System for active array temperature sensing and cooling
    1.
    发明授权
    System for active array temperature sensing and cooling 有权
    有源阵列温度传感和冷却系统

    公开(公告)号:US08348503B2

    公开(公告)日:2013-01-08

    申请号:US11764703

    申请日:2007-06-18

    IPC分类号: G01K3/00

    摘要: A system and method for providing an active array of temperature sensing and cooling elements, including an active heatsink which further includes an active temperature sensing layer, a thermoelectric cooling layer, and a heatsink, which further includes a plurality of cooling channels. The temperature sensing element within the active temperature sensing layer includes a plurality of switching transistors, a linear transistor, a current sense resistor, a thermistor, a voltage sensing bus, a voltage setting bus, a current measurement bus, a measurement switching bus, a sense control bus, a storage capacitor, and a supply voltage, all under the control of a process control computer. The method of using an active array of temperature sensing and cooling elements includes the steps of aligning the shadow mask, depositing the material, detecting a thermal gradient, and controlling the thermoelectric cooling.

    摘要翻译: 一种用于提供温度感测和冷却元件的有源阵列的系统和方法,包括有源散热器,其还包括有源温度感测层,热电冷却层和散热器,其还包括多个冷却通道。 有源温度检测层内的温度检测元件包括多个开关晶体管,线性晶体管,电流检测电阻,热敏电阻,电压感测总线,电压设定总线,电流测量总线,测量开关总线, 感测控制总线,存储电容器和电源电压,全部由过程控制计算机控制。 使用温度感测和冷却元件的有源阵列的方法包括对准荫罩,沉积材料,检测热梯度和控制热电冷却的步骤。

    System and method for active array temperature sensing and cooling
    2.
    发明授权
    System and method for active array temperature sensing and cooling 有权
    有源阵列温度检测和冷却的系统和方法

    公开(公告)号:US07232694B2

    公开(公告)日:2007-06-19

    申请号:US10950646

    申请日:2004-09-28

    IPC分类号: H01L21/00 G01R31/26

    摘要: A system and method for active array temperature sensing and cooling. The system includes an active temperature sensing layer, a thermoelectric cooling layer and a heatsink layer. The temperature sensing layer is formed of temperature sensing elements that sense the temperature gradient across an unevenly heated region of the active array substrate. The thermoelectric cooling layer controls the temperature gradient sensed by the temperature sensing layer. The heatsink layer includes a plurality of cooling channels for absorbing thermal energy from the unevenly heated region. The system is under the control of a process control computer.

    摘要翻译: 一种用于有源阵列温度感测和冷却的系统和方法。 该系统包括有源温度感测层,热电冷却层和散热层。 温度感测层由感测有源阵列基板的不均匀加热区域温度梯度的温度感测元件形成。 热电冷却层控制由感温层感测的温度梯度。 散热层包括用于从不均匀加热的区域吸收热能的多个冷却通道。 该系统由过程控制计算机控制。

    Acousto-electric signal convolver, correlator and memory
    3.
    发明授权
    Acousto-electric signal convolver, correlator and memory 失效
    声电子卷积器,相关器和存储器

    公开(公告)号:US4070652A

    公开(公告)日:1978-01-24

    申请号:US631970

    申请日:1975-11-14

    IPC分类号: G06G7/195 H01L41/10 G06G7/19

    CPC分类号: G06G7/195

    摘要: An acousto-electric device provides a memory for a reference signal and provides for the convolution or correlation of input signals with the reference signal. The reference signal is transduced onto a piezoelectric surface to establish an electric field which determines the transfer and recombination of minority carriers across the p-n junction matrix of an adjacent semiconductor thereby creating a space-charge region in the semiconductor which is a spatial replication of the reference signal. The signal may be recovered in relation to the amplitude modulation of a carrier signal. For correlation or convolution of the reference signal with input signals, the input signals are provided to first or second terminals respectively and transduced onto the piezoelectric surface to produce electric fields which interact with the space-charge region of the stored reference signal to provide a product current whose integration comprises the correlation or convolution output.

    摘要翻译: 声电装置为参考信号提供存储器,并提供输入信号与参考信号的卷积或相关。 参考信号被转导到压电表面以建立电场,其确定跨越相邻半导体的pn结矩阵的少数载流子的转移和复合,由此在半导体中产生空间电荷区域,该空间电荷区域是参考的空间复制 信号。 可以相对于载波信号的幅度调制恢复信号。 为了使参考信号与输入信号相关或卷积,分别将输入信号提供给第一或第二端子并转换到压电表面上以产生与存储的参考信号的空间电荷区域相互作用的电场,以提供产品 其积分包括相关或卷积输出。

    System and method for compensation of active element variations in an active-matrix organic light-emitting diode (OLED) flat-panel display
    4.
    发明授权
    System and method for compensation of active element variations in an active-matrix organic light-emitting diode (OLED) flat-panel display 有权
    用于补偿有源矩阵有机发光二极管(OLED)平板显示器中的有源元件变化的系统和方法

    公开(公告)号:US07088318B2

    公开(公告)日:2006-08-08

    申请号:US10970382

    申请日:2004-10-22

    申请人: Paul R. Malmberg

    发明人: Paul R. Malmberg

    IPC分类号: G09G3/30 G09G3/10

    摘要: A brightness compensation system and method of providing brightness uniformity in an active-matrix organic light-emitting diode (OLED) flat-panel display. The brightness compensation system of the present invention includes a system controller, a timing generator, a test brightness generator, a pixel address generator, a video formatter, a first and second multiplexer, a memory device, a pixel adjust device, a level shifter and driver, a current sensor, an analog-to-digital converter, a DC power supply, and an active-matrix OLED display under test. The brightness compensation system and method of the present invention subjects an active-matrix OLED display to a testing operation that alternately tests every pixel, detects its output current, which is an indicator of light output level, for a given input voltage, saves the output current value in memory, then applies a corrective voltage to each pixel, so that each pixel has the same light output (output current) as its neighboring pixel.

    摘要翻译: 一种在有源矩阵有机发光二极管(OLED)平板显示器中提供亮度均匀性的亮度补偿系统和方法。 本发明的亮度补偿系统包括系统控制器,定时发生器,测试亮度发生器,像素地址发生器,视频格式化器,第一和第二多路复用器,存储器件,像素调整器件,电平转换器和 驱动器,电流传感器,模拟 - 数字转换器,直流电源和正在测试的有源矩阵OLED显示器。 本发明的亮度补偿系统和方法使有源矩阵OLED显示器对于给定的输入电压交替测试每个像素,检测其作为光输出电平的指示器的输出电流的测试操作,从而节省输出 存储器中的当前值,然后对每个像素施加校正电压,使得每个像素具有与其相邻像素相同的光输出(输出电流)。

    Random-access spoken word electron beam digitally addressable memory
    5.
    发明授权
    Random-access spoken word electron beam digitally addressable memory 失效
    随机访问口语字电子束数字寻址存储器

    公开(公告)号:US3975598A

    公开(公告)日:1976-08-17

    申请号:US361107

    申请日:1973-05-17

    IPC分类号: G10L13/02 G11B7/02

    CPC分类号: G10L13/02

    摘要: A method and apparatus for digitally addressing an electron beam to select and then scan one of a plurality of spaced apart analog recordings of spoken words on a target. An electron gun at one end of a return beam vidicon tube provides the electron beam to scan the target positioned at the other end of the tube. The target is a wafer of semiconductive material with an oxide layer facing the electron gun. Variable width openings are etched into the oxide layer such that the edges of the openings define analog recordings. A first electron beam deflection control rapidly directs the beam in the "Y" direction along the ends of the tracks to provide a track count for producing a track access signal by a digitally addressed downcounter. A second electron beam deflection control produces a scanning of the selected track in the "X" direction while the electron beam oscillates at a dither frequency in the "Y" direction to scan the width of the track. Control of the electron beam in the "Z" direction provides a beam blanking during standby mode and provides intensity modulation to improve track acquisition performance and allow variable volume emphasis during the scan mode. The scanning rate in the "X" direction is controlled to produce different word inflections or enunciation rates. A scan signal threshold detector senses the end of a word to enable compiling of a sentence with variable length words.

    摘要翻译: 一种用于对电子束进行数字寻址以选择然后扫描目标上的多个间隔开的口语模拟记录之一的方法和装置。 返回光束管的一端的电子枪提供电子束扫描位于管的另一端的靶。 目标是具有面向电子枪的氧化物层的半导体材料的晶片。 可变宽度的开口蚀刻到氧化物层中,使得开口的边缘限定模拟记录。 第一电子束偏转控制沿着轨道的端部快速地引导沿“Y”方向的波束,以提供用于通过数字寻址的下行计数器产生轨道接入信号的轨道计数。 当电子束以“Y”方向的抖动频率振荡时,第二电子束偏转控制在“X”方向上产生所选轨道的扫描,以扫描轨道的宽度。 电子束在“Z”方向的控制在待机模式下提供光束消隐,并提供强度调制以改善跟踪采集性能,并允许扫描模式下的可变音量强调。 控制“X”方向的扫描速度,产生不同的词变化或发音速率。 扫描信号阈值检测器感测单词的结尾以使得能够编译具有可变长度字的句子。

    System for and method of manufacturing a large-area backplane by use of a small-area shadow mask
    6.
    发明授权
    System for and method of manufacturing a large-area backplane by use of a small-area shadow mask 有权
    使用小面积荫罩制造大面积背板的系统和方法

    公开(公告)号:US07132016B2

    公开(公告)日:2006-11-07

    申请号:US10925726

    申请日:2004-08-25

    IPC分类号: C23C16/00 B05D5/06 B05D5/12

    摘要: A vapor deposition shadow mask system includes a number of series connected vacuum vessels each having a material deposition source and shadow mask positioned therein. A substrate is translated along a path that has a longitudinal axis that extends through the vacuum vessels. Centers of shadow masks in first and second vacuum vessels are offset laterally on opposite sides of the longitudinal axis. The system is operative for depositing material on a second area of the substrate via the material deposition source and shadow mask in the second vacuum vessel in a manner that overlaps a portion of the material deposited on a first, adjacent area of the substrate via the material deposition source and shadow mask in the first vacuum vessel.

    摘要翻译: 气相沉积荫罩系统包括多个串联连接的真空容器,每个真空容器具有定位在其中的材料沉积源和荫罩。 基底沿着具有延伸穿过真空容器的纵向轴线的路径平移。 第一和第二真空容器中的荫罩中心在纵向轴线的相对侧横向偏移。 该系统可操作用于通过材料沉积源和第二真空容器中的荫罩将材料沉积在衬底的第二区域上,使得通过材料沉积在衬底的第一相邻区域上的材料的一部分重叠 沉积源和荫罩在第一真空容器中。

    Thin film electroluminescent line array emitter and printer
    7.
    发明授权
    Thin film electroluminescent line array emitter and printer 失效
    薄膜电致发光线阵列发射器和打印机

    公开(公告)号:US4535341A

    公开(公告)日:1985-08-13

    申请号:US524807

    申请日:1983-08-19

    IPC分类号: B41J2/447 B60Q1/00 H05B37/00

    CPC分类号: B41J2/45

    摘要: The invention provides a thin film electroluminescent line array emitter structure which provides edge emissions which are typically 30 to 40 times brighter than the conventional face emissions. In an alternative embodiment, the emitter structure includes an integral capacitor in series with each emitter structure pixel. This integral thin film structure dielectric and phosphor composite layer serves both as the light-emitting layer for the edge-emitting device and as the dielectric for the capacitor.

    摘要翻译: 本发明提供一种薄膜电致发光线阵列发射器结构,其提供通常比常规面部发射亮30至40倍的边缘辐射。 在替代实施例中,发射极结构包括与每个发射极结构像素串联的整体电容器。 这种整体的薄膜结构电介质和磷光体复合层既用作边缘发射器件的发光层,也用作电容器的电介质。

    Method of making a sloped insulator charge-coupled device
    8.
    发明授权
    Method of making a sloped insulator charge-coupled device 失效
    制造倾斜绝缘体电荷耦合器件的方法

    公开(公告)号:US4364164A

    公开(公告)日:1982-12-21

    申请号:US260439

    申请日:1981-05-04

    摘要: A charge-coupled device includes an insulation layer which is interfaced with a semiconductor wafer. Gating electrodes that are responsive to clocking signals are located on the surface of the insulation layer which is oppositely disposed from the interface with the semiconductor wafer such that the electric field produced by the potential on the electrodes has a substantial lateral component in the plane of the semiconductor-insulator interface. The lateral field component induced in the semiconductor wafer reduces the transfer time of charge carriers between adjacent electrodes thereby improving the transport response of the charge carriers to the clocking signals. A method for making the sloped oxide charge-coupled device is also described in which the insulation layer grown on a semiconductor is provided with sloped areas and the electrodes are evaporated onto these sloped areas to form the device's clocking structure.

    摘要翻译: 电荷耦合器件包括与半导体晶片接口的绝缘层。 响应于时钟信号的门电极位于绝缘层的与半导体晶片的界面相对设置的表面上,使得由电极上的电位产生的电场在该平面内具有基本的横向分量 半导体 - 绝缘体接口。 在半导体晶片中感应的横向场分量减小了相邻电极之间的载流子的传输时间,从而改善了载流子对时钟信号的传输响应。 还描述了制造倾斜氧化物电荷耦合器件的方法,其中在半导体上生长的绝缘层设置有倾斜区域,并且电极蒸发到这些倾斜区域上以形成器件的时钟结构。

    Contactless test method for integrated circuits
    9.
    发明授权
    Contactless test method for integrated circuits 失效
    集成电路非接触测试方法

    公开(公告)号:US4053833A

    公开(公告)日:1977-10-11

    申请号:US553780

    申请日:1975-02-27

    CPC分类号: G01R31/303

    摘要: A method is provided for contactless testing of an integrated circuit by fabricating, integrally with the integrated circuit, at least one and preferably a plurality of conductive semiconductor elements that are electrically connected between power and/or signal sources and inputs to the integrated circuit, and that are adapted to electrically conduct when exposed to a radiation beam. The conductive elements are selectively exposed by at least one radiation beam, such as an electron or light beam, to cause the conductive elements to electrically conduct and supply desired electrical inputs at the connected inputs of the integrated circuits; and the electrical responses of at least a segment of the integrated circuit to said electrical input are measured to determine whether said circuit segment possesses specified electrical characteristics. The integrated circuit can thus be selectively and sequentially tested by segments and modules. After testing, the conductive semiconductor elements are preferably disconnected from the integrated circuit, and the integrated circuit selectively connected electrically while accommodating and passivating defective components and modules of the circuit.

    摘要翻译: 提供了一种通过与集成电路整体制造至少一个并且优选多个电连接到电源和/或信号源之间的导电半导体元件以及将集成电路的输入连接到集成电路的非接触测试的方法,以及 适于在暴露于辐射束时进行导电。 通过至少一个辐射束(例如电子或光束)选择性地暴露导电元件,以使导电元件在集成电路的连接的输入处导电并提供所需的电输入; 并且测量集成电路的至少一段对所述电输入的电响应,以确定所述电路段是否具有指定的电特性。 因此,可以通过段和模块来选择性和顺序地测试集成电路。 在测试之后,导电半导体元件优选地从集成电路断开,并且集成电路选择性地电连接,同时容纳和钝化电路的有缺陷的部件和模块。

    Contactless test method for integrated circuits
    10.
    发明授权
    Contactless test method for integrated circuits 失效
    集成电路非接触测试方法

    公开(公告)号:US3956698A

    公开(公告)日:1976-05-11

    申请号:US441924

    申请日:1974-02-12

    IPC分类号: G01R31/302 G01R31/26

    CPC分类号: G01R31/302

    摘要: A method is provided for contactless testing of an integrated circuit by fabricating, integrally with the integrated circuit, semiconductor switch elements, that is, thyristors, transistors and combinations thereof, that are connected to power and/or signal electrical inputs of the integrated circuit. Base regions of the switch elements are selectively exposed to a fine-dimensioned electron beam to switch the elements and supply desired electrical inputs at the connected inputs of the integrated circuit. The integrated circuit can thus be selectively tested preferably by segments and modules. After testing, the switch elements are disconnected from the integrated circuit, and the integrated circuit selectively connected preferably while accommodating and passivating defective components and modules of the circuit.

    摘要翻译: 提供一种用于通过与集成电路整体地制造与集成电路的电源和/或信号电输入连接的半导体开关元件,即晶闸管,晶体管及其组合的集成电路的非接触测试的方法。 开关元件的基极区域选择性地暴露于精细尺寸的电子束以切换元件并在集成电路的连接的输入处提供期望的电输入。 因此,可以优选地通过段和模块来选择性地测试集成电路。 在测试之后,开关元件与集成电路断开,并且集成电路优选地在容纳和钝化电路的有缺陷的组件和模块的同时被选择性地连接。