公开(公告)号：US20180238675A1

公开(公告)日：2018-08-23

申请号：US15871050

申请日：2018-01-14

Applicant: Xiaoke Wan

Inventor： Xiaoke Wan

IPC: G01B9/02 ,  G01B11/14

CPC classification number: G01B9/0203 ,  G01B9/02002 ,  G01B9/02091 ,  G01B11/14

Abstract: In interferometer imaging signal acquisition using a movable optical beam to sample a target with specular or non specular reflecting surfaces or internal features, beam moving during interferometer signal acquisition can generate unwanted phase error due to shifting speckle field. Examples include coherent LIDAR, Interferometry Doppler sensing and optical coherence tomography. During an interferometer signal acquisition period, an interferometer sensing beam can be substantially stationary, and active step-scanning can be synchronized with interferometer signal acquisition cycles. For interferometers using repetitive chirping lasers, passive dispersive counter-scan mechanisms can be used to assist step-scanning operation.

公开(公告)号：US09696138B2

公开(公告)日：2017-07-04

申请号：US14236613

申请日：2012-07-31

Applicant: Xiaoke Wan ,  Jian Ge

Inventor： Xiaoke Wan ,  Jian Ge

IPC: G01N21/45 ,  G01B11/06 ,  G01B9/02

CPC classification number: G01B11/06 ,  G01B9/02021 ,  G01B9/02022 ,  G01B9/02027 ,  G01B9/0207 ,  G01B9/0209 ,  G01B11/0675 ,  G01N21/45

Abstract: A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.

公开(公告)号：US20110286100A1

公开(公告)日：2011-11-24

申请号：US12933490

申请日：2009-04-06

Applicant: Xiaoke Wan ,  Jian Ge

Inventor： Xiaoke Wan ,  Jian Ge

IPC: G02B27/10 ,  G02B27/00 ,  B23P11/00

CPC classification number: G02B17/04

Abstract: High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.

Abstract translation: 使用诸如楔形板和/或楔形第二表面镜的低成本标准光学部件形成高精度单片光学组件。 通过以相互接触的匹配光学表面相对于彼此滚动和/或移动部件，针对特定的光学组件找到精确的对准方案。 根据组件的功能，可以将所得到的组件布置结合或保持在一起，以形成可以插入到光学系统中的高精度单片光学组件。 单片光学组件的功能可以独立于使用它的光学系统。

公开(公告)号：US10323924B2

公开(公告)日：2019-06-18

申请号：US15871050

申请日：2018-01-14

Applicant: Xiaoke Wan

Inventor： Xiaoke Wan

IPC: G01B9/02 ,  G01B11/14

Abstract: In interferometer imaging signal acquisition using a movable optical beam to sample a target with specular or non specular reflecting surfaces or internal features, beam moving during interferometer signal acquisition can generate unwanted phase error due to shifting speckle field. Examples include coherent LIDAR, Interferometry Doppler sensing and optical coherence tomography. During an interferometer signal acquisition period, an interferometer sensing beam can be substantially stationary, and active step-scanning can be synchronized with interferometer signal acquisition cycles. For interferometers using repetitive chirping lasers, passive dispersive counter-scan mechanisms can be used to assist step-scanning operation.

公开(公告)号：US08570524B2

公开(公告)日：2013-10-29

申请号：US12849046

申请日：2010-08-03

Applicant: Xiaoke Wan ,  Jian Ge

Inventor： Xiaoke Wan ,  Jian Ge

IPC: G01B9/02 ,  G01J3/45

CPC classification number: G01J3/02 ,  G01B9/02051 ,  G01J3/0259 ,  G01J3/28 ,  G01J3/45 ,  G01J3/4531 ,  G01J3/4532 ,  G01J2003/2866

Abstract: Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.

Abstract translation: 任意光谱仪的校准可以使用稳定的单片干涉仪作为波长校准标准。 来自多色光源的光被输入到单片干涉仪，其中它基于干涉仪的光程差（OPD）而受到干扰。 所得到的波长调制输出光束由参考光谱仪分析以产生参考数据。 来自干涉仪的输出光束可以提供给任意的光谱仪器。 然后可以基于光谱仪器输出与参考数据的比较来执行任意光谱仪器的波长校准。 通过适当地选择用于单片干涉仪的材料，可以制造具有宽场和/或热补偿的高度稳定的结构。 因为干涉仪是稳定的，所以一次性生成的参考数据可以在延长的时间段内被使用，而无需重新表征。

公开(公告)号：US20060013532A1

公开(公告)日：2006-01-19

申请号：US10895238

申请日：2004-07-19

Applicant: Xiaoke Wan

Inventor： Xiaoke Wan

IPC: G02B6/00

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/707 ,  G01M11/35 ,  G02B6/02 ,  G02B6/2852

Abstract: In an optical fiber system for delivering laser, a laser beam is focused onto an optical fiber at an injection port of the system. The end portions of the fiber have cladding treatments to attenuate stray light and cladding mode light, so as to enhance the protection of the outer layer joint points. Photodetector sensors monitor scattered stray light, cladding mode light, and/or transmitted cladding mode light. Sensor signals are provided to a control unit for analyzing the fiber coupling performance. If need be, the control unit can control a laser shutter or the like to minimize or prevent damage. In materials processing applications, the photodetector signals can be analyzed to determine the processing status of a work piece.

公开(公告)号：US20140168637A1

公开(公告)日：2014-06-19

申请号：US14236613

申请日：2012-07-31

Applicant: Xiaoke Wan ,  Jian Ge

Inventor： Xiaoke Wan ,  Jian Ge

IPC: G01B11/06 ,  G01N21/45

CPC classification number: G01B11/06 ,  G01B9/02021 ,  G01B9/02022 ,  G01B9/02027 ,  G01B9/0207 ,  G01B9/0209 ,  G01B11/0675 ,  G01N21/45

Abstract: A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.

Abstract translation: 扫描单色空间低相干干涉仪（S-LCI）可用于同时测量几何厚度和折射率。 扫描S-LCI的探测光束可以是离轴会聚的单波长激光束，并且可以在傅立叶域中精确地定义样品上的光束的分解入射角。 平面平行板或其他样品的角度相关相移可以在单个系统测量中获得。 从角度相关相移可以同时获得样品的几何厚度和折射率。 附加地或替代地，S-LCI系统可以使用所公开的技术来询问样品以分析样品内的一个或多个层的位置和折射率。

公开(公告)号：US08659845B2

公开(公告)日：2014-02-25

申请号：US12933490

申请日：2009-04-06

Applicant: Xiaoke Wan ,  Jian Ge

Inventor： Xiaoke Wan ,  Jian Ge

IPC: G02B5/04

CPC classification number: G02B17/04

Abstract: High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.

Abstract translation: 使用诸如楔形板和/或楔形第二表面镜的低成本标准光学部件形成高精度单片光学组件。 通过以相互接触的匹配光学表面相对于彼此滚动和/或移动部件，针对特定的光学组件找到精确的对准方案。 根据组件的功能，可以将所得到的组件布置结合或保持在一起，以形成可以插入到光学系统中的高精度单片光学组件。 单片光学组件的功能可以独立于使用它的光学系统。

公开(公告)号：US07146073B2

公开(公告)日：2006-12-05

申请号：US10895238

申请日：2004-07-19

Applicant: Xiaoke Wan

Inventor： Xiaoke Wan

IPC: G02B6/42 ,  G02B6/26 ,  G02B6/14

CPC classification number: B23K26/032 ,  B23K26/03 ,  B23K26/707 ,  G01M11/35 ,  G02B6/02 ,  G02B6/2852

Abstract: In an optical fiber system for delivering laser, a laser beam is focused onto an optical fiber at an injection port of the system. The end portions of the fiber have cladding treatments to attenuate stray light and cladding mode light, so as to enhance the protection of the outer layer joint points. Photodetector sensors monitor scattered stray light, cladding mode light, and/or transmitted cladding mode light. Sensor signals are provided to a control unit for analyzing the fiber coupling performance. If need be, the control unit can control a laser shutter or the like to minimize or prevent damage. In materials processing applications, the photodetector signals can be analyzed to determine the processing status of a work piece.

Abstract translation: 在用于传送激光的光纤系统中，激光束被聚焦到系统的注入端口处的光纤上。 纤维的端部具有包层处理以衰减杂散光和包层模式光，从而增强外层接合点的保护。 检测器传感器监测散射杂散光，包层模式光和/或透射包层模式光。 传感器信号被提供给用于分析光纤耦合性能的控制单元。 如果需要，控制单元可以控制激光快门等以最小化或防止损坏。 在材料处理应用中，可以分析光电检测器信号以确定工件的处理状态。