Abstract:
A NOR architecture for selecting a word line driver in a DRAM is disclosed. Complements of separately decoded addresses in the low, mid and high ranges are used to select a final word line driver. The output of the word line driver is at a potential negative with respect to ground for a deselected word line and a positive potential more positive than the power supply potential for a selected word line.
Abstract:
A semiconductor storage device includes: memory cells including a transistor and a capacitor; bit lines; word lines; and sense amplifiers including first and second sense amplifiers, wherein the memory cells includes: a first memory cell group sharing a first auxiliary word line; and a second memory cell group sharing a second auxiliary word line, wherein the word lines includes a first word line coupled to the first auxiliary word line and a second word line coupled to the second auxiliary word line, the first word line is coupled to the first auxiliary word line in a first word line contact region, the second word line is coupled to the second auxiliary word line in a second word line contact region, the bit lines includes first and second bit lines coupled to the first sense amplifier on both sides of the first word line contact region.
Abstract:
A memory unit includes width decoding logic enabling data to be accessed in a memory array at different data widths. To improve memory access speed, the memory unit also includes dedicated read output paths for accessing data at the full data width of the memory array. The dedicated read output paths bypass the width decoding logic and provide data from the memory array directly to a data bus, thereby providing improved memory performance when width decoding is not needed. The memory unit can be incorporated in programmable devices and a programmable device configuration can select either the read bypass paths or the width decoding logic. Hardware applications that require width decoding and improved memory access speed can utilize additional programmable device resources outside the memory unit to register the full width data from the memory unit and convert it to a different data width.
Abstract:
A synchronous memory device, which includes a read command buffer, a replica circuit, and a latency circuit. The read command buffer provides a read signal in response to a read command. The replica circuit provides a transfer signal whose time difference with respect to the feedback clock signal is substantially identical to a period that it takes a read command buffer to provide the read signal. The latency circuit receives the read signal, and provides a latency signal having a difference of a predetermined time corresponding to CAS latency with respect to the read signal in response to the transfer signal.
Abstract:
A phase locked loop circuit and method of locking a phase. The phased locked loop circuit may include a phase detector receiving an external clock signal and a feedback clock signal and outputting an up signal when a phase of the external clock signal leads a phase of the feedback clock signal and outputting a down signal when the phase of the external clock signal lags the phase of the feedback clock signal, a loop filter circuit increasing a control voltage in response to the up signal and decreasing the control voltage in response to the down signal, and a voltage controlled oscillator circuit receiving the control voltage and directly generating at least n (where n is an integer ≧4) internal clock signals. The phased locked loop circuit may also include a voltage controlled oscillator circuit, including at least four loops, receiving the control voltage and generating multiple internal clock signals.
Abstract:
The present invention relates to a semiconductor memory device having a clock buffer circuit which buffers an external clock to generate an internal clock, wherein the clock buffer circuit comprises a rising clock buffer which buffers an external clock to generate a rising internal clock corresponding to a rising edge of the external clock; and a falling clock buffer which buffers the external clock to generate a falling internal clock corresponding to a falling edge of the external clock, whereby the external signal is input to the internal circuit in synchronization with the rising internal clock and the falling internal clock.
Abstract:
A split gate (flash) EEPROM cell and a method for manufacturing the same is disclosed, in which a control gate and a floating gate are formed in a vertical structure, to minimize a size of the cell, to obtain a high coupling ratio, and to lower a programming voltage. The split gate EEPROM cell includes a semiconductor substrate having a trench; a tunneling oxide layer at sidewalls of the trench; a floating gate, a dielectric layer and a control gate in sequence on the tunneling oxide layer; a buffer dielectric layer at sidewalls of the floating gate and the control gate; a source junction in the semiconductor substrate at the bottom surface of the trench; a source electrode in the trench between opposing buffer dielectric layers, electrically connected to the source junction; and a drain junction on the surface of the semiconductor substrate outside the trench.
Abstract:
A redundant data storage system is provided comprising a first controller with top-level control of a first memory space and a second controller with top-level control of a second memory space different than the first memory space. The system is adapted for asynchronously reflectively writing state information by the first controller to the second memory space; alternatively the system is adapted for asynchronously reflectively writing state information by the second controller to the first memory space. A method is provided for operating the redundant data storage system by resolving any inconsistency between the existing state information and a modified state information associated with a state information change request, and for switching control in the redundant data storage system between the controllers.
Abstract:
A phase-changeable memory device includes a substrate having a contact region on an upper surface thereof. An insulating interlayer on the substrate has an opening therein, and a lower electrode is formed in the opening. The lower electrode has a nitrided surface portion and is in electrical contact with the contact region of the substrate. A phase-changeable material layer pattern is on the lower electrode, and an upper electrode is on the phase-changeable material layer pattern. The insulating interlayer may have a nitrided surface portion and the phase-changeable material layer may be at least partially on the nitrided surface portion of the insulating interlayer. A nitride layer may be formed on the insulating interlayer. The lower electrode may have a nitrided surface portion and the phase-changeable material layer may be at least partially on the nitrided surface portion of the lower electrode. Methods of forming phase-changeable memory devices are also disclosed.
Abstract:
A system and method for automatically saving the contents of volatile memory in a data processing device on power failure. A secondary power supply is provided, which upon failure of the primary power supply supplies power long enough for all modified information stored in volatile memory to be written to a non-volatile memory device such as NAND flash in an AutoSave procedure. In the preferred embodiment modified sectors in volatile memory are flagged, and only modified sectors with a directory list are written to non-volatile memory during the AutoSave procedure.