摘要:
Disclosed is a mobile device comprising an acceleration detection unit for detecting acceleration relative to the device; a condition identification unit; and a power supply controller which determines, from a combination of the output of the acceleration detection unit and the output of the condition identification unit, whether or not to begin to supply power to the device.
摘要:
The present invention provides a high Cr Ni-based alloy filler material of which weld cracking resistance can sufficiently be increased by suppressing generation of scales, and a welding rod for shielded metal arc welding that exhibits sufficiently increased weld cracking resistance. The high Cr Ni-based alloy filler material comprises, in percent by weight, C: 0.04% or less, Si: 0.01 to 0.5%, Mn: 7% or less, Cr: 28 to 31.5%, Nb: 0.5% or less, Ta: 0.005 to 3.0%, Fe: 7 to 11%, Al: 0.01 to 0.4%, Ti: 0.01 to 0.45%, V: 0.5% or less, and, as inevitable impurities, P: 0.02% or less, S: 0.015% or less, O: 0.01% or less, N: 0.002 to 0.1%, and the balance: Ni.
摘要:
In order to provide a sound-absorbing material and a sound-absorbing panel which can be produce at a low-cost and have excellent beauty or appearance and excellent sound-absorbing characteristics, the sound-absorbing material is applied which is made from a metallic plate member (2), and multiple pierced apertures of 200 μm or smaller diameter are arranged along a board thickness on the plate-shaped member (2).
摘要:
A ferroelectric memory device which is less likely to be affected with imprint effect and a highly effective method for reducing the imprint effect of the ferroelectric memory cell. A data reversing latch circuit is disposed between a pair of bit lines BL0 and /BL0 and has capacitors C1 and C2. When data is read, it is possible to store the potentials on the pair of bit lines BL0 and /BL0 as charges in the capacitors C1 and C2, and to reverse the high-low relationship between the potentials on the bit lines BL0 and /BL0 and then back to the original relationship according to stored charges in the capacitors C1 and C2. In this way, the imprint effect of the memory cell MO may be automatically reduced when data is read by reversing the data in the memory MO connected to the bit lines BL0 and /BL0 and again reversing the data back to normal.
摘要:
The invention provides a trackball unit featuring good water resistance and user maintenance capabilities. A case (3) of the trackball unit has a drain pipe (32) connecting a cavity (33) formed inside the case (3) for accommodating a ball (2) to the exterior of the case (3). A case cover (6) has a ring-shaped projecting part (62) while a ball cover (7) has a pair of locking tabs (72, 73) which engage with the projecting part (62) of the case cover (6), so that the ball cover (7) can be detachably fitted to the case cover (6).
摘要:
In a semiconductor storage device comprising a plurality of memory cells P formed in a matrix form in a semiconductor substrate, write and read for each of which is carried out through a word line and bit line, wherein each said memory cells includes a first and a second memory transistor MT1 and MT2 connected in series. In this configuration, the semiconductor storage device with high reliability which produces abnormality in operation can be provided.
摘要:
An EEPROM device has memory cells each including of a memory transistor and a selection transistor. The memory transistor has a floating gate between a control gate and a conducting channel formed between a drain and a source. The selection transistor has its source connected to the drain of the memory transistor. During writing of data, the control gate of the memory transistor is grounded, the source of the memory transistor is kept in an open state, and a voltage corresponding to the data to be written in is applied to the gate and the drain of the selection transistor.
摘要:
A ferroelectric memory has a smaller circuit area and offers lower current consumption, higher reliability, and a longer working life than ever. In this ferroelectric memory, one end of a capacitor is connected, through a switching device that is provided for achieving connection to a divided plate line and is turned on and off by a word line, to the divided plate line, and the divided plate line is connected, through another switching device that is provided for achieving connection to a plate line and is turned on and off by a column line, to the plate line for controlling the writing and reading of data. The other end of the capacitor is connected, through another switching device that is turned on and off by the word line, to a bit line, and the bit line is connected, through another switching device that is turned on and off by the column line, to an input/output line for controlling the writing and reading of data.
摘要:
A nonvolatile memory device improves the accuracy of screening testing while applying a voltage at or lower than the limit of the withstand voltage of an element for high voltage in the screening testing. The nonvolatile memory device includes a high voltage production circuit that produces a high voltage, a high voltage waveform conversion circuit to which the high voltage is input and which converts the voltage waveform, and a memory cell section provided with memory cells in which data rewriting is performed as a result of applying the converted high voltage. The high voltage waveform conversion circuit includes a test signal input section TEST and applies the high voltage input from the high voltage production circuit to the memory cell section without converting the voltage waveform when a test signal is input to the test signal input section.
摘要:
A nonvolatile memory device improves the accuracy of screening testing while applying a voltage at or lower than the limit of the withstand voltage of an element for high voltage in the screening testing. The nonvolatile memory device includes a high voltage production circuit that produces a high voltage, a high voltage waveform conversion circuit to which the high voltage is input and which converts the voltage waveform, and a memory cell section provided with memory cells in which data rewriting is performed as a result of applying the converted high voltage. The high voltage waveform conversion circuit includes a test signal input section TEST and applies the high voltage input from the high voltage production circuit to the memory cell section without converting the voltage waveform when a test signal is input to the test signal input section.