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公开(公告)号:US20110117726A1
公开(公告)日:2011-05-19
申请号:US13012336
申请日:2011-01-24
IPC分类号: H01L21/30
CPC分类号: H01L21/0254 , H01L21/02389 , H01L21/0262 , H01L21/02658 , H01L21/76254 , H01L33/007 , H01L33/0079 , H01L33/20 , H01L2924/0002 , H01L2933/0083 , H01L2924/00
摘要: A method includes growing a first epitaxial layer of III-nitride material, forming a damaged region by implanting ions into an exposed surface of the first epitaxial layer, and growing a second epitaxial layer of III-nitride material on the exposed surface of the first epitaxial layer. A level of defects present in the second epitaxial layer is less than a level of defects present in the first epitaxial layer.
摘要翻译: 一种方法包括生长III族氮化物材料的第一外延层,通过将离子注入到第一外延层的暴露表面中形成损伤区域,以及在第一外延层的暴露表面上生长III族氮化物材料的第二外延层 层。 存在于第二外延层中的缺陷水平小于存在于第一外延层中的缺陷水平。
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公开(公告)号:US07732301B1
公开(公告)日:2010-06-08
申请号:US12081702
申请日:2008-04-18
CPC分类号: H01L21/2654 , H01L21/76254 , H01L33/0079 , H01L2924/0002 , H01L2924/00
摘要: A method of making a bonded intermediate substrate includes forming a weak interface in a GaN source substrate by implanting ions into an N-terminated surface of the GaN source substrate, bonding the N-terminated surface of the GaN source substrate to a handle substrate, and exfoliating a thin GaN single crystal layer from the source substrate such that the thin GaN exfoliated single crystal layer remains bonded to the handle substrate and a Ga-terminated surface of the thin GaN single crystal layer is exposed. The method further includes depositing a capping layer directly onto the exposed surface of the thin GaN single crystal layer, and annealing the thin GaN single crystal layer in a nitrogen containing atmosphere after depositing the capping layer. The in-plane strain present in the thin GaN single crystal layer after the annealing is reduced relative to an in-plane strain present in said layer prior to the annealing.
摘要翻译: 制造粘合的中间衬底的方法包括:通过将离子注入到GaN源衬底的N端接表面中,在GaN源衬底中形成弱界面,将GaN源极衬底的N端接表面接合到处理衬底上,以及 从源极衬底剥离薄的GaN单晶层,使得薄的GaN剥离的单晶层保持结合到手柄衬底,并且暴露出薄的GaN单晶层的Ga封端的表面。 该方法还包括将覆盖层直接沉积到薄GaN单晶层的暴露表面上,并且在沉积覆盖层之后在含氮气氛中退火薄GaN单晶层。 在退火之前,存在于薄GaN单晶层中的面内应变相对于退火前存在于所述层中的面内应变而降低。
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公开(公告)号:US08101498B2
公开(公告)日:2012-01-24
申请号:US11408239
申请日:2006-04-21
申请人: Thomas Henry Pinnington , James M. Zahler , Young-Bae Park , Charles Tsai , Corinne Ladous , Harry A. Atwater, Jr. , Sean Olson
发明人: Thomas Henry Pinnington , James M. Zahler , Young-Bae Park , Charles Tsai , Corinne Ladous , Harry A. Atwater, Jr. , Sean Olson
CPC分类号: H01L33/0079 , B82Y20/00 , H01L21/2007 , H01L33/145 , H01L33/32 , H01L33/405 , H01L2924/0002 , H01L2924/00
摘要: An intermediate substrate includes a handle substrate bonded to a thin layer suitable for epitaxial growth of a compound semiconductor layer, such as a III-nitride semiconductor layer. The handle substrate may be a metal or metal alloy substrate, such as a molybdenum or molybdenum alloy substrate, while the thin layer may be a sapphire layer. A method of making the intermediate substrate includes forming a weak interface in the source substrate, bonding the source substrate to the handle substrate, and exfoliating the thin layer from the source substrate such that the thin layer remains bonded to the handle substrate.
摘要翻译: 中间基板包括结合到适合于诸如III族氮化物半导体层的化合物半导体层的外延生长的薄层的手柄基板。 手柄基板可以是金属或金属合金基板,例如钼或钼合金基板,而薄层可以是蓝宝石层。 制造中间基板的方法包括在源极基板中形成弱界面,将源极基板接合到手柄基板,以及将薄层从源极基板剥离,使得薄层保持结合到手柄基板上。
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