Co/Ni Multilayers with Improved Out-of-Plane Anisotropy for Magnetic Device Applications
    1.
    发明申请
    Co/Ni Multilayers with Improved Out-of-Plane Anisotropy for Magnetic Device Applications 有权
    具有改进的磁性器件应用的平面各向异性的Co / Ni多层

    公开(公告)号:US20140015079A1

    公开(公告)日:2014-01-16

    申请号:US14032593

    申请日:2013-09-20

    IPC分类号: H01L43/10

    摘要: A MTJ for a spintronic device is disclosed and includes a thin seed layer that enhances perpendicular magnetic anisotropy (PMA) in an overlying laminated layer with a (Co/Ni)n composition or the like where n is from 2 to 30. The seed layer is preferably NiCr, NiFeCr, Hf, or a composite thereof with a thickness from 10 to 100 Angstroms. Furthermore, a magnetic layer such as CoFeB may be formed between the laminated layer and a tunnel barrier layer to serve as a transitional layer between a (111) laminate and (100) MgO tunnel barrier. There may be a Ta insertion layer between the CoFeB layer and laminated layer to promote (100) crystallization in the CoFeB layer. The laminated layer may be used as a reference layer, dipole layer, or free layer in a MTJ. Annealing between 300° C. and 400° C. may be used to further enhance PMA in the laminated layer.

    摘要翻译: 公开了一种用于自旋电子器件的MTJ,并且包括薄层种子层,其通过(Co / Ni)n组合物等在上层叠层中提高垂直磁各向异性(PMA),其中n为2至30.种子层 优选为NiCr,NiFeCr,Hf,或其复合物,厚度为10〜100埃。 此外,可以在层压层和隧道势垒层之间形成诸如CoFeB的磁性层,以用作(111)层压体和(100)MgO隧道势垒之间的过渡层。 在CoFeB层和层叠层之间可以存在Ta插入层,以促进CoFeB层中的(100)结晶。 叠层可以用作MTJ中的参考层,偶极子层或自由层。 在300℃和400℃之间的退火可用于进一步增强层压层中的PMA。

    MTJ element for STT MRAM
    2.
    发明授权
    MTJ element for STT MRAM 有权
    STT MRAM的MTJ元素

    公开(公告)号:US08900884B2

    公开(公告)日:2014-12-02

    申请号:US13525502

    申请日:2012-06-18

    IPC分类号: H01L21/00 H01L29/82

    CPC分类号: H01L43/10 H01L43/08 H01L43/12

    摘要: An all (111) MTJ stack is disclosed in which there are no transitions between different crystalline orientations when going from layer to layer. This is accomplished by providing strongly (111)-textured layers immediately below the MgO tunnel barrier to induce a (111) orientation therein.

    摘要翻译: 公开了所有(111)MTJ堆叠,其中当从层到层不同时,不同结晶取向之间没有转变。 这通过在MgO隧道势垒正下方提供强(111) - 纹理层以在其中诱导(111)取向来实现。

    MTJ Element for STT MRAM
    3.
    发明申请
    MTJ Element for STT MRAM 有权
    STT MRAM的MTJ元素

    公开(公告)号:US20130334629A1

    公开(公告)日:2013-12-19

    申请号:US13525502

    申请日:2012-06-18

    IPC分类号: H01L43/10 H01L43/12

    CPC分类号: H01L43/10 H01L43/08 H01L43/12

    摘要: An all (111) MTJ stack is disclosed in which there are no transitions between different crystalline orientations when going from layer to layer. This is accomplished by providing strongly (111)-textured layers immediately below the MgO tunnel barrier to induce a (111) orientation therein.

    摘要翻译: 公开了所有(111)MTJ堆叠,其中当从层到层不同时,不同结晶取向之间没有转变。 这通过在MgO隧道势垒正下方提供强(111) - 纹理层以在其中诱导(111)取向来实现。

    Free Layer with High Thermal Stability for Magnetic Device Applications by Insertion of a Boron Dusting Layer
    4.
    发明申请
    Free Layer with High Thermal Stability for Magnetic Device Applications by Insertion of a Boron Dusting Layer 有权
    通过插入硼粉尘层的磁性器件应用具有高热稳定性的自由层

    公开(公告)号:US20130270523A1

    公开(公告)日:2013-10-17

    申请号:US13448557

    申请日:2012-04-17

    IPC分类号: H01L43/10 H01L43/12

    摘要: A boron or boron containing dusting layer such as CoB or FeB is formed along one or both of top and bottom surfaces of a free layer at interfaces with a tunnel barrier layer and capping layer to improve thermal stability while maintaining other magnetic properties of a MTJ stack. Each dusting layer has a thickness from 0.2 to 20 Angstroms and may be used as deposited, or at temperatures up to 400° C. or higher, or following a subsequent anneal at 400° C. or higher. The free layer may be a single layer of CoFe, Co, CoFeB or CoFeNiB, or may include a non-magnetic insertion layer. The resulting MTJ is suitable for STT-MRAM memory elements or spintronic devices. Perpendicular magnetic anisotropy is maintained in the free layer at temperatures up to 400° C. or higher. Ku enhancement is achieved and the retention time of a memory cell for STT-MRAM designs is increased.

    摘要翻译: 在具有隧道势垒层和封盖层的界面处,在自由层的顶表面和底表面中的一个或两个上形成含硼或含硼的除尘层,以改善热稳定性,同时保持MTJ堆叠的其它磁性能 。 每个除尘层的厚度为0.2至20埃,可用于沉积,或在高达400℃或更高的温度下使用,或随后在400℃或更高温度下退火。 自由层可以是CoFe,Co,CoFeB或CoFeNiB的单层,或者可以包括非磁性插入层。 所得MTJ适用于STT-MRAM存储器元件或自旋电子器件。 垂直磁各向异性在高达400℃或更高的温度下保持在自由层中。 实现了Ku增强,并且用于STT-MRAM设计的存储单元的保留时间增加。

    High Thermal Stability Reference Structure with Out-of-Plane Aniotropy for Magnetic Device Applications
    5.
    发明申请
    High Thermal Stability Reference Structure with Out-of-Plane Aniotropy for Magnetic Device Applications 有权
    用于磁性器件应用的具有非平面各向异性的高热稳定性参考结构

    公开(公告)号:US20130224521A1

    公开(公告)日:2013-08-29

    申请号:US13406972

    申请日:2012-02-28

    IPC分类号: G11B5/66 H01F41/22 H01F41/14

    摘要: Enhanced Hc and Hk in addition to higher thermal stability to 400° C. are achieved in magnetic devices by adding dusting layers on top and bottom surfaces of a spacer in a synthetic antiferromagnetic (SAF) structure to give a RL1/DL1/spacer/DL2/RL2 reference layer configuration where RL1 and RL2 layers exhibit perpendicular magnetic anisotropy (PMA), the spacer induces antiferromagnetic coupling between RL1 and RL2, and DL1 and DL2 are dusting layers that enhance PMA. RL1 and RL2 layers are selected from laminates such as (Ni/Co)n, L10 alloys, or rare earth-transition metal alloys. The reference layer may be incorporated in STT-MRAM memory elements or in spintronic devices including a spin transfer oscillator. Dusting layers and a similar SAF design may be employed in a free layer for Ku enhancement and to increase the retention time of a memory cell.

    摘要翻译: 通过在合成反铁磁(SAF)结构中在间隔物的顶表面和底表面上添加除尘层,得到RL1 / DL1 /间隔物/ DL2,在磁性器件中,除了通过在400℃下的更高的热稳定性之外,增强了Hc和Hk / RL2参考层配置,其中RL1和RL2层表现出垂直的磁各向异性(PMA),间隔物引起RL1和RL2之间的反铁磁耦合,DL1和DL2是增强PMA的除尘层。 RL1和RL2层选自诸如(Ni / Co)n,L10合金或稀土 - 过渡金属合金的层压体。 参考层可以并入STT-MRAM存储元件或包括自旋转移振荡器的自旋电子器件中。 可以在用于Ku增强的自由层中使用除尘层和类似的SAF设计,并增加存储器单元的保留时间。

    Free layer with high thermal stability for magnetic device applications by insertion of a boron dusting layer
    7.
    发明授权
    Free layer with high thermal stability for magnetic device applications by insertion of a boron dusting layer 有权
    通过插入硼粉尘层,磁性器件应用具有高热稳定性的自由层

    公开(公告)号:US08852760B2

    公开(公告)日:2014-10-07

    申请号:US13448557

    申请日:2012-04-17

    IPC分类号: H01L29/82 G01R33/09 G11B5/39

    摘要: A boron or boron containing dusting layer such as CoB or FeB is formed along one or both of top and bottom surfaces of a free layer at interfaces with a tunnel barrier layer and capping layer to improve thermal stability while maintaining other magnetic properties of a MTJ stack. Each dusting layer has a thickness from 0.2 to 20 Angstroms and may be used as deposited, or at temperatures up to 400° C. or higher, or following a subsequent anneal at 400° C. or higher. The free layer may be a single layer of CoFe, Co, CoFeB or CoFeNiB, or may include a non-magnetic insertion layer. The resulting MTJ is suitable for STT-MRAM memory elements or spintronic devices. Perpendicular magnetic anisotropy is maintained in the free layer at temperatures up to 400° C. or higher. Ku enhancement is achieved and the retention time of a memory cell for STT-MRAM designs is increased.

    摘要翻译: 在具有隧道势垒层和封盖层的界面处,在自由层的顶表面和底表面中的一个或两个上形成含硼或含硼的除尘层,以改善热稳定性,同时保持MTJ堆叠的其它磁性能 。 每个除尘层的厚度为0.2至20埃,可用于沉积,或在高达400℃或更高的温度下使用,或随后在400℃或更高温度下退火。 自由层可以是CoFe,Co,CoFeB或CoFeNiB的单层,或者可以包括非磁性插入层。 所得MTJ适用于STT-MRAM存储器元件或自旋电子器件。 垂直磁各向异性在高达400℃或更高的温度下保持在自由层中。 实现了Ku增强,并且用于STT-MRAM设计的存储单元的保留时间增加。

    Storage Element for STT MRAM Applications
    8.
    发明申请
    Storage Element for STT MRAM Applications 有权
    STT MRAM应用的存储元件

    公开(公告)号:US20140077318A1

    公开(公告)日:2014-03-20

    申请号:US13617432

    申请日:2012-09-14

    IPC分类号: H01L29/82 H01L21/02

    摘要: An improved PMA STT MTJ storage element, and a method for forming it, are described. By inserting a suitable oxide layer between the storage and cap layers, improved PMA properties are obtained, increasing the potential for a larger Eb/kT thermal factor as well as a larger MR. Another important advantage is better compatibility with high processing temperatures, potentially facilitating integration with CMOS.

    摘要翻译: 描述了改进的PMA STT MTJ存储元件及其形成方法。 通过在存储层和盖层之间插入合适的氧化物层,获得改进的PMA性质,增加更大的Eb / kT热因子的可能性以及较大的MR。 另一个重要的优点是更好的与高处理温度的兼容性,有可能促进与CMOS的集成。

    Co/Ni multilayers with improved out-of-plane anisotropy for magnetic device applications
    9.
    发明授权
    Co/Ni multilayers with improved out-of-plane anisotropy for magnetic device applications 有权
    Co / Ni多层膜,具有改进的磁性器件应用的面外各向异性

    公开(公告)号:US08541855B2

    公开(公告)日:2013-09-24

    申请号:US13068398

    申请日:2011-05-10

    摘要: A MTJ for a spintronic device is disclosed and includes a thin seed layer that enhances perpendicular magnetic anisotropy (PMA) in an overlying laminated layer with a (Co/Ni)n composition or the like where n is from 2 to 30. The seed layer is preferably NiCr, NiFeCr, Hf, or a composite thereof with a thickness from 10 to 100 Angstroms. Furthermore, a magnetic layer such as CoFeB may be formed between the laminated layer and a tunnel barrier layer to serve as a transitional layer between a (111) laminate and (100) MgO tunnel barrier. There may be a Ta insertion layer between the CoFeB layer and laminated layer to promote (100) crystallization in the CoFeB layer. The laminated layer may be used as a reference layer, dipole layer, or free layer in a MTJ. Annealing between 300° C. and 400° C. may be used to further enhance PMA in the laminated layer.

    摘要翻译: 公开了一种用于自旋电子器件的MTJ,并且包括薄层种子层,其通过(Co / Ni)n组合物等在上层叠层中提高垂直磁各向异性(PMA),其中n为2至30.种子层 优选为NiCr,NiFeCr,Hf,或其复合物,厚度为10〜100埃。 此外,可以在层压层和隧道势垒层之间形成诸如CoFeB的磁性层,以用作(111)层压体和(100)MgO隧道势垒之间的过渡层。 在CoFeB层和层叠层之间可以存在Ta插入层,以促进CoFeB层中的(100)结晶。 叠层可以用作MTJ中的参考层,偶极子层或自由层。 在300℃和400℃之间的退火可用于进一步增强层压层中的PMA。

    Storage element for STT MRAM applications
    10.
    发明授权
    Storage element for STT MRAM applications 有权
    STT MRAM应用的存储元件

    公开(公告)号:US08921961B2

    公开(公告)日:2014-12-30

    申请号:US13617432

    申请日:2012-09-14

    IPC分类号: H01L29/82 H01L21/02 H01L21/00

    摘要: An improved PMA STT MTJ storage element, and a method for forming it, are described. By inserting a suitable oxide layer between the storage and cap layers, improved PMA properties are obtained, increasing the potential for a larger Eb/kT thermal factor as well as a larger MR. Another important advantage is better compatibility with high processing temperatures, potentially facilitating integration with CMOS.

    摘要翻译: 描述了改进的PMA STT MTJ存储元件及其形成方法。 通过在存储层和盖层之间插入合适的氧化物层,获得改进的PMA性质,增加更大的Eb / kT热因子的可能性以及较大的MR。 另一个重要的优点是更好的与高处理温度的兼容性,有可能促进与CMOS的集成。