Abstract:
In the disclosure, a data processing system includes a microprocessor and a memory. The integrity of data read from a memory by a microprocessor may be checked. When an instruction address is transmitted from the microprocessor to the memory for reading the instruction data corresponding to the instruction address, predetermined dummy data is also read from the memory while the instruction data is read. The integrity of the instruction data may be check by comparing the predetermined dummy data to a hardwire data that is not stored in the memory. If the dummy data matches the hardwire data, the instruction data read from the memory is determined to be correct.
Abstract:
Serial NAND flash memory may be provided with the characteristics of continuous read of the memory across page boundaries and from logically contiguous memory locations without wait intervals, while also being clock-compatible with the high performance serial flash NOR (“HPSF-NOR”) memory read commands so that the serial NAND flash memory may be used with controllers designed for HPSF-NOR memory. Serial NAND flash memory having these compatibilities is referred to herein as high-performance serial flash NAND (“SPSF-NAND”) memory. Since devices and systems which use HPSF-NOR memories and controllers often have extreme space limitations, HPSF-NAND may also be provided with the same physical attributes of low pin count and small package size of HPSF-NOR memory for further compatibility. HPSF-NAND memory is particularly suitable for code shadow applications, even while enjoying the low “cost per bit” and low per bit power consumption of a NAND memory array at higher densities.
Abstract:
In the disclosure, a data processing system includes a microprocessor and a memory. The integrity of data read from a memory by a microprocessor may be checked. When an instruction address is transmitted from the microprocessor to the memory for reading the instruction data corresponding to the instruction address, predetermined dummy data is also read from the memory while the instruction data is read. The integrity of the instruction data may be check by comparing the predetermined dummy data to a hardwire data that is not stored in the memory. If the dummy data matches the hardwire data, the instruction data read from the memory is determined to be correct.
Abstract:
In the disclosure, a data processing system includes a microprocessor and a memory. The integrity of data read from a memory by a microprocessor may be checked. When an instruction address is transmitted from the microprocessor to the memory for reading the instruction data corresponding to the instruction address, predetermined dummy data is also read from the memory while the instruction data is read. The integrity of the instruction data may be check by comparing the predetermined dummy data to a hardwire data that is not stored in the memory. If the dummy data matches the hardwire data, the instruction data read from the memory is determined to be correct.
Abstract:
In an aspect, the disclosure is directed to a circuit which includes not limited to a memory circuit which includes a first memory element outputting a first memory output voltage and a second memory element outputting a second memory output voltage; a logical comparator circuit which is connected to the memory circuit and includes a first logical comparator which compares the first memory output voltage with a first power supply voltage to generate a first logical comparator output voltage and a second logical comparator which compares the second memory output voltage with a second power supply voltage to generate a second logical comparator output voltage; and a logical circuit which is electronically connected to the logical comparator circuit and receives a first logical comparator output voltage and a second logical comparator output voltage to perform a first logical operation which is used at least in part to generate a power on reset voltage.
Abstract:
A power supply includes a plurality of charge pump circuits. The charge pump circuits commonly generate an output voltage for programming a write data to the memory apparatus. Wherein, number of the charge pump circuits enabled for generating the output voltage is determined according to number of programmed bit(s) of the write data.
Abstract:
The data transmission apparatus includes a prior stage shift register circuit and a plurality of rear stage shift register circuits. The prior stage shift register circuit is coupled to a sense amplifying device of the memory, receives sensed data from the sense amplifying device and outputs a plurality of the readout data in series by bitwise shifting out the sensed data according to a shift clock signal. The plurality of rear stage shift register circuits are coupled to the prior stage shift register circuit and respectively coupled to a plurality of pads. The plurality of rear stage shift register circuits respectively receive the readout data and respectively bitwise transport the readout data to the pads according to a clock signal. Wherein, a frequency of the shift clock signal is less than a frequency of the clock signal.
Abstract:
A non-volatile semiconductor memory includes a memory array, a selecting device selecting a page according to addresses, a data storage device, storing page data, and an output device outputting the stored data. The data storage device includes a first data storage device receiving data from a selected page of the memory array, a second data storage device receiving data from the first data storage device, and a data transmission device configured between the first and the second data storage device. The data transmission device transmits data in a second part of the first data storage device to the second data storage device when data in a first part of the second data storage device is output, and transmits data in a first part of the first data storage device to the second data storage device when data in a second part of the second data storage device is output.
Abstract:
In the disclosure, a data processing system includes a microprocessor and a memory. The integrity of data read from a memory by a microprocessor may be checked. When an instruction address is transmitted from the microprocessor to the memory for reading the instruction data corresponding to the instruction address, predetermined dummy data is also read from the memory while the instruction data is read. The integrity of the instruction data may be check by comparing the predetermined dummy data to a hardwire data that is not stored in the memory. If the dummy data matches the hardwire data, the instruction data read from the memory is determined to be correct.
Abstract:
A power supply includes a plurality of charge pump circuits. The charge pump circuits commonly generate an output voltage for programming a write data to the memory apparatus. Wherein, number of the charge pump circuits enabled for generating the output voltage is determined according to number of programmed bit(s) of the write data.