Abstract:
Examples described herein generally relate to clock tree routing in a chip stack. In an example, a multi-chip device includes a chip stack. The chip stack includes chips. The chip stack includes a clock tree. In-chip routing of the clock tree is contained within one logical chip of the chip stack. The chip stack includes leaf nodes disposed in respective chips. Each leaf node of the leaf nodes is electrically connected to the clock tree through a respective leaf-level connection bridge. The respective leaf-level connection bridge extends in an out-of-chip direction through a plurality of the chips.
Abstract:
Some examples described herein relate to redundancy in a multi-chip stacked device. An example described herein is a multi-chip device. The multi-chip device includes a chip stack including vertically stacked chips. Neighboring pairs of the chips are directly connected together. Each of two or more of the chips includes a processing integrated circuit. The chip stack is configurable to operate a subset of functionality of the processing integrated circuits of the two or more of the chips when any portion of the processing integrated circuits is defective.
Abstract:
Examples herein describe techniques for forming 3D stacked devices which include a redundant logical layer. The 3D stacked devices include a plurality of semiconductor chips stacked in a vertical direction such that each chip is bonded to a chip above, below, or both in the stack. In one embodiment, each chip is the same—e.g., has the same circuitry arranged in the same configuration in the chip. The 3D stacked device provides a redundant logic layer by dividing the chips into a plurality of slivers which are interconnected by inter-chip bridges. For example, the 3D stacked device may include three stacked chips that are divided into three different slivers where each sliver includes a portion from each of the chips. So long as only one of portions in a sliver is nonfunctional, the inter-chip bridges permit the other portions in the sliver to receive and route data.
Abstract:
An integrated circuit includes: a voltage rail; voltage control circuitry coupled to the voltage rail; and a circuit block coupled to the voltage control circuitry; wherein the voltage control circuitry is selectively configurable to operate the circuit block in at least a first mode of operation and a second mode of operation; wherein in the first mode of operation, the circuit block receives a voltage that is substantially the same as a voltage of the voltage rail; and wherein in the second mode of operation, the circuit block receives a voltage that is less than the voltage of the voltage rail by a threshold voltage.
Abstract:
A method of pipelining a data path in an integrated circuit is described. The method comprises receiving a circuit design to be implemented in the integrated circuit device; providing a placement of the circuit design in the integrated circuit device; identifying a most critical path of the placement; adding pipeline registers to the most critical path; and adding pipeline registers to all paths that are parallel to the most critical path. A computer program product for pipelining a data path in an integrated circuit is also described.
Abstract:
A System-on-Chip includes a data processing engine array. The data processing engine array includes a plurality of data processing engines organized in a grid. The plurality of data processing engines are partitioned into at least a first partition and a second partition. The first partition includes one or more first data processing engines of the plurality of data processing engines. The second partition includes one or more second data processing engines of the plurality of data processing engines. Each partition is configured to implement an application that executes independently of the other partition.
Abstract:
An example integrated circuit includes an array of circuit tiles; interconnect coupling the circuit tiles in the array, the interconnect including interconnect tiles each having a plurality of connections that include at least a connection to a respective one of the circuit tiles and a connection to at least one other interconnect tile; and a plurality of local crossbars in each of the interconnect tiles, the plurality of local crossbars coupled to form a non-blocking crossbar, each of the plurality of local crossbars including handshaking circuitry for asynchronous communication.
Abstract:
Examples described herein generally related to multi-chip devices having vertically stacked chips. In an example, a multi-chip device includes a chip stack. The chip stack includes a base chip and a plurality of interchangeable chips. The base chip is directly bonded to a first one of the plurality of interchangeable chips. Each neighboring pair of the plurality of interchangeable chips is directly bonded together in an orientation with a front side of one chip of the respective neighboring pair directly bonded to a backside of the other chip of the respective neighboring pair. Each of the interchangeable chips has a same processing integrated circuit and a same hardware layout. The chip stack can include a distal chip, which can be directly bonded to a second one of the plurality of interchangeable chips.
Abstract:
The disclosed circuit arrangements include a logic circuit, multiple bi-stable circuits, and control circuitry coupled to the bi-stable circuits. Each bi-stable circuit has a data input, a clock input, and an output coupled to the logic circuit. The control circuitry is programmable to selectively connect outputs of the bi-stable circuits or signals at the data inputs of the plurality of bi-stable circuits to inputs of the logic circuit. The control circuitry generates one or more delayed clock signals from the clock signal, and selectively provides one of the one or more delayed clock signals or the clock signal without delay to the clock input of each of the first plurality of bi-stable circuits.
Abstract:
In an example, a semiconductor assembly includes an integrated circuit (IC) die. The IC die includes a first region that includes a programmable fabric; a second region that includes input/output (IO) circuits; and a third region that includes a die seal disposed between the programmable fabric and the IO circuits.