有结构单元的树脂组分(A1) 由通式(a0-1)表示的(a0-1),曝光时产生酸的结构单元(a0-2)和由含有酸解离的溶解抑制基团的丙烯酸酯衍生的结构单元(a1)(其中 R 1表示氢原子,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基,R 2表示二价连接基团,R 3表示在其环骨架中含有-SO 2 - 的环状基团) 。

    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    8.
    发明申请
    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN 有权
    正电阻组合物和形成电阻图案的方法

    公开(公告)号:US20110236824A1

    公开(公告)日:2011-09-29

    申请号:US12979067

    申请日:2010-12-27

    IPC分类号: G03F7/00 G03F7/20

    摘要: A positive resist composition including a base component (A) which exhibits increased solubility in an alkali developing solution under action of acid, an acid-generator component (B) which generates acid upon exposure and a fluorine-containing polymeric compound (C′) which generates acid upon exposure, the base component (A) having a structural unit (a0-1) represented by general formula (a0-1) and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group, and the fluorine-containing polymeric compound (C′) having a structural unit (c0) which generates acid upon exposure and a structural unit (c1) represented by formula (c1) (wherein R2 represents a divalent linking group, R3 represents a cyclic group containing —SO2— within the ring skeleton, Q0 represents a single bond or a divalent linking group, and R0 represents an organic group which may have a fluorine atom).

    摘要翻译: 一种正性抗蚀剂组合物,包括在酸作用下在碱性显影液中显示出增加的溶解性的基础组分(A),暴露时产生酸的酸产生剂组分(B)和含氟聚合化合物(C') 在曝光时产生酸,具有由通式(a0-1)表示的结构单元(a0-1)的基础组分(A)和由含有酸解离的溶解抑制基团的丙烯酸酯衍生的结构单元(a1) 和具有曝光时产生酸的结构单元(c0)的含氟聚合化合物(C')和由式(c1)表示的结构单元(c1)(其中R 2表示二价连接基团,R 3表示环状基团 在环骨架中含有-SO 2 - ,Q 0表示单键或二价连接基团,R 0表示可以具有氟原子的有机基团)。

    MATERIALS FOR PHOTORESIST, PHOTORESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    9.
    发明申请
    MATERIALS FOR PHOTORESIST, PHOTORESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN 失效
    光电材料,光电组合物和形成电阻图案的方法

    公开(公告)号:US20080081281A1

    公开(公告)日:2008-04-03

    申请号:US11838951

    申请日:2007-08-15

    摘要: To overcome the problem that a device performance is degraded by the edge roughness of a photoresist pattern, a mixture of polynuclear phenol compounds having, in one molecule, 0 to 6 functional groups which are chemically converted due to actions of an acid with the solubility in an alkaline developer reduced is used as a material for photoresist. In the mixture, two or more triphenyl methane structures are bonded to portions other than the functional group in the nonconjugated state. Furthermore, the mixture comprises polynuclear compounds with the average number of functional groups of 2.5 or below and includes the polynuclear compounds not having any functional group per molecule by 15% or less in the term of weight ratio, and the polynuclear phenol compounds having 3 or more functional groups per molecule by 40% or less.

    摘要翻译: 为了克服由光致抗蚀剂图案的边缘粗糙度降低器件性能的问题,在一分子中具有0至6个官能团的多核酚化合物的混合物,其由于酸的作用而具有溶解度而化学转化 还原的碱性显影剂被用作光致抗蚀剂的材料。 在该混合物中,在非共轭状态下,将两个以上的三苯基甲烷结构键合至官能团以外的部分。 此外,该混合物包含平均官能团数为2.5或更低的多核化合物,并且包括在重量比方面每分子不具有15%或更少的任何官能团的多核化合物,并且多核苯酚化合物具有3或 每个分子更多的官能团减少40%以下。

    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
    10.
    发明申请
    POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN 审中-公开
    正电阻组合物和形成电阻图案的方法

    公开(公告)号:US20110311913A1

    公开(公告)日:2011-12-22

    申请号:US13156180

    申请日:2011-06-08

    IPC分类号: G03F7/20 G03F7/039

    摘要: A positive resist composition including: a base component (A′) that exhibits increased solubility in an alkali developing solution under action of acid, without including an acid generator component other than the base component (A′), wherein the base component (A′) includes a resin component (A1) having a structural unit (a0-1) represented by general formula (a0-1) shown below and a structural unit (a1) containing an acid dissociable, dissolution inhibiting group: wherein R1 represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms; R2 represents a single bond or a divalent linking group; and R3 represents a cyclic group that contains —SO2— within the ring skeleton thereof.

    摘要翻译: 一种正型抗蚀剂组合物,其包含:在不包含除了所述碱成分(A')以外的酸发生剂成分的情况下,在酸的作用下在碱性显影液中显示增加的溶解性的基础成分(A'),其中,所述基础成分(A' )包括具有下述通式(a0-1)表示的结构单元(a0-1)的树脂组分(A1)和含有酸解离溶解抑制基团的结构单元(a1):其中R1表示氢原子 ,1〜5个碳原子的烷基或1〜5个碳原子的卤代烷基; R2表示单键或二价连接基团; R 3表示在其环骨架中含有-SO 2 - 的环状基团。