公开(公告)号：US07301360B2

公开(公告)日：2007-11-27

申请号：US10669348

申请日：2003-09-25

Applicant: Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

Inventor： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC: G01R31/00

CPC classification number: G09G3/006 ,  G01R31/315 ,  G09G3/3648 ,  G09G2300/0426

Abstract: A novel method and apparatus inspects liquid crystal display. The method and apparatus for inspecting the flat display device scans at least one signal wire by using a magnetic sensor and detects a resistance change of the magnetic sensor to perceive a short in the signal wire. Pixels can be tested using an array of magnetic sensors configured such that each sensor in the array is smaller than the pixel.

Abstract translation: 一种新颖的方法和装置检查液晶显示器。 用于检查平板显示装置的方法和装置通过使用磁传感器扫描至少一根信号线，并检测磁传感器的电阻变化以感知信号线中的短路。 可以使用配置为阵列中的每个传感器小于像素的磁性传感器阵列来测试像素。

公开(公告)号：US20100239464A1

公开(公告)日：2010-09-23

申请号：US12741389

申请日：2008-10-23

Applicant: Yong Jin Cho ,  Chul Jin Kim ,  Chong Tai Kim ,  Sung Wook Choi ,  Jae Ho Kim ,  Hyo Sop Kim ,  Jin Ho Kim

Inventor： Yong Jin Cho ,  Chul Jin Kim ,  Chong Tai Kim ,  Sung Wook Choi ,  Jae Ho Kim ,  Hyo Sop Kim ,  Jin Ho Kim

IPC: G01N21/55 ,  C23C16/44 ,  B32B15/04 ,  B32B5/16 ,  G01N33/543

CPC classification number: G01N21/658 ,  G01N21/554 ,  Y10T428/24372 ,  Y10T428/31678

Abstract: A method for manufacturing a substrate of an analytical sensor and the substrate thus prepared are disclosed. The method for manufacturing the substrate of the sensor application according to the present invention is characterized in that it comprises (a) the step of preparing a dispersed solution of nanoparticles, which are stable in a volatile organic solvent due to surface modification of nanoparticles having a pre-designed certain size on the nanometer level with an organic functional group (b) the step of preparing a single layer film of nanoparticles surface-modified with the organic functional group on the interface using said dispersed solution of nanoparticles on the basis of the Langmuir-Blodgett method, and then transferring said single layer film of nanoparticles to the substrate; and (c) the step of coating the substrate to which said single layer film of nanoparticles is transferred, with the metal thin film by means of the vacuum vapor deposition, and then optionally removing nanoparticles to manufacture a nanostructure to be used as the analytical sensor using optical characteristics. According to the method for manufacturing the substrate of the sensor application according to the present invention as above, the nanoparticles can be uniformly fixed on the solid substrate having a great area above 10×10 cm2 using the Langmuir-Blodgett method, and by such method the size, distance and shape of nanoparticles can be controlled to manufacture the nanostructures to be used as the analytical sensor, which is possible to reproduce and mass-produce. When the sensitivity property of the sensor is measured using the nanostructure substrate, thus produced, to be used as the analytical sensor, it can be identified that the sensitivity can be highly improved.

Abstract translation: 公开了一种用于制造如此制备的分析传感器和衬底的衬底的方法。 根据本发明的传感器应用的基板的制造方法的特征在于，其包括（a）制备纳米颗粒的分散溶液的步骤，所述分散溶液由于纳米颗粒的表面改性而在挥发性有机溶剂中稳定， 用有机官能团预先设计在纳米级上的一定尺寸（b）制备在界面上用有机官能团表面改性的纳米颗粒单层薄膜的步骤，该纳米粒子基于Langmuir -Blodgett方法，然后将所述单层纳米颗粒膜转移到基底; 和（c）通过真空气相沉积用金属薄膜涂覆纳米颗粒的单层膜转移到其上的基底的步骤，然后任选地除去纳米颗粒以制造用作分析传感器的纳米结构 使用光学特性。 根据如上所述的根据本发明的传感器应用的基板的制造方法，可以使用Langmuir-Blodgett方法将纳米颗粒均匀地固定在具有大于10×10cm 2的大面积的固体基板上，并且通过这种方法 可以控制纳米颗粒的尺寸，距离和形状，以制造用作分析传感器的纳米结构，其可以再现和批量生产。 当使用由此产生的纳米结构基板测量传感器的灵敏度特性作为分析传感器时，可以确定可以高度提高灵敏度。

公开(公告)号：US07358756B2

公开(公告)日：2008-04-15

申请号：US11391569

申请日：2006-03-29

Applicant: Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

Inventor： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC: G01R31/00

CPC classification number: G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract translation: 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供作为液晶显示装置的可移除部分的检查装置; 使用检查装置检查液晶显示装置的显示部分; 在检查完成之后，从液晶显示装置中取出检查装置; 并且将驱动电路附接到具有从其去除的检查装置的液晶显示装置。

公开(公告)号：US07046030B2

公开(公告)日：2006-05-16

申请号：US10669460

申请日：2003-09-25

Applicant: Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

Inventor： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC: G01R31/00

CPC classification number: G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing a substrate to inspect, wherein the substrate includes signal wirings, drive switches and capacitors formed in an effective display area of the substrate; radiating a light onto an inspection switch device and thereby supplying an inspection voltage from an inspection line to one of the drive switches through the signal wirings, so as to charge one of the capacitors; and determining if there is a defect in the effective display area of the substrate by reading the charged voltage of the capacitor.

Abstract translation: 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供衬底以检查其中衬底包括形成在衬底的有效显示区域中的信号布线，驱动开关和电容器; 将光照射到检查开关装置上，从而通过信号布线将检查线路的检查电压提供给驱动开关之一，从而对电容器之一充电; 以及通过读取电容器的充电电压来确定衬底的有效显示区域中是否存在缺陷。

公开(公告)号：US08414965B2

公开(公告)日：2013-04-09

申请号：US12741389

申请日：2008-10-23

Applicant: Yong Jin Cho ,  Chul Jin Kim ,  Chong Tai Kim ,  Sung Wook Choi ,  Jae Ho Kim ,  Hyo Sop Kim ,  Jin Ho Kim

Inventor： Yong Jin Cho ,  Chul Jin Kim ,  Chong Tai Kim ,  Sung Wook Choi ,  Jae Ho Kim ,  Hyo Sop Kim ,  Jin Ho Kim

IPC: B05D5/12 ,  C23C14/28 ,  C23C14/30 ,  C23C14/14 ,  H05B6/00 ,  H05B7/00 ,  B05D1/18 ,  B05D3/00

CPC classification number: G01N21/658 ,  G01N21/554 ,  Y10T428/24372 ,  Y10T428/31678

Abstract: A method for manufacturing a substrate of an analytical sensor and the substrate thus prepared are disclosed. The method for manufacturing the substrate of the sensor application according to the present invention is characterized in that it comprises (a) the step of preparing a dispersed solution of nanoparticles, which are stable in a volatile organic solvent due to surface modification of nanoparticles having a pre-designed certain size on the nanometer level with an organic functional group (b) the step of preparing a single layer film of nanoparticles surface-modified with the organic functional group on the interface using said dispersed solution of nanoparticles on the basis of the Langmuir-Blodgett method, and then transferring said single layer film of nanoparticles to the substrate; and (c) the step of coating the substrate to which said single layer film of nanoparticles is transferred, with the metal thin film by means of the vacuum vapor deposition, and then optionally removing nanoparticles to manufacture a nanostructure to be used as the analytical sensor using optical characteristics. According to the method for manufacturing the substrate of the sensor application according to the present invention as above, the nanoparticles can be uniformly fixed on the solid substrate having a great area above 10×10 cm2 using the Langmuir-Blodgett method, and by such method the size, distance and shape of nanoparticles can be controlled to manufacture the nanostructures to be used as the analytical sensor, which is possible to reproduce and mass-produce. When the sensitivity property of the sensor is measured using the nanostructure substrate, thus produced, to be used as the analytical sensor, it can be identified that the sensitivity can be highly improved.

Abstract translation: 公开了一种用于制造如此制备的分析传感器和衬底的衬底的方法。 根据本发明的传感器应用的基板的制造方法的特征在于，其包括（a）制备纳米颗粒的分散溶液的步骤，所述分散溶液由于纳米颗粒的表面改性而在挥发性有机溶剂中稳定， 用有机官能团预先设计在纳米级上的一定尺寸（b）制备在界面上用有机官能团表面改性的纳米颗粒单层薄膜的步骤，该纳米粒子基于Langmuir -Blodgett方法，然后将所述单层纳米颗粒膜转移到基底; 和（c）通过真空气相沉积用金属薄膜涂覆纳米颗粒的单层膜转移到其上的基底的步骤，然后任选地除去纳米颗粒以制造用作分析传感器的纳米结构 使用光学特性。 根据如上所述的根据本发明的传感器应用的基板的制造方法，可以使用Langmuir-Blodgett方法将纳米颗粒均匀地固定在具有大于10×10cm 2的大面积的固体基板上，并且通过这种方法 可以控制纳米颗粒的尺寸，距离和形状，以制造用作分析传感器的纳米结构，其可以再现和批量生产。 当使用由此产生的纳米结构基板测量传感器的灵敏度特性作为分析传感器时，可以确定可以高度提高灵敏度。

公开(公告)号：US20080136440A1

公开(公告)日：2008-06-12

申请号：US12034422

申请日：2008-02-20

Applicant: Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

Inventor： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC: G01R31/28 ,  G02F1/133

CPC classification number: G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract translation: 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供作为液晶显示装置的可移除部分的检查装置; 使用检查装置检查液晶显示装置的显示部分; 在检查完成之后，从液晶显示装置中取出检查装置; 并且将驱动电路附接到具有从其去除的检查装置的液晶显示装置。

公开(公告)号：US07362124B2

公开(公告)日：2008-04-22

申请号：US11541577

申请日：2006-10-03

Applicant: Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

Inventor： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC: G01R31/00

CPC classification number: G09G3/006

Abstract: A method and apparatus are provided for inspecting an electrical defectiveness of a liquid crystal display substrate. The method includes shorting ESD protection devices with a conductive shorting bar to form a current path on each of signal wirings of the substrate, supplying a current to the signal wirings, and determining a defectiveness of the signal wirings depending on the current flowing on the signal wirings.

Abstract translation: 提供了一种用于检查液晶显示基板的电气缺陷性的方法和装置。 该方法包括用导电短路棒短路ESD保护装置，以在基板的每个信号布线上形成电流路径，向信号布线提供电流，以及根据在信号上流动的电流来确定信号布线的缺陷 布线。

公开(公告)号：US5926376A

公开(公告)日：1999-07-20

申请号：US878599

申请日：1997-06-19

Applicant: Yong Jin Cho

Inventor： Yong Jin Cho

IPC: H05K3/46 ,  H05K1/14 ,  H05K1/18

CPC classification number: H05K1/184 ,  H05K1/144 ,  H05K1/183 ,  H05K2201/09036 ,  H05K2201/09981 ,  H05K2201/10545 ,  H05K2201/10689 ,  H05K2201/10727

Abstract: A Printed Circuit Board (PCB) card for insertion in a computer expansion slot and a method of making such a PCB card are disclosed. The PCB card includes packages disposed at least partially between a top face portion and a bottom face portion of the PCB, which improves the mounting density and heat dissipation for the packages.

Abstract translation: 公开了用于插入计算机扩展槽的印刷电路板（PCB）卡和制造这种PCB卡的方法。 PCB卡包括至少部分地布置在PCB的顶面部分和底面部分之间的包装，其改善了包装的安装密度和散热。

公开(公告)号：US07525336B2

公开(公告)日：2009-04-28

申请号：US12034422

申请日：2008-02-20

Applicant: Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

Inventor： Jong Dam Kim ,  Hyun Kyu Lee ,  Yong Jin Cho ,  See Hwa Jeong

IPC: G01R31/00 ,  G02F1/133

CPC classification number: G02F1/136259 ,  G02F1/1303 ,  G02F1/136213 ,  G02F2001/136254 ,  G02F2001/136268 ,  G02F2203/69 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract translation: 提供了用于测试液晶显示装置的方法和装置，用于在不需要夹具的情况下精确而快速地检测缺陷位置。 该方法包括提供作为液晶显示装置的可移除部分的检查装置; 使用检查装置检查液晶显示装置的显示部分; 在检查完成之后，从液晶显示装置中取出检查装置; 并且将驱动电路附接到具有从其去除的检查装置的液晶显示装置。

公开(公告)号：US07015994B2

公开(公告)日：2006-03-21

申请号：US10734173

申请日：2003-12-15

Applicant: Yong Jin Cho ,  Jung Il Lee ,  Min Joo Kim ,  See Hwa Jeong

Inventor： Yong Jin Cho ,  Jung Il Lee ,  Min Joo Kim ,  See Hwa Jeong

IPC: G02F1/1368 ,  G02F1/1343

CPC classification number: G02F1/133514 ,  G02F1/1368 ,  G02F2201/52 ,  H01L27/12

Abstract: A thin film transistor liquid crystal display is designed such that TFTs for driving green pixels are formed in the blue pixel regions. This improves the overall brightness of the liquid crystal display based on the human view-sensitive characteristics.

Abstract translation: 薄膜晶体管液晶显示器被设计成在蓝色像素区域中形成用于驱动绿色像素的TFT。 这可以基于人的视觉敏感特性来提高液晶显示器的整体亮度。