Low-power driven display device
    3.
    发明授权
    Low-power driven display device 失效
    低功耗驱动显示设备

    公开(公告)号:US07319465B2

    公开(公告)日:2008-01-15

    申请号:US10648789

    申请日:2003-08-27

    IPC分类号: G09G5/00 G06F3/038

    摘要: For a display device having a solar cell and a power buffer for keeping stored electric power, a display system which has a low-power drive mode, self-contained power and no need for recharging or power wiring is provided. The display system includes a solar cell using a thin-film semiconductor, a power storage element for temporarily storing the produced power, a driving circuit, a matrix display unit, a display rewrite instruction unit for inputting screen rewrite and a control circuit and starts rewriting a display when power sufficient to rewrite an image screen is stored in the solar cell. The display device having remarkable portability and no limited battery life, which controls a display mode depending on the power produced by the solar cell, can display even when power generation is low and allows self-contained power even if the storage element has a small capacity, can be obtained.

    摘要翻译: 对于具有用于保持存储电力的太阳能电池和电源缓冲器的显示装置,提供具有低功率驱动模式,独立电源并且不需要充电或电力布线的显示系统。 显示系统包括使用薄膜半导体的太阳能电池,用于临时存储所产生的电力的电力存储元件,驱动电路,矩阵显示单元,用于输入屏幕重写的显示重写指令单元和控制电路,并开始重写 在足够重写图像屏幕的电力时的显示器被存储在太阳能电池中。 即使在发电量低的情况下,也能够显示出依赖太阳能电池产生的功率来控制显示模式的显示便携性和电池寿命有限的显示装置,即使存储元件的容量小 , 可以获得。

    Method of diffusing aluminum into silicon substrate for manufacturing
semiconductor device
    4.
    发明授权
    Method of diffusing aluminum into silicon substrate for manufacturing semiconductor device 失效
    将铝扩散到硅衬底中用于制造半导体器件的方法

    公开(公告)号:US4154632A

    公开(公告)日:1979-05-15

    申请号:US931390

    申请日:1978-08-07

    IPC分类号: H01L21/225

    CPC分类号: H01L21/2254 Y10S148/033

    摘要: An aluminum diffusion source layer is formed by vacuum evaporation on a major surface of a silicon substrate. The silicon substrate is heated to form an aluminum-silicon alloy layer, an aluminum doped silicon recrystallization layer and an aluminum diffusion layer. Thereafter, the aluminum-silicon alloy layer is removed from the major surface of the silicon substrate. Drive-in diffusion is performed so as to diffuse, aluminum included in the silicon recrystallization layer and the aluminum diffusion layer, into the silicon substrate. As a result, the aluminum diffusion concentration of 10.sup.16 -10.sup.19 atoms/cm.sup.3 can be obtained.

    摘要翻译: 通过在硅衬底的主表面上真空蒸发形成铝扩散源层。 加热硅衬底以形成铝 - 硅合金层,铝掺杂硅再结晶层和铝扩散层。 此后,从硅衬底的主表面去除铝 - 硅合金层。 进行驱入扩散,以将包含在硅再结晶层中的铝和铝扩散层扩散到硅衬底中。 结果,可以获得1016-1019原子/ cm3的铝扩散浓度。

    WIRE HARNESS CONTINUITY INSPECTION DEVICE, WIRE HARNESS CONTINUITY INSPECTION PROGRAM, AND WIRE HARNESS CONTINUITY INSPECTION METHOD
    5.
    发明申请
    WIRE HARNESS CONTINUITY INSPECTION DEVICE, WIRE HARNESS CONTINUITY INSPECTION PROGRAM, AND WIRE HARNESS CONTINUITY INSPECTION METHOD 有权
    线束连续检测装置,线束连续检测程序和线束连续检测方法

    公开(公告)号:US20130009649A1

    公开(公告)日:2013-01-10

    申请号:US13577703

    申请日:2011-02-04

    IPC分类号: G01R31/04

    CPC分类号: B60R16/0207 G01R31/045

    摘要: A wire harness continuity inspection method includes: specifying a first certain electrical wire and a second certain electrical wire of which one end is connected to the other end of the first certain electrical wire, described in the first region-based connector/wiring information, and regarding them as a single electrical wire; referring to auxiliary device-based wiring information to obtain a first terminal of a first electrical component and a second terminal of a second electrical component connected by a circuit line, which are described in the auxiliary device-based wiring information; referring to the region-based connector/wiring information to specify a first electrical wire of which one end is connected to the first terminal of the first electrical component, described in the region-based connector/wiring information; and determining whether the terminal connected to the other end of the first electrical wire is identical to the second terminal of the second electrical component.

    摘要翻译: 线束连续性检查方法包括:在第一区域连接器/布线信息中描述的第一特定电线和第一特定电线,其一端连接到第一特定电线的另一端,以及 将其作为单根电线; 参考基于辅助设备的布线信息,以获得在基于辅助设备的布线信息中描述的第一电气部件的第一端子和由电路线连接的第二电气部件的第二端子; 参考基于区域的连接器/布线信息,以指定在基于区域的连接器/布线信息中描述的第一电线,其一端连接到第一电气部件的第一端子; 以及确定连接到第一电线的另一端的端子是否与第二电气部件的第二端子相同。

    Thin film semiconductor device having inverted stagger structure, and
device having such semiconductor device
    8.
    发明授权
    Thin film semiconductor device having inverted stagger structure, and device having such semiconductor device 失效
    具有反交错结构的薄膜半导体器件,以及具有这种半导体器件的器件

    公开(公告)号:US5294811A

    公开(公告)日:1994-03-15

    申请号:US801350

    申请日:1991-12-02

    摘要: TFTs with an inverted stagger structure are fabricated according to the invention as follows; a glass substrate after depositing amorphous silicon (a-Si) thereupon is transferred to a laser annealing chamber which is kept in non-oxidation ambient and provided with a sample holder and a substrate heating mechanism. The substrate is fixed on the sample holder, then subjected to laser annealing while being heated from the glass substrate side, thereby growing polycrystalline silicon having substantially improved crystallinity, on which a-Si is further deposited. According to this process of the invention, it is capable of forming TFTs having a higher mobility and a smaller leakage current in the periphery of the substrate, with addition of almost no changes to the process and device structures of conventional TFTs which constitute pixels, and even more the peripheral drive circuitry is capable of being integrated in the display substrate.

    摘要翻译: 根据本发明如下制造具有反交错结构的TFT: 将沉积非晶硅(a-Si)后的玻璃基板转移到保持在非氧化环境中的激光退火室,并且设置有样品保持器和基板加热机构。 将基板固定在样品保持器上,然后在从玻璃基板侧加热的同时进行激光退火,从而生长出具有显着改善的结晶度的多晶硅,其中进一步沉积a-Si。 根据本发明的这个方法,能够在衬底周围形成具有较高迁移率和较小漏电流的TFT,并且几乎不改变构成像素的传统TFT的工艺和器件结构,以及 外围驱动电路甚至能够集成在显示基板中。

    WIRE HARNESS CONTINUITY INSPECTION DEVICE, WIRE HARNESS CONTINUITY INSPECTION PROGRAM, AND WIRE HARNESS CONTINUITY INSPECTION METHOD
    10.
    发明申请
    WIRE HARNESS CONTINUITY INSPECTION DEVICE, WIRE HARNESS CONTINUITY INSPECTION PROGRAM, AND WIRE HARNESS CONTINUITY INSPECTION METHOD 有权
    线束连续检测装置,线束连续检测程序和线束连续检测方法

    公开(公告)号:US20120262185A1

    公开(公告)日:2012-10-18

    申请号:US13513653

    申请日:2010-12-03

    IPC分类号: G01R31/04

    CPC分类号: G01R31/021 G06F2217/36

    摘要: A wire harness continuity inspection method according to the invention includes: a referring step of referring to auxiliary device-based wiring information to specify a first terminal of a first electrical component and a second terminal of a second electrical component connected by a circuit line, which are described in the auxiliary device-based wiring information; a first specifying step of referring to region-based connector/wiring information to specify a first electrical wire of which one end is connected to the first terminal of the first electrical component, described in the region-based connector/wiring information; and a first determining step of determining whether the terminal connected to the other end of the first electrical wire is identical to the second terminal of the second electrical component.

    摘要翻译: 根据本发明的线束连续性检查方法包括:参考辅助设备布线信息以指定由电路线连接的第一电气部件的第一端子和第二电气部件的第二端子的参考步骤, 在基于辅助设备的布线信息中描述; 第一指定步骤,参考基于区域的连接器/布线信息,以指定其一端连接到第一电气部件的第一端子的第一电线,在基于区域的连接器/布线信息中描述; 以及第一确定步骤,确定连接到第一电线的另一端的端子是否与第二电气部件的第二端子相同。