Abstract:
A synchronous memory device, which includes a read command buffer, a replica circuit, and a latency circuit. The read command buffer provides a read signal in response to a read command. The replica circuit provides a transfer signal whose time difference with respect to the feedback clock signal is substantially identical to a period that it takes a read command buffer to provide the read signal. The latency circuit receives the read signal, and provides a latency signal having a difference of a predetermined time corresponding to CAS latency with respect to the read signal in response to the transfer signal.
Abstract:
A synchronous memory device, which includes a read command buffer, a replica circuit, and a latency circuit. The read command buffer provides a read signal in response to a read command. The replica circuit provides a transfer signal whose time difference with respect to the feedback clock signal is substantially identical to a period that it takes a read command buffer to provide the read signal. The latency circuit receives the read signal, and provides a latency signal having a difference of a predetermined time corresponding to CAS latency with respect to the read signal in response to the transfer signal.
Abstract:
There is provided a Delay Locked Loop (DLL) including a duty cycle correction circuit capable of controlling a duty error, when the duty error is generated in the DLL. The duty cycle correction circuit controls amounts of electric charges accumulated in storage units, in response to switching control signals received from the external, and outputs duty rate control signals each corresponding to a difference between the amounts of electric charges accumulated in the storage units. Therefore, the DLL including the duty cycle correction circuit can correct a duty cycle of a reference clock signal, in response to the duty rate control signals, and can output a reference clock signal with a duty cycle of 50%.
Abstract:
A synchronous memory device, which includes a read command buffer, a replica circuit, and a latency circuit. The read command buffer provides a read signal in response to a read command. The replica circuit provides a transfer signal whose time difference with respect to the feedback clock signal is substantially identical to a period that it takes a read command buffer to provide the read signal. The latency circuit receives the read signal, and provides a latency signal having a difference of a predetermined time corresponding to CAS latency with respect to the read signal in response to the transfer signal.
Abstract:
A synchronous memory device, which includes a read command buffer, a replica circuit, and a latency circuit. The read command buffer provides a read signal in response to a read command. The replica circuit provides a transfer signal whose time difference with respect to the feedback clock signal is substantially identical to a period that it takes a read command buffer to provide the read signal. The latency circuit receives the read signal, and provides a latency signal having a difference of a predetermined time corresponding to CAS latency with respect to the read signal in response to the transfer signal.
Abstract:
A semiconductor memory device optimizes current consumption by using proper sub-bank arrangement and at least two different kinds of LIO sense amplifiers having different driving capabilities. The driving capabilities of the LIO sense amplifiers are controlled in a tapered manner depending on whether a corresponding sub-bank of the LIO sense amplifier is arranged nearer to, or farther away from, its corresponding GIO sense amplifier. In other words, the farther that a sub-bank of an LIO sense amplifier is away from its corresponding GIO sense amplifier, the greater its driving capability.
Abstract:
There is provided a Delay Locked Loop (DLL) including a duty cycle correction circuit capable of controlling a duty error, when the duty error is generated in the DLL. The duty cycle correction circuit controls amounts of electric charges accumulated in storage units, in response to switching control signals received from the external, and outputs duty rate control signals each corresponding to a difference between the amounts of electric charges accumulated in the storage units. Therefore, the DLL including the duty cycle correction circuit can correct a duty cycle of a reference clock signal, in response to the duty rate control signals, and can output a reference clock signal with a duty cycle of 50%.
Abstract:
There is provided a Delay Locked Loop (DLL) including a duty cycle correction circuit capable of controlling a duty error, when the duty error is generated in the DLL. The duty cycle correction circuit controls amounts of electric charges accumulated in storage units, in response to switching control signals received from the external, and outputs duty rate control signals each corresponding to a difference between the amounts of electric charges accumulated in the storage units. Therefore, the DLL including the duty cycle correction circuit can correct a duty cycle of a reference clock signal, in response to the duty rate control signals, and can output a reference clock signal with a duty cycle of 50%.
Abstract:
A semiconductor memory device optimizes current consumption by using proper sub-bank arrangement and at least two different kinds of LIO sense amplifiers having different driving capabilities. The driving capabilities of the LIO sense amplifiers are controlled in a tapered manner depending on whether a corresponding sub-bank of the LIO sense amplifier is arranged nearer to, or farther away from, its corresponding GIO sense amplifier. In other words, the farther that a sub-bank of an LIO sense amplifier is away from its corresponding GIO sense amplifier, the greater its driving capability.
Abstract:
An input receiver controls an offset voltage by using an output feedback signal to improve a sense speed. The input receiver includes a pre-amplifier that controls an offset voltage in response to a feedback signal and amplifies an input signal with reference to a reference voltage. A sense amplifier amplifies an output signal and an inverted output signal of the pre-amplifier in response to a clock signal. A latch circuit latches an output signal and an inverted output signal of the sense amplifier. An inversion circuit uses the reference voltage as a power supply voltage and inverts an inverted output signal of the latch circuit. In addition, an output signal of the inversion circuit is supplied as the feedback signal. Alternatively, the output signal of the latch circuit may be directly supplied to the pre-amplifier as the feedback signal while not using the inversion circuit.