Packaging structure and method of MEMS pressure sensor

    公开(公告)号:US11953392B1

    公开(公告)日:2024-04-09

    申请号:US18370897

    申请日:2023-09-21

    发明人: Tongqing Liu

    摘要: The present application discloses a packaging structure and method of an MEMS pressure sensor. The packaging structure of the MEMS pressure sensor includes: a film, forming a sealing chamber with a base, during manufacturing the sealing chamber is internally equipped with a sensing medium and a pressure sensor chip, when the external pressure increases, the film bends towards an inner side of the sealing chamber to cause the sealing chamber to contract and transmit pressure to the pressure sensor chip through the sensing medium. The packaging structure of the present application can avoid the sensing chip from being damaged by excessive contraction of the sealing chamber due to pressure overload, and thus achieves overload protection.

    Temperature-compensated micro-electromechanical device, and method of temperature compensation in a micro-electromechanical device
    6.
    发明授权
    Temperature-compensated micro-electromechanical device, and method of temperature compensation in a micro-electromechanical device 有权
    温度补偿微机电装置,以及微机电装置中的温度补偿方法

    公开(公告)号:US08733170B2

    公开(公告)日:2014-05-27

    申请号:US12683888

    申请日:2010-01-07

    IPC分类号: G01P15/08 G01P21/00

    摘要: A micro-electromechanical device includes a semiconductor substrate, in which a first microstructure and a second microstructure of reference are integrated. The first microstructure and the second microstructure are arranged in the substrate so as to undergo equal strains as a result of thermal expansions of the substrate. Furthermore, the first microstructure is provided with movable parts and fixed parts with respect to the substrate, while the second microstructure has a shape that is substantially symmetrical to the first microstructure but is fixed with respect to the substrate. By subtracting the changes in electrical characteristics of the second microstructure from those of the first, variations in electrical characteristics of the first microstructure caused by changes in thermal expansion or contraction can be compensated for.

    摘要翻译: 微机电装置包括半导体衬底,其中第一微结构和第二参考微结构被集成。 第一微结构和第二微结构被布置在基板中,以便由于基板的热膨胀而产生相等的应变。 此外,第一微结构相对于基板设置有可移动部件和固定部件,而第二微结构具有与第一微结构基本对称的形状,但是相对于基板固定。 通过从第一微结构的电特性减去第一微结构的电特性的变化,可以补偿由热膨胀或收缩的变化引起的第一微结构的电特性的变化。

    Method for producing a component having a semiconductor substrate and component
    8.
    发明授权
    Method for producing a component having a semiconductor substrate and component 有权
    用于制造具有半导体衬底和部件的部件的方法

    公开(公告)号:US07803646B2

    公开(公告)日:2010-09-28

    申请号:US10544821

    申请日:2003-11-06

    IPC分类号: H01L21/00

    CPC分类号: B81C1/0069 B81C2201/0115

    摘要: A method for producing a component having a semiconductor substrate, in which porous semiconductor material is generated for the purpose of developing at least one thermally decoupled pattern. In the material that has been rendered porous, a recess or a plurality of recesses is/are etched to produce at least one region that is defined by the one recess or the plurality of recesses and is thermally decoupled. On the at least one region, the pattern to be thermally decoupled is then formed.

    摘要翻译: 一种用于制造具有半导体衬底的部件的方法,其中产生多孔半导体材料用于形成至少一个热解耦图形。 在已经被多孔化的材料中,凹陷或多个凹陷被蚀刻以产生由一个凹部或多个凹部限定并且被热解耦的至少一个区域。 在至少一个区域上,形成待热解耦的图案。

    High temperature microelectromechanical (MEM) devices and fabrication method

    公开(公告)号:US20070054433A1

    公开(公告)日:2007-03-08

    申请号:US11222721

    申请日:2005-09-08

    IPC分类号: H01L21/00

    CPC分类号: B81C1/0069 B81C2203/032

    摘要: A microelectromechanical (MEM) device per the present invention comprises a semiconductor wafer—typically an SOI wafer, a substrate, and a high temperature bond which bonds the wafer to the substrate to form a composite structure. Portions of the composite structure are patterned and etched to define stationary and movable MEM elements, with the movable elements being mechanically coupled to the stationary elements. The high temperature bond is preferably a mechanical bond, with the wafer and substrate having respective bonding pads which are aligned and mechanically connected to form a thermocompression bond to effect the bonding. A metallization layer is typically deposited on the composite structure and patterned to provide electrical interconnections for the device. The metallization layer preferably comprises a conductive refractory material such as platinum to withstand high temperature environments.

    Method for producing a micromechanical device and a micromechanical device
    10.
    发明申请
    Method for producing a micromechanical device and a micromechanical device 审中-公开
    微机械装置和微机械装置的制造方法

    公开(公告)号:US20060226114A1

    公开(公告)日:2006-10-12

    申请号:US10543357

    申请日:2003-09-25

    IPC分类号: C23F1/00

    摘要: A method for manufacturing a micromechanical device and a resulting micromechanical device are provided, the device having a substrate material, a membrane, and a cavity situated between the substrate and the membrane in a membrane cavity area. In this method, holes are first produced through the membrane in a first etching step, and the cavity is subsequently produced using a second etching step.

    摘要翻译: 提供了一种用于制造微机械装置和所得微机械装置的方法,该装置具有在膜腔区域中位于基板和膜之间的基板材料,膜和空腔。 在该方法中,首先在第一蚀刻步骤中通过膜产生孔,然后使用第二蚀刻步骤制造空腔。