In-system test of a memory device

    公开(公告)号:US11715545B2

    公开(公告)日:2023-08-01

    申请号:US17371830

    申请日:2021-07-09

    发明人: Marco Redaelli

    摘要: An example system includes a processing resource and a switch board coupled to a system under test (SUT) and the processing resource. The SUT includes a memory device. The switch board can be configured to provide power to the SUT, communicate a first signal from the SUT to the processing resource, and provide a second signal to the SUT that simulates an input to the SUT during operation of the SUT. The processing resource can be configured to receive a function, selected from a library of functions, to execute during a test of the memory device and cause the switch board to provide the second signal during the test of the SUT.

    Method of checking abnormality in oil pressure of TCU

    公开(公告)号:US09939062B2

    公开(公告)日:2018-04-10

    申请号:US14689430

    申请日:2015-04-17

    发明人: Yoh Han Kim

    IPC分类号: F16H61/12 F16H59/68 F16H61/00

    摘要: A method of checking an abnormality in oil pressure of a transmission control unit (TCU) may include determining whether an oil pressure signal transmitted from the TCU to an electric oil pump (EOP) device is normal, transmitting a specific oil pressure value to the EOP device, the specific oil pressure value being set for determining whether the oil pressure signal transmitted from the TCU is normal, determining whether an oil pressure corresponding to the specific oil pressure value is sensed at the EOP device, determining whether a decrease range of the oil pressure sensed at the EOP device belongs within a predetermined range when compared to the specific oil pressure value, and determining whether to perform abnormality control over a transmission by operating the EOP device at set minimum revolutions per minute when the decrease range of the oil pressure sensed at the EOP device is beyond the predetermined range.