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公开(公告)号:US06875556B2
公开(公告)日:2005-04-05
申请号:US10690777
申请日:2003-10-23
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Satoru Miyazawa
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Satoru Miyazawa
IPC分类号: C08F220/26 , C08F228/02 , C08F232/04 , C08F236/20 , G03F7/004 , G03F7/039 , H01L21/027
CPC分类号: G03F7/0046 , G03F7/0392 , G03F7/0397 , Y10S430/108 , Y10S430/111
摘要: A resist composition comprising as the base resin a blend of a fluorinated polymer which is sensitive to high-energy radiation and highly transparent at a wavelength of up to 200 nm and a sulfonate-containing polymer exhibiting a high contrast upon alkali dissolution is improved in transparency and alkali dissolution contrast as well as plasma etching resistance.
摘要翻译: 抗蚀剂组合物包含作为基础树脂的在高达200nm的波长下对高能量辐射敏感且高度透明的含氟聚合物的共混物和在碱溶解时显示出高对比度的含磺酸盐的聚合物的透明度 和碱溶性对比度以及等离子体耐蚀刻性。
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公开(公告)号:US06710148B2
公开(公告)日:2004-03-23
申请号:US10068298
申请日:2002-02-08
申请人: Yuji Harada , Jun Hatakeyama , Jun Watanabe , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Michitaka Ootani , Satoru Miyazawa , Kentaro Tsutsumi , Kazuhiko Maeda
发明人: Yuji Harada , Jun Hatakeyama , Jun Watanabe , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Michitaka Ootani , Satoru Miyazawa , Kentaro Tsutsumi , Kazuhiko Maeda
IPC分类号: C08F11800
CPC分类号: G03F7/0395 , C08F232/08 , G03F7/0046 , G03F7/0397
摘要: A copolymer of an acrylate monomer containing fluorine at &agr;-position with a norbornene derivative is highly transparent to VUV radiation and resistant to dry etching. A resist composition using the resin as a base polymer is sensitive to high-energy radiation below 200 nm, has excellent sensitivity, and is suited for lithographic microprocessing.
摘要翻译: 在α-位含氟的丙烯酸酯单体与降冰片烯衍生物的共聚物对VUV辐射是高度透明的并且耐干蚀刻。 使用树脂作为基础聚合物的抗蚀剂组合物对于低于200nm的高能辐射敏感,具有优异的灵敏度,并且适用于光刻微处理。
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公开(公告)号:US07169869B2
公开(公告)日:2007-01-30
申请号:US11179606
申请日:2005-07-13
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Michitaka Ootani , Haruhiko Komoriya
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Michitaka Ootani , Haruhiko Komoriya
IPC分类号: C08F12/30
CPC分类号: C08F28/02 , G03F7/0046 , G03F7/0392 , G03F7/0397 , Y10S430/106 , Y10S430/111
摘要: A resist composition comprising a polymer containing vinyl sulfonate units having fluorinated hydrophilic groups as a base resin has excellent transparency, substrate adhesion and developer penetrability as well as plasma etching resistance, and is suited for lithographic microprocessing.
摘要翻译: 包含具有氟化亲水基团的乙烯基磺酸酯单元作为基础树脂的聚合物的抗蚀剂组合物具有优异的透明性,底物粘合性和显影剂渗透性以及耐等离子体耐蚀刻性,并且适用于光刻微处理。
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公开(公告)号:US07067231B2
公开(公告)日:2006-06-27
申请号:US10968971
申请日:2004-10-21
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
CPC分类号: G03F7/0046 , C08F220/24 , G03F7/0397 , Y10S430/106 , Y10S430/108 , Y10S430/111
摘要: A polymer comprising recurring units having a partial structure of formula (1) wherein R1 is a single bond or alkylene or fluoroalkylene, R2 and R3 are H or alkyl or fluoroalkyl, at least one of R2 and R3 contains at least one fluorine atom is used as a base resin to formulate a resist composition which has advantages including high transparency to radiation having a wavelength of up to 200 nm, substrate adhesion, developer affinity and dry etching resistance
摘要翻译: 包含具有式(1)的部分结构的重复单元的聚合物,其中R 1是单键或亚烷基或氟代亚烷基,R 2和R 3, SUP>是H或烷基或氟代烷基,R 2和R 3中的至少一个含有至少一个氟原子用作基础树脂以配制抗蚀剂组合物,其中 具有波长高达200nm的辐射的高透明度,底物粘附性,显影剂亲和性和耐干蚀刻性的优点
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公开(公告)号:US20050267275A1
公开(公告)日:2005-12-01
申请号:US11179606
申请日:2005-07-13
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Michitaka Ootani , Haruhiko Komoriya
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Michitaka Ootani , Haruhiko Komoriya
IPC分类号: C08F28/02 , C08F212/14 , C08F220/12 , C08F232/00 , G03F7/004 , G03F7/039 , H01L21/027 , C08F12/30
CPC分类号: C08F28/02 , G03F7/0046 , G03F7/0392 , G03F7/0397 , Y10S430/106 , Y10S430/111
摘要: A resist composition comprising a polymer containing vinyl sulfonate units having fluorinated hydrophilic groups as a base resin has excellent transparency, substrate adhesion and developer penetrability as well as plasma etching resistance, and is suited for lithographic microprocessing.
摘要翻译: 包含具有氟化亲水基团的乙烯基磺酸酯单元作为基础树脂的聚合物的抗蚀剂组合物具有优异的透明性,底物粘合性和显影剂渗透性以及耐等离子体耐蚀刻性,并且适用于光刻微处理。
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公开(公告)号:US20050175935A1
公开(公告)日:2005-08-11
申请号:US11052214
申请日:2005-02-08
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
IPC分类号: C08F220/00 , C08F232/08 , G03C1/76 , G03F7/004 , G03F7/039 , H01L21/027
CPC分类号: G03F7/0395 , G03F7/0046 , G03F7/0392 , G03F7/0397
摘要: A chemically amplified resist composition comprising an alternating copolymer of an acrylate monomer having a fluoroalkyl group at alpha-position with a norbornene derivative, when processed through ArF excimer laser exposure by lithography, is improved in resolution and dry etching resistance and minimized in line edge roughness.
摘要翻译: 当通过光刻法通过ArF准分子激光曝光进行处理时,包含具有α-位置上的氟代烷基的丙烯酸酯单体与降冰片烯衍生物的交替共聚物的化学增幅抗蚀剂组合物的分辨率和干蚀刻电阻提高并且线边缘粗糙度最小化 。
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公开(公告)号:US20050089797A1
公开(公告)日:2005-04-28
申请号:US10968971
申请日:2004-10-21
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
IPC分类号: C08G61/02 , C08F16/26 , C08F20/28 , C08F32/08 , C08F220/24 , G03C1/10 , G03C1/76 , G03F7/004 , G03F7/039 , H01L21/027
CPC分类号: G03F7/0046 , C08F220/24 , G03F7/0397 , Y10S430/106 , Y10S430/108 , Y10S430/111
摘要: A polymer comprising recurring units having a partial structure of formula (1) wherein R1 is a single bond or alkylene or fluoroalkylene, R2 and R3 are H or alkyl or fluoroalkyl, at least one of R2 and R3 contains at least one fluorine atom is used as a base resin to formulate a resist composition which has advantages including high transparency to radiation having a wavelength of up to 200 nm, substrate adhesion, developer affinity and dry etching resistance.
摘要翻译: 包含具有式(1)的部分结构的重复单元的聚合物,其中R 1是单键或亚烷基或氟代亚烷基,R 2和R 3, SUP>是H或烷基或氟代烷基,R 2和R 3中的至少一个含有至少一个氟原子用作基础树脂以配制抗蚀剂组合物,其中 具有波长高达200nm的辐射的高透明度,底物粘附性,显影剂亲和性和耐干蚀刻性的优点。
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公开(公告)号:US20050084796A1
公开(公告)日:2005-04-21
申请号:US10925014
申请日:2004-08-25
申请人: Jun Hatakeyama , Yuji Harada , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
发明人: Jun Hatakeyama , Yuji Harada , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Haruhiko Komoriya , Kazuhiro Yamanaka
IPC分类号: G03C1/494 , G03F7/00 , G03F7/004 , G03F7/039 , H01L21/027
CPC分类号: G03F7/0046 , G03F7/0395 , G03F7/0397 , Y10S430/108
摘要: A resist composition comprising a blend of a cyclic polymer having alcoholic groups as soluble groups and a polymer having carboxyl or hexafluoroalcohol groups whose hydrogen atoms are replaced by acid labile groups as a base resin forms a resist film which is improved in transparency, alkali dissolution contrast and plasma etching resistance.
摘要翻译: 包含具有醇基作为可溶性基团的环状聚合物和具有羧酸或六氟醇基团的聚合物的共聚物的抗蚀剂组合物,其氢原子被酸不稳定基团替代为基础树脂形成抗蚀剂膜,其透明度提高,碱溶解对比度 和等离子体耐蚀刻性。
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公开(公告)号:US06861197B2
公开(公告)日:2005-03-01
申请号:US10084828
申请日:2002-02-28
申请人: Yuji Harada , Jun Watanabe , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Michitaka Ootani , Satoru Miyazawa , Kentaro Tsutsumi , Kazuhiko Maeda
发明人: Yuji Harada , Jun Watanabe , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Michitaka Ootani , Satoru Miyazawa , Kentaro Tsutsumi , Kazuhiko Maeda
IPC分类号: C08F220/22 , G03F7/004 , G03F7/039
CPC分类号: C08F220/22 , G03F7/0046 , G03F7/0397 , Y10S430/108 , Y10S430/126 , Y10S430/168
摘要: A base polymer having incorporated an ester group having a fluorinated alicyclic unit is provided. A resist composition comprising the polymer is sensitive to high-energy radiation, and has excellent sensitivity at a wavelength of less than 200 nm, significantly improved transparency by virtue of the fluorinated alicyclic units incorporated as well as satisfactory plasma etching resistance. The resist composition has a low absorption at the exposure wavelength of a F2 laser and is ideal as a micropatterning material in VLSI fabrication.
摘要翻译: 提供了具有含有氟化脂环族单元的酯基的基础聚合物。 包含聚合物的抗蚀剂组合物对高能量辐射敏感,并且在小于200nm的波长下具有优异的灵敏度,由于所掺入的氟化脂环族单元以及令人满意的等离子体耐蚀刻性而显着提高了透明度。 抗蚀剂组合物在F2激光的曝光波长处具有低吸收,并且在VLSI制造中是理想的微图案材料。
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公开(公告)号:US06824955B2
公开(公告)日:2004-11-30
申请号:US10328007
申请日:2002-12-26
申请人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Michitaka Ootani , Haruhiko Komoriya
发明人: Yuji Harada , Jun Hatakeyama , Yoshio Kawai , Masaru Sasago , Masayuki Endo , Shinji Kishimura , Kazuhiko Maeda , Michitaka Ootani , Haruhiko Komoriya
IPC分类号: G03C1492
CPC分类号: G03F7/0046 , G03F7/0045 , G03F7/0395 , G03F7/0397 , Y10S430/106 , Y10S430/108 , Y10S430/111
摘要: A resist composition comprising a copolymer of an acrylic ester monomer containing fluorine at &agr;-position with a norbornene derivative containing oxygen or sulfur within the norbornene ring as a base resin is sensitive to high-nergy radiation below 200 nm, has excellent sensitivity, transparency and dry etching resistance, and is suited for lithographic microprocessing.
摘要翻译: 包含α位上含氟的丙烯酸酯单体与在降冰片烯环内含有氧或硫的降冰片烯衍生物作为基础树脂的共聚物的抗蚀剂组合物对于200nm以下的高能量辐射敏感,具有优异的灵敏度,透明度和 干蚀刻电阻,适用于光刻微处理。
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