公开(公告)号：US07424827B2

公开(公告)日：2008-09-16

申请号：US11115981

申请日：2005-04-27

申请人： Tomohiro Yamada ,  Masato Komazawa ,  Tetsuya Hatta ,  Takatoshi Nehagi

发明人： Tomohiro Yamada ,  Masato Komazawa ,  Tetsuya Hatta ,  Takatoshi Nehagi

IPC分类号： G01N29/036

CPC分类号： G01N29/045 ,  G01N29/12 ,  G01N29/42 ,  G01N2291/014 ,  H01H2057/006 ,  H01L41/0973

摘要： In an inspecting method of a piezoelectric/electrostrictive actuator having a piezoelectric/electrostrictive element and two or more electrodes, the frequency response characteristics is picked up when a vibration is given to the piezoelectric/electrostrictive actuator, and the amount of displacement of the piezoelectric/electrostrictive actuator is predicted by the frequency response characteristics. The piezoelectric/electrostrictive actuator is precisely inspected without dissolution and destruction and without actual driving as a product.

摘要翻译： 在具有压电/电致伸缩元件和两个或更多个电极的压电/电致伸缩致动器的检查方法中，当向压电/电致伸缩致动器施加振动时，拾取频率响应特性，并且压电/ 电致伸缩致动器由频率响应特性预测。 压电/电致伸缩致动器精确检查，无需溶解和破坏，无需实际驱动作为产品。

公开(公告)号：US20050284224A1

公开(公告)日：2005-12-29

申请号：US11115981

申请日：2005-04-27

申请人： Tomohiro Yamada ,  Masato Komazawa ,  Tetsuya Hatta ,  Takatoshi Nehagi

发明人： Tomohiro Yamada ,  Masato Komazawa ,  Tetsuya Hatta ,  Takatoshi Nehagi

IPC分类号： H01L41/09 ,  G01B7/16 ,  G01H11/08 ,  G01H13/00 ,  G01N29/04 ,  G01N29/12 ,  G01N29/42 ,  H01H57/00 ,  H01L41/08 ,  H01L41/22

CPC分类号： G01N29/045 ,  G01N29/12 ,  G01N29/42 ,  G01N2291/014 ,  H01H2057/006 ,  H01L41/0973

摘要： In an inspecting method of a piezoelectric/electrostrictive actuator having a piezoelectric/electrostrictive element and two or more electrodes, the frequency response characteristics is picked up when a vibration is given to the piezoelectric/electrostrictive actuator, and the amount of displacement of the piezoelectric/electrostrictive actuator is predicted by the frequency response characteristics. The piezoelectric/electrostrictive actuator is precisely inspected without dissolution and destruction and without actual driving as a product.

摘要翻译： 在具有压电/电致伸缩元件和两个或更多个电极的压电/电致伸缩致动器的检查方法中，当向压电/电致伸缩致动器施加振动时，拾取频率响应特性，并且压电/ 电致伸缩致动器由频率响应特性预测。 压电/电致伸缩致动器精确检查，无需溶解和破坏，无需实际驱动作为产品。

公开(公告)号：US20080030102A1

公开(公告)日：2008-02-07

申请号：US11856351

申请日：2007-09-17

申请人： Takao Ohnishi ,  Tomohiro Yamada ,  Takatoshi Nehagi

发明人： Takao Ohnishi ,  Tomohiro Yamada ,  Takatoshi Nehagi

IPC分类号： H01L41/09

CPC分类号： G01R29/22 ,  B41J2/0451 ,  B41J2/04513 ,  B41J2/04541 ,  B41J2/04581 ,  B41J2/14201 ,  H01L41/257

摘要： A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference between the measured second characteristic value and the measured first characteristic value.

摘要翻译： 一种用于检查压电元件的方法包括：第一检查信号施加步骤，向所述压电元件施加具有第一预定电压波形的第一检查信号Vp（1）; 第一特征值测量步骤，在施加第一检查信号之后测量压电元件的电特性值作为第一特征值; 第二检查信号施加步骤，向所述压电元件施加具有大于所述第一检查信号的第二预定电压波形和电功率的第二检查信号Vp（2） 第二特征值测量步骤，在施加第二检查信号之后测量压电元件的电特性值作为第二特征值; 以及异常判定步骤，基于与所测量的第二特征值和测量的第一特征值之间的差对应的值，确定压电元件是否异常。

公开(公告)号：US20090174419A1

公开(公告)日：2009-07-09

申请号：US12398343

申请日：2009-03-05

申请人： Takao Ohnishi ,  Tomohiro Yamada ,  Takatoshi Nehagi

发明人： Takao Ohnishi ,  Tomohiro Yamada ,  Takatoshi Nehagi

IPC分类号： G01R29/22

CPC分类号： G01R29/22 ,  B41J2/0451 ,  B41J2/04513 ,  B41J2/04541 ,  B41J2/04581 ,  B41J2/14201 ,  H01L41/257

摘要： A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference between the measured second characteristic value and the measured first characteristic value.

摘要翻译： 一种用于检查压电元件的方法包括：第一检查信号施加步骤，向所述压电元件施加具有第一预定电压波形的第一检查信号Vp（1）; 第一特征值测量步骤，在施加第一检查信号之后测量压电元件的电特性值作为第一特征值; 第二检查信号施加步骤，向所述压电元件施加具有大于所述第一检查信号的第二预定电压波形和电功率的第二检查信号Vp（2） 第二特征值测量步骤，在施加第二检查信号之后测量压电元件的电特性值作为第二特征值; 以及异常判定步骤，基于与所测量的第二特征值和测量的第一特征值之间的差对应的值，确定压电元件是否异常。

公开(公告)号：US07525324B2

公开(公告)日：2009-04-28

申请号：US11856351

申请日：2007-09-17

申请人： Takao Ohnishi ,  Tomohiro Yamada ,  Takatoshi Nehagi

发明人： Takao Ohnishi ,  Tomohiro Yamada ,  Takatoshi Nehagi

IPC分类号： G01R29/22

CPC分类号： G01R29/22 ,  B41J2/0451 ,  B41J2/04513 ,  B41J2/04541 ,  B41J2/04581 ,  B41J2/14201 ,  H01L41/257

摘要： A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference between the measured second characteristic value and the measured first characteristic value.

摘要翻译： 一种用于检查压电元件的方法包括：第一检查信号施加步骤，向所述压电元件施加具有第一预定电压波形的第一检查信号Vp（1）; 第一特征值测量步骤，在施加第一检查信号之后测量压电元件的电特性值作为第一特征值; 第二检查信号施加步骤，向所述压电元件施加具有大于所述第一检查信号的第二预定电压波形和电功率的第二检查信号Vp（2） 第二特征值测量步骤，在施加第二检查信号之后测量压电元件的电特性值作为第二特征值; 以及异常判定步骤，基于与所测量的第二特征值和测量的第一特征值之间的差对应的值，确定压电元件是否异常。

公开(公告)号：US08877519B2

公开(公告)日：2014-11-04

申请号：US12738228

申请日：2008-10-29

申请人： Tomohiro Yamada ,  Yoichiro Handa

发明人： Tomohiro Yamada ,  Yoichiro Handa

IPC分类号： G01N33/553 ,  G01N21/55 ,  G01N21/27

CPC分类号： G01N21/554 ,  G01N21/27 ,  Y10S436/805

摘要： A chemical sensor element contains a resonator having a first reflector in which particles of a fine metal structure are arranged two-dimensionally and periodically is counterposed with interposition of a dielectric layer to a second reflector, wherein the resonance wavelength of a resonator in which the entire of the first reflector is replaced by a metal thin film having the same thickness as the metal fine structure is different from the surface plasmon resonance wavelength induced in the metal fine structure; and the mode of the surface plasmon resonance excited in the metal fine structure is coupled with the mode of the resonator in which the entire of the first reflector is replaced by the metal thin film.

摘要翻译： 化学传感器元件包括具有第一反射器的谐振器，其中精细金属结构的颗粒被二维地周期性布置，并且与第二反射器插入电介质层，其中整个谐振器的谐振波长 由具有与金属精细结构相同的厚度的金属薄膜替换为与金属精细结构中诱发的表面等离子体共振波长不同的金属薄膜; 并且在金属精细结构中激发的表面等离子体激元谐振的模式与谐振器的模式耦合，其中整个第一反射器被金属薄膜代替。

公开(公告)号：US08570464B2

公开(公告)日：2013-10-29

申请号：US12824067

申请日：2010-06-25

申请人： Tomohiro Yamada ,  Ryo Kuroda

发明人： Tomohiro Yamada ,  Ryo Kuroda

IPC分类号： G02F1/1335 ,  G02B5/22

CPC分类号： G02B5/1809 ,  G02B5/203

摘要： An optical filter includes a substrate, and a periodic structure in which a plurality of members formed of silicon are periodically arranged on a surface of the substrate. The filter selectively transmits light of a first wavelength included in light incident on the periodic structure in the direction of the substrate. The members are two-dimensionally arranged with a period of 400 nm to 500 nm. The dimension of the members in the direction parallel to the surface is of 120 nm to 160 nm. A local maximum value of the transmission spectrum of the first wavelength is within the range of 400 nm to 500 nm.

摘要翻译： 光学滤波器包括衬底，并且周期性结构，其中由硅形成的多个构件周期性地布置在衬底的表面上。 滤光器选择性地透射入射在周期性结构上的光在基板的方向上包括的第一波长的光。 构件以400nm至500nm的周期二维排列。 构件在平行于表面的方向上的尺寸为120nm至160nm。 第一波长的透射光谱的局部最大值在400nm至500nm的范围内。

公开(公告)号：US20130197009A1

公开(公告)日：2013-08-01

申请号：US13877358

申请日：2011-10-21

申请人： Yukitaka Ideyama ,  Sadao Kuromitsu ,  Takashi Furutani ,  Masayoshi Takeda ,  Satoshi Konagai ,  Tomohiro Yamada ,  Nobuaki Taniguchi ,  Yutaka Kondoh ,  Masaaki Hirano ,  Kazushi Watanabe ,  Takashi Sugane ,  Akio Kakefuda

发明人： Yukitaka Ideyama ,  Sadao Kuromitsu ,  Takashi Furutani ,  Masayoshi Takeda ,  Satoshi Konagai ,  Tomohiro Yamada ,  Nobuaki Taniguchi ,  Yutaka Kondoh ,  Masaaki Hirano ,  Kazushi Watanabe ,  Takashi Sugane ,  Akio Kakefuda

IPC分类号： C07D401/02 ,  C07D401/14 ,  C07D403/02

CPC分类号： C07D401/02 ,  A61K31/496 ,  A61K31/506 ,  C07D401/12 ,  C07D401/14 ,  C07D403/02 ,  C07D403/12

摘要： [Problem] An object of the present invention is to provide a novel anticancer drug which is useful for treating prostate cancer accompanying androgen receptor mutation[Means for Solution] The present inventors conducted thorough research on mutant androgen-related diseases for which the traditional anti-androgen drugs become ineffective. As a result, they found that the compound, which is an active ingredient of the pharmaceutical composition of the present invention, exhibits an inhibitory action against transcriptional activation in a human mutant androgen receptor (AR), and has an excellent antitumor action in a human prostate cancer-bearing mouse, thereby completing the present invention. Accordingly, the compound, which is an active ingredient of the pharmaceutical composition of the present invention, is useful for a series of androgen receptor-related diseases including prostate cancer.

摘要翻译： 本发明的目的在于提供一种可用于治疗伴随雄激素受体突变的前列腺癌的新型抗癌药物。本发明人进行了关于雄激素相关疾病的全面研究， 雄激素药物变得无效。 结果发现，作为本发明的药物组合物的活性成分的化合物在人突变型雄激素受体（AR）中表现出对转录活化的抑制作用，并且在人体中具有优异的抗肿瘤作用 前列腺癌的小鼠，从而完成本发明。 因此，作为本发明的药物组合物的活性成分的化合物可用于一系列与前列腺癌有关的雄激素受体相关疾病。

公开(公告)号：US08368898B2

公开(公告)日：2013-02-05

申请号：US12852808

申请日：2010-08-09

申请人： Tomohiro Yamada

发明人： Tomohiro Yamada

IPC分类号： G01N21/55 ,  G02B5/26

CPC分类号： G02B5/008 ,  B82Y20/00 ,  G02B6/1226 ,  G02B6/3624

摘要： Provided is an optical apparatus having high durability, less optical absorption than a hole-type metal thin film filter, high transmittance and high reflectance, and variable optical characteristics. The apparatus includes: a dielectric substrate; a metal structure group including multiple metal structures two-dimensionally and discretely disposed at regular intervals; and a dielectric layer covering the metal structure group, in which: the metal structures have a first length equal to or shorter than a predetermined wavelength in a visible light region in one direction, and a second length equal to or shorter than the wavelength in a perpendicular direction; and the metal structures resonates with light entering the dielectric substrate or the dielectric layer, having a variable dielectric constant, to generate localized surface plasmon resonance on a surface of the metal structures to have a minimum transmittance or a maximum reflectance of the light having the wavelength.

摘要翻译： 提供一种具有高耐久性，比空穴型金属薄膜滤光器的光吸收性低，透光率高，反射率高，光学特性可变的光学装置。 该装置包括：电介质基片; 包括以规则间隔二维和离散地设置的多个金属结构的金属结构组; 以及覆盖所述金属结构体的介电层，其中：所述金属结构具有在一个方向上的可见光区域中等于或短于预定波长的第一长度，以及等于或短于一个方向上的波长的第二长度 垂直方向 并且金属结构与进入具有可变介电常数的电介质基板或电介质层的光谐振，以在金属结构的表面上产生局部表面等离子体共振，以具有波长最小的光的最小透射率或最大反射率 。

公开(公告)号：US08321573B2

公开(公告)日：2012-11-27

申请号：US11663068

申请日：2005-09-01

申请人： Keiji Hirao ,  Motoe Sakanaka ,  Tomohiro Yamada

发明人： Keiji Hirao ,  Motoe Sakanaka ,  Tomohiro Yamada

IPC分类号： G06F15/16

CPC分类号： H04M11/007 ,  H04L41/08 ,  H04L41/0806 ,  H04L41/0886 ,  H04M1/72533

摘要： A communication terminal includes a CPU (28). The CPU (28) issues to a router (16) a send request for requesting the router (16) to send an ask signal for repetitive responses to a server (14). Then, the ask signal is sent to the server (14) by the router (16), and a receive port is temporarily opened. From the server (14), a response signal is repeatedly sent in response to the ask signal. To the response signal, time information representative of a waiting time from receiving an ask signal to its reply is attached. A response signal sent back while the receive port is opened arrives at the communication terminal through the router (16), but a response signal sent back after the receive port is closed is discarded in the router (16). The CPU (28) repeatedly issues a send request to the router (16) regarding a time indicated by time information attached to the response signal lastly received as an issuance cycle (T).

摘要翻译： 通信终端包括CPU（28）。 CPU（28）向路由器（16）发出请求路由器（16）向服务器（14）发送重复响应的询问信号的发送请求。 然后，询问信号被路由器（16）发送到服务器（14），并且接收端口被暂时打开。 从服务器（14），响应于询问信号重复地发送响应信号。 对于响应信号，附加表示从接收询问信号到其答复的等待时间的时间信息。 在接收端口打开时发回的响应信号通过路由器（16）到达通信终端，但在接收端口关闭后发回的响应信号在路由器（16）中被丢弃。 CPU（28）重复向路由器（16）发出关于由附加到最后接收的作为发行周期（T）的响应信号的时间信息指示的时间的发送请求。