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734 条记录 (耗时 0.031 秒)

    Wired implantable monolithic integrated sensor circuit
    1.
    发明授权
    Wired implantable monolithic integrated sensor circuit 有权

    公开(公告)号：US12076137B2

    公开(公告)日：2024-09-03

    申请号：US18202071

    申请日：2023-05-25

    申请人： INTEGRATED MEDICAL SENSORS, INC.

    发明人： Muhammad Mujeeb-U-Rahman ,  Meisam Honarvar Nazari ,  Mehmet Sencan

    IPC分类号： A61B5/145 ,  A61B5/00 ,  A61B5/1486

    CPC分类号： A61B5/14532 ,  A61B5/0004 ,  A61B5/14865 ,  A61B5/6849 ,  A61B5/6848

    摘要： There is provided a glucose sensor system comprising: a transmitter (2) for containing a battery (212), the transmitter being for placement on top of patient skin; a transcutaneous connector (3) comprising at least one conductive path; and an implantable monolithic integrated circuit (I) for placement beneath the patient skin, wherein the implantable monolithic integrated circuit comprises a potentiostat and an electrochemical sensing element; wherein the potentiostat is electrically coupled to the transmitter (2) via the transcutaneous connector (3), and the electrochemical sensing element is configured to sense glucose concentration and generate an electrical signal representative of the glucose concentration, and wherein the potentiostat is electrically connected to the electrochemical sensing element.

    System and method for hole inspection
    2.
    发明授权
    System and method for hole inspection 有权

    公开(公告)号：US12061169B2

    公开(公告)日：2024-08-13

    申请号：US17660976

    申请日：2022-04-27

    申请人： JENTEK Sensors, Inc.

    发明人： Todd Dunford ,  Neil Goldfine ,  Stuart Chaplan

    IPC分类号： G01N27/90 ,  G01N27/904 ,  G01R33/09

    CPC分类号： G01N27/904 ,  G01N27/9006 ,  G01R33/091

    摘要： A system and method are provided for inspecting challenging material locations such as holes. The system may include a sensor cartridge (“mandrel”) for hole inspection that has a helical portion to which a sensor array is attached. The radius of the helical portion can be increased or decreased by applying a torque to the helical portion thereby allowing the sensor to be inserted into a hole or pressed against the wall of the hole. A scanner is described to which mandrels can be quickly connected and changed enabling an inspector to quickly switch between different mandrels (e.g., for different holes sizes and sensor configurations). Also disclosed is an inspection procedure and data processing algorithm for performing an inspection. The data processing algorithm utilizes a signature library for enhancing the detection or sizing of features of interest such as cracks. The algorithm and library can account for material edges, various material types.

    Method for producing a crystalline film
    3.
    发明授权
    Method for producing a crystalline film 有权

    公开(公告)号：US12059703B2

    公开(公告)日：2024-08-13

    申请号：US17476469

    申请日：2021-09-15

    申请人： MATRIX SENSORS, INC.

    发明人： David K Britt ,  Paul R Wilkinson ,  Steven Yamamoto

    IPC分类号： C30B29/58 ,  B05C5/00 ,  B05C5/02 ,  B05C11/10 ,  B05C13/02 ,  B05C15/00 ,  G01N29/02

    CPC分类号： B05C5/004 ,  B05C5/0225 ,  B05C11/1005 ,  B05C13/02 ,  B05C15/00 ,  G01N29/022 ,  G01N2291/0426

    摘要： A method is provided for coating a surface of a material with a film of porous coordination polymer. A first substrate having a first surface to be coated is positioned in a processing chamber such that the first surface is placed in an opposing relationship to a second surface. The second surface may be provided by a wall of the processing chamber, or in some cases the second surface may be provided by a second substrate to be coated. The first substrate is held such that a gap exists between the first and second surfaces, and the gap is filled with at least one reaction mixture comprising reagents sufficient to form the crystalline film on at least the first surface. A thin gap (e.g., less than 2 mm) between the first and second surfaces is effective for producing a high quality film having a thickness less than 100 μm. Confining the volume of the reaction mixture to a thin layer adjacent the substrate surface significantly reduces problems with sedimentation and concentration control. The size, shape, or average thickness of the gap may be adjusted during formation of the film in response to feedback from at least one film growth monitor.

    Device and Method for Determining Dewpoint or Humidity
    7.
    发明公开
    Device and Method for Determining Dewpoint or Humidity 审中-公开

    公开(公告)号：US20240151668A1

    公开(公告)日：2024-05-09

    申请号：US18387847

    申请日：2023-11-07

    申请人： Matrix Sensors, Inc.

    发明人： Paul R Wilkinson ,  Thomas D Carr

    IPC分类号： G01N25/68

    CPC分类号： G01N25/68

    摘要： A device for measuring dew point or humidity comprises a single resonator and at least one temperature-regulating element arranged to control the temperature of the resonator by heating and/or cooling. Frequency measuring circuitry is arranged to generate signals indicative of measured frequencies of the resonator. At least one controller or processor receives the signals and determines the temperature of the resonator at which condensation (e.g., dew, frost, or condensed vapor) appears on the resonator or evaporates from the resonator according to the signals.

    Method for producing a crystalline film on a substrate surface
    8.
    发明授权
    Method for producing a crystalline film on a substrate surface 有权

    公开(公告)号：US11946160B2

    公开(公告)日：2024-04-02

    申请号：US18129829

    申请日：2023-04-01

    申请人： MATRIX SENSORS, INC.

    发明人： David K Britt ,  Paul R Wilkinson ,  Steven Yamamoto

    IPC分类号： C30B28/04 ,  C07F9/00 ,  C07F15/04 ,  C08J5/18 ,  C30B29/58 ,  G01G3/16

    CPC分类号： C30B28/04 ,  C07F9/00 ,  C07F15/04 ,  C08J5/18 ,  C30B29/58 ,  G01G3/165

    摘要： An apparatus and method is provided for coating a surface of a material with a film of porous coordination polymer. A first substrate having a first surface to be coated is positioned in a processing chamber such that the first surface is placed in a substantially opposing relationship to a second surface. In some embodiments, the second surface is provided by a wall of the processing chamber, and in other embodiments the second surface is provided by a second substrate to be coated. The first substrate is held such that a gap exists between the first and second surfaces, and the gap is filled with at least one reaction mixture comprising reagents sufficient to form the crystalline film on at least the first surface. A thin gap (e.g., having a thickness less than 2 mm) between the first and second surfaces is effective for producing a high quality film having a thickness less than 100 μm. Confining the volume of the reaction mixture to a thin layer adjacent the substrate surface significantly reduces problems with sedimentation and concentration control. In some embodiments, the size, shape, or average thickness of the gap is adjusted during formation of the film in response to feedback from at least one film growth monitor.