Systems and methods for generating an image of an inspection object using an attenuated beam

    公开(公告)号:US10539495B2

    公开(公告)日:2020-01-21

    申请号:US15767853

    申请日:2016-10-14

    Abstract: According to the present invention, a probe beam (14) having undergone dispersive Fourier transformation by a dispersive Fourier transformation unit is spatially mapped, an inspection object (18, 20) is irradiated with the probe beam (14), and transmitted light (15) from the inspection object (18, 20) is detected, whereby an image is generated on the basis of the intensity of the transmitted light (15). Accordingly, an imaging apparatus can be provided which can irradiate the inspection object (18, 20) with the weak probe beam (14) having an intensity attenuated by the dispersive Fourier transformation unit, which can generate an image only by detecting the transmitted light (15) from the inspection object (18, 20), and which has a high throughput of generating images while an influence on the inspection object (18, 20) is suppressed.

    Flow cytometer
    4.
    发明授权

    公开(公告)号:US10890520B2

    公开(公告)日:2021-01-12

    申请号:US16330748

    申请日:2017-09-05

    Abstract: A flow cytometer including a flow cell in which an imaging object flows; a laser beam irradiator configured to radiate laser beam; a camera including an image sensor of N×M pixels; and an optical system configured to introduce the laser beam from the laser beam irradiator to imaging range of flow cell and to introduce signal light, such as transmitted, reflected or scattered light, from imaging range of flow cell, to camera. Optical system includes a mirror device that is placed on a Fourier plane of imaging optical system, that has at least one mirror specularly reflecting the signal light, and that is driven and rotated in conjunction with a flow in flow cell, such that each part of an image formed by the signal light is introduced into an identical pixel of the image sensor for at least a predetermined time period from a predetermined timing.

    Stimulated Raman scattering microscope device and stimulated Raman scattering measurement method

    公开(公告)号:US11340171B2

    公开(公告)日:2022-05-24

    申请号:US16076389

    申请日:2017-02-09

    Abstract: A stimulated Raman scattering microscope device is configured to irradiates a sample with a first optical pulse at a first repetition frequency, to irradiate the sample with a second optical pulse of an optical frequency different from an optical frequency of the first optical pulse at a second repetition frequency, and to detect optical pulses of the first repetition frequency that are included in detected light from the sample irradiated with the first optical pulse and the second optical pulse, as a detected optical pulse train. The second optical pulse is generated by dispersing predetermined optical pulses that include lights of a plurality of optical frequencies, regulating to output optical pulses of a predetermined number of different optical frequencies out of the dispersed optical pulses at the second repetition frequency, and coupling the regulated optical pulses.

    IMAGING APPARATUS, FLOW CYTOMETER, AND IMAGING METHOD

    公开(公告)号:US20180299364A1

    公开(公告)日:2018-10-18

    申请号:US15767853

    申请日:2016-10-14

    Abstract: According to the present invention, a probe beam (14) having undergone dispersive Fourier transformation by a dispersive Fourier transformation unit is spatially mapped, an inspection object (18, 20) is irradiated with the probe beam (14), and transmitted light (15) from the inspection object (18, 20) is detected, whereby an image is generated on the basis of the intensity of the transmitted light (15). Accordingly, an imaging apparatus can be provided which can irradiate the inspection object (18, 20) with the weak probe beam (14) having an intensity attenuated by the dispersive Fourier transformation unit, which can generate an image only by detecting the transmitted light (15) from the inspection object (18, 20), and which has a high throughput of generating images while an influence on the inspection object (18, 20) is suppressed.

Patent Agency Ranking