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公开(公告)号:US07732301B1
公开(公告)日:2010-06-08
申请号:US12081702
申请日:2008-04-18
CPC分类号: H01L21/2654 , H01L21/76254 , H01L33/0079 , H01L2924/0002 , H01L2924/00
摘要: A method of making a bonded intermediate substrate includes forming a weak interface in a GaN source substrate by implanting ions into an N-terminated surface of the GaN source substrate, bonding the N-terminated surface of the GaN source substrate to a handle substrate, and exfoliating a thin GaN single crystal layer from the source substrate such that the thin GaN exfoliated single crystal layer remains bonded to the handle substrate and a Ga-terminated surface of the thin GaN single crystal layer is exposed. The method further includes depositing a capping layer directly onto the exposed surface of the thin GaN single crystal layer, and annealing the thin GaN single crystal layer in a nitrogen containing atmosphere after depositing the capping layer. The in-plane strain present in the thin GaN single crystal layer after the annealing is reduced relative to an in-plane strain present in said layer prior to the annealing.
摘要翻译: 制造粘合的中间衬底的方法包括:通过将离子注入到GaN源衬底的N端接表面中,在GaN源衬底中形成弱界面,将GaN源极衬底的N端接表面接合到处理衬底上,以及 从源极衬底剥离薄的GaN单晶层,使得薄的GaN剥离的单晶层保持结合到手柄衬底,并且暴露出薄的GaN单晶层的Ga封端的表面。 该方法还包括将覆盖层直接沉积到薄GaN单晶层的暴露表面上,并且在沉积覆盖层之后在含氮气氛中退火薄GaN单晶层。 在退火之前,存在于薄GaN单晶层中的面内应变相对于退火前存在于所述层中的面内应变而降低。
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公开(公告)号:US20090278233A1
公开(公告)日:2009-11-12
申请号:US12178838
申请日:2008-07-24
CPC分类号: H01L21/0254 , H01L21/02389 , H01L21/0262 , H01L21/02658 , H01L21/76254 , H01L33/007 , H01L33/0079 , H01L33/20 , H01L2924/0002 , H01L2933/0083 , H01L2924/00
摘要: A method includes growing a first epitaxial layer of III-nitride material, forming a damaged region by implanting ions into an exposed surface of the first epitaxial layer, and growing a second epitaxial layer of III-nitride material on the exposed surface of the first epitaxial layer. A level of defects present in the second epitaxial layer is less than a level of defects present in the first epitaxial layer.
摘要翻译: 一种方法包括生长III族氮化物材料的第一外延层,通过将离子注入到第一外延层的暴露表面中形成损伤区域,以及在第一外延层的暴露表面上生长III族氮化物材料的第二外延层 层。 存在于第二外延层中的缺陷水平小于存在于第一外延层中的缺陷水平。
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公开(公告)号:US08101498B2
公开(公告)日:2012-01-24
申请号:US11408239
申请日:2006-04-21
申请人: Thomas Henry Pinnington , James M. Zahler , Young-Bae Park , Charles Tsai , Corinne Ladous , Harry A. Atwater, Jr. , Sean Olson
发明人: Thomas Henry Pinnington , James M. Zahler , Young-Bae Park , Charles Tsai , Corinne Ladous , Harry A. Atwater, Jr. , Sean Olson
CPC分类号: H01L33/0079 , B82Y20/00 , H01L21/2007 , H01L33/145 , H01L33/32 , H01L33/405 , H01L2924/0002 , H01L2924/00
摘要: An intermediate substrate includes a handle substrate bonded to a thin layer suitable for epitaxial growth of a compound semiconductor layer, such as a III-nitride semiconductor layer. The handle substrate may be a metal or metal alloy substrate, such as a molybdenum or molybdenum alloy substrate, while the thin layer may be a sapphire layer. A method of making the intermediate substrate includes forming a weak interface in the source substrate, bonding the source substrate to the handle substrate, and exfoliating the thin layer from the source substrate such that the thin layer remains bonded to the handle substrate.
摘要翻译: 中间基板包括结合到适合于诸如III族氮化物半导体层的化合物半导体层的外延生长的薄层的手柄基板。 手柄基板可以是金属或金属合金基板,例如钼或钼合金基板,而薄层可以是蓝宝石层。 制造中间基板的方法包括在源极基板中形成弱界面,将源极基板接合到手柄基板,以及将薄层从源极基板剥离,使得薄层保持结合到手柄基板上。
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公开(公告)号:US20110117726A1
公开(公告)日:2011-05-19
申请号:US13012336
申请日:2011-01-24
IPC分类号: H01L21/30
CPC分类号: H01L21/0254 , H01L21/02389 , H01L21/0262 , H01L21/02658 , H01L21/76254 , H01L33/007 , H01L33/0079 , H01L33/20 , H01L2924/0002 , H01L2933/0083 , H01L2924/00
摘要: A method includes growing a first epitaxial layer of III-nitride material, forming a damaged region by implanting ions into an exposed surface of the first epitaxial layer, and growing a second epitaxial layer of III-nitride material on the exposed surface of the first epitaxial layer. A level of defects present in the second epitaxial layer is less than a level of defects present in the first epitaxial layer.
摘要翻译: 一种方法包括生长III族氮化物材料的第一外延层,通过将离子注入到第一外延层的暴露表面中形成损伤区域,以及在第一外延层的暴露表面上生长III族氮化物材料的第二外延层 层。 存在于第二外延层中的缺陷水平小于存在于第一外延层中的缺陷水平。
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公开(公告)号:US20070243703A1
公开(公告)日:2007-10-18
申请号:US11785038
申请日:2007-04-13
申请人: Thomas Pinnington , Sean Olson , James M. Zahler , Charles Tsai
发明人: Thomas Pinnington , Sean Olson , James M. Zahler , Charles Tsai
IPC分类号: H01L21/3205 , H01L21/28 , H01L21/4763
CPC分类号: H01L21/2007 , H01L21/0237 , H01L21/02381 , H01L21/02458 , H01L21/02461 , H01L21/02463 , H01L21/02507 , H01L21/0251 , H01L21/02658
摘要: A method of making a semiconductor device includes providing a laminate substrate made by bonding a II-VI or III-V semiconductor laminate film to a support substrate, and preparing the laminate film to enable growth of a II-VI or III-V semiconductor device layer on the laminate substrate.
摘要翻译: 制造半导体器件的方法包括提供通过将II-VI或III-V半导体层压膜结合到支撑衬底而制成的层压衬底,以及制备层压膜以使II-VI或III-V半导体器件能够生长 层。
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公开(公告)号:US10374120B2
公开(公告)日:2019-08-06
申请号:US11357436
申请日:2006-02-21
申请人: Harry A. Atwater, Jr. , James M. Zahler , Anna Fontcuberta i Morral , Tom Pinnington , Sean Olson
发明人: Harry A. Atwater, Jr. , James M. Zahler , Anna Fontcuberta i Morral , Tom Pinnington , Sean Olson
IPC分类号: H01L31/102 , H01L31/18 , C30B33/06 , H01L31/0304 , H01L31/0687 , H01L31/0735 , H01L31/043
摘要: A method of making a virtual substrate includes providing a donor substrate comprising a single crystal donor layer of a first material over a support substrate, wherein the first material comprises a ternary, quaternary or penternary semiconductor material or a material which is not available in bulk form, bonding the donor substrate to a handle substrate, and separating the donor substrate from the handle substrate such that a single crystal film of the first material remains bonded to the handle substrate.
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公开(公告)号:US07238622B2
公开(公告)日:2007-07-03
申请号:US10761918
申请日:2004-01-20
IPC分类号: H01L21/302 , H01L21/461
CPC分类号: H01L21/187 , H01L21/02096 , H01L21/30604 , H01L21/30612 , H01L21/30625 , H01L31/0392 , H01L31/03925 , H01L31/18 , Y02E10/50 , Y10S438/933
摘要: A method of forming a virtual substrate comprised of an optoelectronic device substrate and handle substrate comprises the steps of initiating bonding of the device substrate to the handle substrate, improving or increasing the mechanical strength of the device and handle substrates, and thinning the device substrate to leave a single-crystal film on the virtual substrate such as by exfoliation of a device film from the device substrate. The handle substrate is typically Si or other inexpensive common substrate material, while the optoelectronic device substrate is formed of more expensive and specialized electro-optic material. Using the methodology of the invention a wide variety of thin film electro-optic materials of high quality can be bonded to inexpensive substrates which serve as the mechanical support for an optoelectronic device layer fabricated in the thin film electro-optic material.
摘要翻译: 形成由光电子器件基板和手柄基板构成的虚拟基板的方法包括以下步骤:引发装置基板与手柄基板的接合,改善或增加装置的机械强度和处理基板,以及使装置基板变薄 在虚拟基板上留下单晶膜,例如通过从器件衬底剥离器件膜。 手柄基板通常为Si或其它便宜的普通基板材料,而光电器件基板由更昂贵和专门的电光材料形成。 使用本发明的方法,可以将各种各样的高质量的薄膜电光材料粘合到便宜的基板上,这些基板用作在薄膜电光材料中制造的光电子器件层的机械支撑。
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公开(公告)号:US07141834B2
公开(公告)日:2006-11-28
申请号:US11165328
申请日:2005-06-24
IPC分类号: H01L29/732 , H01L31/072 , H01L31/109 , H01L31/0328 , H01L31/0336
CPC分类号: H01L21/76254 , H01L21/187 , H01L31/0304 , H01L31/0392 , H01L31/0687 , H01L31/0693 , H01L31/18 , H01L31/1852 , Y02E10/544 , Y10S438/933
摘要: Ge/Si and other nonsilicon film heterostructures are formed by hydrogen-induced exfoliation of the Ge film which is wafer bonded to a cheaper substrate, such as Si. A thin, single-crystal layer of Ge is transferred to Si substrate. The bond at the interface of the Ge/Si heterostructures is covalent to ensure good thermal contact, mechanical strength, and to enable the formation of an ohmic contact between the Si substrate and Ge layers. To accomplish this type of bond, hydrophobic wafer bonding is used, because as the invention demonstrates the hydrogen-surface-terminating species that facilitate van der Waals bonding evolves at temperatures above 600° C. into covalent bonding in hydrophobically bound Ge/Si layer transferred systems.
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公开(公告)号:US07019339B2
公开(公告)日:2006-03-28
申请号:US10125133
申请日:2002-04-17
IPC分类号: H01L29/732 , H01L31/072 , H01L31/109 , H01L31/0328 , H01L31/0336
CPC分类号: H01L21/76254 , H01L21/187 , H01L31/0304 , H01L31/0392 , H01L31/0687 , H01L31/0693 , H01L31/18 , H01L31/1852 , Y02E10/544 , Y10S438/933
摘要: Ge/Si and other nonsilicon film heterostructures are formed by hydrogen-induced exfoliation of the Ge film which is wafer bonded to a cheaper substrate, such as Si. A thin, single-crystal layer of Ge is transferred to Si substrate. The bond at the interface of the Ge/Si heterostructures is covalent to ensure good thermal contact, mechanical strength, and to enable the formation of an ohmic contact between the Si substrate and Ge layers. To accomplish this type of bond, hydrophobic wafer bonding is used, because as the invention demonstrates the hydrogen-surface-terminating species that facilitate van der Waals bonding evolves at temperatures above 600° C. into covalent bonding in hydrophobically bound Ge/Si layer transferred systems.
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公开(公告)号:US07755109B2
公开(公告)日:2010-07-13
申请号:US11430160
申请日:2006-05-09
IPC分类号: H01L29/739
CPC分类号: H01L21/76254 , H01L21/187 , H01L31/0304 , H01L31/0392 , H01L31/0687 , H01L31/0693 , H01L31/18 , H01L31/1852 , Y02E10/544 , Y10S438/933
摘要: Ge/Si and other nonsilicon film heterostructures are formed by hydrogen-induced exfoliation of the Ge film which is wafer bonded to a cheaper substrate, such as Si. A thin, single-crystal layer of Ge is transferred to Si substrate. The bond at the interface of the Ge/Si heterostructures is covalent to ensure good thermal contact, mechanical strength, and to enable the formation of an ohmic contact between the Si substrate and Ge layers. To accomplish this type of bond, hydrophobic wafer bonding is used, because as the invention demonstrates the hydrogen-surface-terminating species that facilitate van der Waals bonding evolves at temperatures above 600° C. into covalent bonding in hydrophobically bound Ge/Si layer transferred systems.
摘要翻译: Ge / Si和其他非硅膜异质结构是通过晶片接合到诸如Si的廉价衬底的Ge膜的氢诱导剥离形成的。 将Ge的薄的单晶层转移到Si衬底。 在Ge / Si异质结构的界面处的键是共价的,以确保良好的热接触,机械强度,并且能够在Si衬底和Ge层之间形成欧姆接触。 为了实现这种类型的键合,使用疏水性晶片结合,因为如本发明所示的那样,促进范德华键的氢表面终止物质在高于600℃的温度下进入共价键,在疏水结合的Ge / Si层中转移 系统。
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