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公开(公告)号：USRE38944E1
公开(公告)日：2006-01-24
申请号：US09974962
申请日：2001-10-12
IPC分类号： G11C8/00
CPC分类号： H01L27/10805 , G11C7/10 , G11C11/408 , G11C11/4096 , G11C11/4097 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and columns selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
摘要翻译： 具有各自被划分为多个单元或子存储器垫的存储器垫的动态RAM等半导体存储器。 每个子存储器垫包括：存储器阵列，其具有在相交的子字和子位线之间的交叉点处以网格方式位于正交和动态存储器单元的子字线和子位线; 子字线驱动器，包括对应于子字线的单元子字线驱动电路; 感测放大器，包括对应于子位线的单位放大器电路和列选择开关; 以及经由列选择开关选择性地连接指定子位线的子公共I / O线。 子存储垫以格子排列。 子存储垫上面是：主字线和列选择信号线与正交相交的层，主字线具有作为子字线的间距的整数倍的间距，列选择信号线具有 间距，是子位线的间距的整数倍; 以及选择性地连接指定的子公共I / O线的主要公共I / O线。
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公开(公告)号：US5966341A
公开(公告)日：1999-10-12
申请号：US982398
申请日：1997-12-02
IPC分类号： G11C11/401 , G11C7/10 , G11C11/407 , G11C11/408 , G11C11/409 , G11C11/4096 , G11C11/4097 , H01L21/8242 , H01L27/105 , H01L27/108 , G11C13/00
CPC分类号： H01L27/10805 , G11C11/408 , G11C11/4096 , G11C11/4097 , G11C7/10 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and column selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
摘要翻译： 具有各自被划分为多个单元或子存储器垫的存储器垫的动态RAM等半导体存储器。 每个子存储器垫包括：存储器阵列，其具有在相交的子字和子位线之间的交叉点处以网格方式位于正交和动态存储器单元的子字线和子位线; 子字线驱动器，包括对应于子字线的单元子字线驱动电路; 感测放大器，包括对应于子位线的单位放大器电路和列选择开关; 以及经由列选择开关选择性地连接指定子位线的子公共I / O线。 子存储垫以格子排列。 在子存储器衬垫之上是与主要字线和列选择信号线正交相交的层，主字线具有作为子字线的间距的整数倍的间距，列选择信号线具有 间距，是子位线的间距的整数倍; 以及选择性地连接指定的子公共I / O线的主要公共I / O线。
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3.再颁专利Large-capacity semiconductor memory with improved layout for sub-amplifiers to increase speed 有权大容量半导体存储器，具有改进的子放大器布局，以提高速度公开(公告)号：USRE42659E1
公开(公告)日：2011-08-30
申请号：US11759316
申请日：2007-06-07
IPC分类号： G11C8/00
CPC分类号： H01L27/10805 , G11C7/10 , G11C11/408 , G11C11/4096 , G11C11/4097 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and column selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
摘要翻译： 具有各自被划分为多个单元或子存储器垫的存储器垫的动态RAM等半导体存储器。 每个子存储器垫包括：存储器阵列，其具有在相交的子字和子位线之间的交叉点处以网格方式位于正交和动态存储器单元的子字线和子位线; 子字线驱动器，包括对应于子字线的单元子字线驱动电路; 感测放大器，包括对应于子位线的单位放大器电路和列选择开关; 以及经由列选择开关选择性地连接指定子位线的子公共I / O线。 子存储垫以格子排列。 在子存储器衬垫之上是与主要字线和列选择信号线正交相交的层，主字线具有作为子字线的间距的整数倍的间距，列选择信号线具有 间距，是子位线的间距的整数倍; 以及指定的子公共I / O线选择性地连接的主要公共I / O。
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公开(公告)号：US5777927A
公开(公告)日：1998-07-07
申请号：US779835
申请日：1997-01-07
IPC分类号： G11C11/401 , G11C7/10 , G11C11/407 , G11C11/408 , G11C11/409 , G11C11/4096 , G11C11/4097 , H01L21/8242 , H01L27/105 , H01L27/108 , G11C13/00
CPC分类号： H01L27/10805 , G11C11/408 , G11C11/4096 , G11C11/4097 , G11C7/10 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and column selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
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5.再颁专利Large-Capacity semiconductor memory with improved layout for sub-amplifiers to increase operational speed 有权大容量半导体存储器，具有改进的子放大器布局以提高操作速度公开(公告)号：USRE41379E1
公开(公告)日：2010-06-15
申请号：US11759345
申请日：2007-06-07
IPC分类号： G11C8/00
CPC分类号： H01L27/10805 , G11C7/10 , G11C11/408 , G11C11/4096 , G11C11/4097 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and column selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
摘要翻译： 具有各自被划分为多个单元或子存储器垫的存储器垫的动态RAM等半导体存储器。 每个子存储器垫包括：存储器阵列，其具有在相交的子字和子位线之间的交叉点处以网格方式位于正交和动态存储器单元的子字线和子位线; 子字线驱动器，包括对应于子字线的单元子字线驱动电路; 感测放大器，包括对应于子位线的单位放大器电路和列选择开关; 以及经由列选择开关选择性地连接指定子位线的子公共I / O线。 子存储垫以格子排列。 在子存储器衬垫之上是与主要字线和列选择信号线正交相交的层，主字线具有作为子字线的间距的整数倍的间距，列选择信号线具有 间距，是子位线的间距的整数倍; 以及选择性地连接指定的子公共I / O线的主要公共I / O线。
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6.再颁专利Large-capacity semiconductor memory with improved layout for sub-amplifiers to increase operational speed 有权大容量半导体存储器，具有改进的子放大器布局，以提高操作速度公开(公告)号：USRE40356E1
公开(公告)日：2008-06-03
申请号：US11176881
申请日：2005-07-08
IPC分类号： G11C8/00
CPC分类号： H01L27/10805 , G11C7/10 , G11C11/408 , G11C11/4096 , G11C11/4097 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and column selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
摘要翻译： 具有各自被划分为多个单元或子存储器垫的存储器垫的动态RAM等半导体存储器。 每个子存储器垫包括：存储器阵列，其具有在相交的子字和子位线之间的交叉点处以网格方式位于正交和动态存储器单元的子字线和子位线; 子字线驱动器，包括对应于子字线的单元子字线驱动电路; 感测放大器，包括对应于子位线的单位放大器电路和列选择开关; 以及经由列选择开关选择性地连接指定子位线的子公共I / O线。 子存储垫以格子排列。 在子存储器衬垫之上是与主要字线和列选择信号线正交相交的层，主字线具有作为子字线的间距的整数倍的间距，列选择信号线具有 间距，是子位线的间距的整数倍; 以及选择性地连接指定的子公共I / O线的主要公共I / O线。
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公开(公告)号：US5604697A
公开(公告)日：1997-02-18
申请号：US574104
申请日：1995-12-20
IPC分类号： G11C11/401 , G11C7/10 , G11C11/407 , G11C11/408 , G11C11/409 , G11C11/4096 , G11C11/4097 , H01L21/8242 , H01L27/105 , H01L27/108 , G11C13/00
CPC分类号： H01L27/10805 , G11C11/408 , G11C11/4096 , G11C11/4097 , G11C7/10 , H01L27/105
摘要： A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion. Above the sub-memory mats is a layer of: main word lines and column selection signal lines intersecting orthogonally, the main word lines having a pitch that is an integer multiple of the pitch of the sub-word lines, the column selection signal lines having a pitch that is an integer multiple of the pitch of the sub-bit lines; and main common I/O lines to which designated sub-common I/O lines are connected selectively.
摘要翻译： 具有各自被划分为多个单元或子存储器垫的存储器垫的动态RAM等半导体存储器。 每个子存储器垫包括：存储器阵列，其具有在相交的子字和子位线之间的交叉点处以网格方式位于正交和动态存储器单元的子字线和子位线; 子字线驱动器，包括对应于子字线的单元子字线驱动电路; 感测放大器，包括对应于子位线的单位放大器电路和列选择开关; 以及经由列选择开关选择性地连接指定子位线的子公共I / O线。 子存储垫以格子排列。 在子存储器衬垫之上是与主要字线和列选择信号线正交相交的层，主字线具有作为子字线的间距的整数倍的间距，列选择信号线具有 间距，是子位线的间距的整数倍; 以及选择性地连接指定的子公共I / O线的主要公共I / O线。
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公开(公告)号：US06538945B2
公开(公告)日：2003-03-25
申请号：US10050561
申请日：2002-01-18
申请人： Riichiro Takemura , Tsugio Takahashi , Masayuki Nakamura , Ryo Nagai , Norikatsu Takaura , Tomonori Sekiguchi , Shinichiro Kimura
发明人： Riichiro Takemura , Tsugio Takahashi , Masayuki Nakamura , Ryo Nagai , Norikatsu Takaura , Tomonori Sekiguchi , Shinichiro Kimura
IPC分类号： G11C700
CPC分类号： G11C7/065 , G11C11/4091 , H01L21/823807 , H01L27/092 , H01L27/10873 , H01L27/10897
摘要： Providing a semiconductor device which lessen influence of the transistor threshold voltage deviation that is one of noise elements when the sense amplifiers are amplified, and which are capable of accurately sensing and amplifying micro signals having read from the memory cells in the sense amplifiers. In a DRAM chip, P+-type gate PMOSs of P+-type polysilicon gates each having a low impurity density of channel and N+-type gate NMOSs of N+-type polysilicon gates are used in a sense amplifier cross coupling section to further increase substrate voltages of the PMOSs and to decrease substrate voltages of the NMOS. For this reason, a deviation of threshold voltage caused by channel implantation is reduced, and a small signal generated on a data line at a read operation of a low-potential memory array is accurately sensed and amplified by a sense amplifier. In addition, the threshold voltages are increased by a substrate bias effect, and a leakage current in a sense amplifier data holding state is reduced.
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公开(公告)号：US5426603A
公开(公告)日：1995-06-20
申请号：US186460
申请日：1994-01-25
申请人： Masayuki Nakamura , Takayuki Kawahara , Kazuhiko Kajigaya , Kazuyoshi Oshima , Tsugio Takahashi , Hiroshi Otori , Tetsuro Matsumoto
发明人： Masayuki Nakamura , Takayuki Kawahara , Kazuhiko Kajigaya , Kazuyoshi Oshima , Tsugio Takahashi , Hiroshi Otori , Tetsuro Matsumoto
IPC分类号： G11C11/4091 , G11C11/4097 , G11C11/24
CPC分类号： G11C11/4097 , G11C11/4091
摘要： A dynamic RAM is provided using a sense amplifier compensating for the disparities of characteristics for paired MOSFET's. With this arrangement parasitic capacitance of the bit lines can be increased to be at least 20 times the capacitance of the memory cells. Each bit line is bisected by a switch MOSFET and is disconnected thereby as needed. A plurality of sets of memory arrays are furnished, each including a switch MOSFET for interconnecting common source lines to which the sense amplifier is connected. This permits recycling of the charges of the common source lines.
摘要翻译： 使用读出放大器提供动态RAM来补偿成对MOSFET的特性差异。 利用这种布置，位线的寄生电容可以增加到存储器单元的电容的至少20倍。 每个位线由开关MOSFET二等分，并根据需要断开。 提供了多组存储器阵列，每组存储器阵列包括用于互连连接读出放大器的公共源极线的开关MOSFET。 这允许回收公共源线的电荷。
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公开(公告)号：US06563759B2
公开(公告)日：2003-05-13
申请号：US09871911
申请日：2001-06-04
IPC分类号： G11C800
CPC分类号： G11C7/1066 , G11C7/1072 , G11C7/22 , G11C8/18 , G11C11/4076 , G11C11/4082 , G11C11/4087
摘要： In a clock synchronous memory like a double data rate synchronous DRAM, a register is provided which is capable of setting a value (advanced latency) for specifying an input or entry cycle for a read or write command. Further, a timing adjustment register (124, 125) for delaying a signal by a predetermined cycle time according to the advanced latency set to the register is provided on a signal path in a column address system, which is formed between a column address latch circuit (110) and a column decoder (116).
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