摘要:
The object of the invention is to provide a lockup device that can improve a fuel efficiency of a vehicle. The lockup device (6) has a piston (61), an output plate (63), a first coil spring (65), an inertia member (64), and a second coil spring (66). The output plate (63) is coupled to a turbine (4) such that it can rotate as an integral unit with the turbine (4). The first coil spring (65) elastically couples the piston (61) to the output plate (63) in a rotational direction. The inertia member (64) is provided such that it can rotate relative to the output member (63). The second coil spring (66) elastically couples the inertia member (64) to the output plate (63) in a rotational direction.
摘要:
The object of the invention is to provide a lockup device that can improve a fuel efficiency of a vehicle. The lockup device (6) has a piston (61), an output plate (63), a first coil spring (65), an inertia member (64), and a second coil spring (66). The output plate (63) is coupled to a turbine (4) such that it can rotate as an integral unit with the turbine (4). The first coil spring (65) elastically couples the piston (61) to the output plate (63) in a rotational direction. The inertia member (64) is provided such that it can rotate relative to the output member (63). The second coil spring (66) elastically couples the inertia member (64) to the output plate (63) in a rotational direction.
摘要:
A lockup device 6 is provided for a torque converter 1 that allows for the use of larger torsion springs 50. The lockup device 6 of the torque converter 1 includes a piston 8 and a damper mechanism 13. The piston 8 constitutes a clutch together with a front cover 3. The damper mechanism 13 includes a drive plate 9, a driven plate 10 and coil spring assemblies 12. The drive plate 9 is secured to one axial side surface of the piston 8. The coil spring assemblies 12 couple the drive plate 9 and the driven plate 10 in a rotational direction. Cutouts 41 are formed in the drive plate 9 at positions corresponding to positions of the coil spring assemblies 12. Each coil spring assembly 12 is received within the corresponding one of the cutout 41 and is axially supported by the one axial side surface of the piston 8.
摘要:
A solid-state imaging device according to the present invention is of a MOS type and includes a plurality of pixels arranged in rows and columns, and includes: a semiconductor substrate; a photodiode which is formed in the semiconductor substrate and converts, into a signal charge, light that is incident from a first main surface of the semiconductor substrate; a transfer transistor which is formed in a second main surface of the semiconductor substrate and transfers the signal charge converted by the photodiode; a light shielding film which is conductive and formed on a boundary between the pixels, above the first main surface of the semiconductor substrate; an overflow drain region electrically connected to the light shielding film and formed in the first main surface of the semiconductor substrate; and an overflow barrier region formed between the overflow drain region and the photodiode.
摘要:
A semiconductor test system for efficiently testing a semiconductor device (DUT) having a phase lock loop (PLL) circuit therein. The semiconductor test system includes a first clock and waveform generator for supplying a clock signal to the PLL circuit at a start of the first pattern block, a second clock and waveform generator for supplying pattern data to the DUT during each of the pattern blocks, a pattern generator for generating pattern data, and a timing generator for generating a tester rate signal, a clear signal, and a gate signal for controlling the tester rate signal and the clear signal in the first and second clock and waveform generators. The clock signal is continuously provided to the PLL circuit until the end of the last pattern block while the pattern data to the data pin is reset between the end of the current pattern block and the start of the next pattern block.
摘要:
An object is to enable accurate measurement of dynamic torsional characteristics of a damper assembly. A measuring device measures an angular speed (d&thgr;1/dt) of an input rotary member, an angular speed (d&thgr;2/dt) of an output rotary member and a torque (T1) transmitted to the input rotary member. A torsion angle (&thgr;) of a damper unit is calculated by integrating the angular speeds (d&thgr;1/dt) and (d&thgr;2/dt) of the input and output rotary members. A torque (T) acting on the damper unit is calculated by subtracting a product of an angular acceleration (d2&thgr;1/dt2) of the input rotary member calculated by differentiating the angular speed (d&thgr;1/dt) of the input rotary member and a moment of inertia (I1) of the input rotary member from the torque (T1) transmitted to the input rotary member.
摘要:
A resist film is formed on a semiconductor substrate by using a chemical amplification resist which generates an acid in response to the radiation of KrF excimer laser light and which reacts with the acid. If the resist film is irradiated with the KrF excimer laser light through a mask, the acid is generated in the surface of an exposed portion of the resist film, so that the surface of the exposed portion is made hydrophilic by the acid. If water vapor is supplied to the surface of the resist film, water is diffused from the surface of the exposed portion into a deep portion. If vapor of methyltriethoxysilane is sprayed onto the surface of the resist film in air at a relative humidity of 95%, an oxide film with a sufficiently large thickness is selectively formed on the surface of the exposed portion.
摘要:
A method for evaluating a resist coating comprising the steps of: forming a first layer resist pattern including an alignment mark by applying a first resist on a semiconductor substrate and by exposing and developing said first resist, said first layer resist pattern having a ridge portion; irradiating said first layer resist pattern with a deep ultraviolet ray; applying, onto said irradiated first layer resist pattern, a second resist having substantially the same refractive index as said first resist to form a second resist coating; detecting said alignment mark formed in said first layer resist pattern, and relatively positioning a pattern for said second resist and said first layer resist pattern; and determining nonuniformity characteristics of said second resist coating by measuring an overlay accuracy between said first layer resist pattern and said pattern for said second resist. The present invention ensures a quantitative evaluation in a non-contact manner for non-uniformity of a resist coating, and enables a resist coating method to be optimized.
摘要:
Each of a plurality of encoders calculates a first time by adding an encoding delay time commonly determined between the encoders to a value of an STC counter, and transmits a system stream generated by including the calculated first time to a decoder associated with the encoder in one-to-one correspondence, of a plurality of decoders constituting a decoding system. Each of the decoders calculates a second time by adding the first time to an estimated maximum value commonly determined between the decoders by adding a decoding delay time to a value of stream fluctuation of an output time occurring between the encoders, and outputs the divided image data decoded from the system stream to a synthesizer that synthesizes the image data at the calculated second time.
摘要:
A decoding device comprises a cache memory for temporally storing video image data, a unit for determining a position of a reference macroblock corresponding to macroblock to be decoded based on a motion vector obtained by analyzing an encoded bitstream, and a unit for determining whether or not a reference macroblock includes a cacheline boundary when data of the reference macroblock is not stored in the memory and for specifying the position of the boundary as a front address for the data preload from a memory storing the data of the reference macroblock.