STATIC RANDOM ACCESS MEMORY
    1.
    发明申请

    公开(公告)号:US20240397689A1

    公开(公告)日:2024-11-28

    申请号:US18337434

    申请日:2023-06-20

    Abstract: A static random access memory (SRAM) includes a first memory cell. The first memory cell includes: a first pull-down transistor, a first pull-up transistor, a second pull-up transistor, and a second pull-down transistor arranged on a first segment of a first fin, a first segment of a second fin, a first segment of a third fin and a first segment of a fourth fin of a substrate, respectively. The first memory cell further includes a first diode and a second diode. The first diode includes a first conductive feature in contact with a top surface and multiple upper sidewalls of a first end of the first segment of the first fin. The second diode includes a second conductive feature in contact with a top surface and multiple upper sidewalls of a second end of the first segment of the fourth fin.

    ONE-TIME PROGRAMMABLE MEMORY STRUCTURE
    3.
    发明公开

    公开(公告)号:US20240015958A1

    公开(公告)日:2024-01-11

    申请号:US18470447

    申请日:2023-09-20

    CPC classification number: H10B20/25

    Abstract: A one-time programmable memory structure comprises: A transistor includes a gate. A capacitor includes a first electrode, a second electrode, and an insulating layer. The second electrode is disposed on the first electrode. A top surface of the first electrode and a top surface of the gate are located on a same plane perpendicular to a direction of the first electrode toward the second electrode. An interconnect structure is electrically connected between the transistor and the first electrode of the capacitor. The interconnect structure is electrically connected to the first electrode at a top surface of the first electrode. A resistor comprises a conductive layer. Top and bottom surfaces of the conductive layer are respectively located on a same plane, perpendicular to the direction of the first electrode toward the second electrode, with the top and bottom surfaces of the gate.

    Magnetoresistive random access memory

    公开(公告)号:US11864391B2

    公开(公告)日:2024-01-02

    申请号:US18088761

    申请日:2022-12-26

    CPC classification number: H10B61/20 G11C7/18 H10N50/80

    Abstract: A magnetoresistive random access memory (MRAM) includes a first transistor and a second transistor on a substrate, a source line coupled to a first source/drain region of the first transistor, and a first metal interconnection coupled to a second source/drain region of the first transistor. Preferably, the first metal interconnection is extended to overlap the first transistor and the second transistor and the first metal interconnection further includes a first end coupled to the second source/drain region of the first transistor and a second end coupled to a magnetic tunneling junction (MTJ).

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