Monitoring equipment for detection of emission
    1.
    发明授权
    Monitoring equipment for detection of emission 失效
    用于检测排放物的监测设备

    公开(公告)号:US4883972A

    公开(公告)日:1989-11-28

    申请号:US190757

    申请日:1988-05-06

    Applicant: Charles D. Coe

    Inventor: Charles D. Coe

    Abstract: The invention relates to monitoring equipment for smoke and/or fine particle emissions from fossil fuel systems, of the type where a beam of visible light is passed across a flue from a light source to a detector, a difference in the light intensity received by the detector from the known intensity of the source indicating absorption of light by smoke and/or fine particles in the flue, and the degree of difference indicating the level of smoke and/or fine particles. The objective of the invention is to provide monitoring equipment of the above type, of simpler, lower cost, more robust nature than has hitherto been provided. The objective is met by a construction comprising two units (1, 2) for location of opposite sides of a flue or chimney each unit comprising a light source, (L.sub.1, L.sub.2) a lens (4) and a light detector (D.sub.1, D.sub.2), the light from the light source of each said unit being directed by its lens across the flue or chimney in a divergence path, to be gathered by the lens of the opposite unit and directed to the detector in the opposite unit, the outputs from the detectors of each unit being combined to provide a reading of the degree of smoke and/or fine particulate material existing in the flue or chimney.

    DETECTING SYSTEM USING SPECTRUM MEASUREMENT DEVICE

    公开(公告)号:US20240319079A1

    公开(公告)日:2024-09-26

    申请号:US18581378

    申请日:2024-02-20

    Abstract: A detecting system using a spectrum measurement device and detecting an object is provided. The system includes: a sampling module and spectrum measurement devices assembled to the sampling module. The sampling module provides an illumination beam to the object and collects measurement beams reflected by the object to the spectrum measurement devices. The illumination beam has an illumination light waveband. The measurement beams have the illumination light waveband. The spectrum measurement devices include first and second spectrum measurement devices. The first spectrum measurement device includes a digital micromirror device. The measurement beams include first and second measurement beams transmitted to the first and second spectrum measurement devices respectively. The first spectrum measurement device detects a portion of the illumination light waveband of the first measurement beam, and at the same time the second spectrum measurement device detects another portion of the illumination light waveband of the second measurement beam.

    Method and apparatus for measuring optical attenuation of an optical
medium
    5.
    发明授权
    Method and apparatus for measuring optical attenuation of an optical medium 失效
    用于测量光学介质光学衰减的方法和装置

    公开(公告)号:US5078489A

    公开(公告)日:1992-01-07

    申请号:US394114

    申请日:1989-08-15

    Inventor: Winfried Lieber

    Abstract: A method and apparatus for measuring the optical attenuation of optical mediums characterized by a first transmitter and a second receiver being connected to one output of the optical medium and the second transmitter and first receiver being connected to the other output. Thus, four measuring processes can be obtained, which include measuring the signal from the first transmitter after it passes through the optical medium by the first receiver, measuring the signal from the first transmitter in the second receiver before it passes through the optical medium, measuring the signal from the second transmitter after it has passed through the optical medium by the second receiver and measuring the signal from the second transmitter by the first receiver before it passes through the optical medium. These four values are then processed to determine the exact attenuation of the optical medium.

    Abstract translation: 一种用于测量光学介质的光学衰减的方法和装置,其特征在于第一发射机和第二接收机连接到光学介质的一个输出,第二发射机和第一接收机连接到另一个输出。 因此,可以获得四个测量过程,其中包括在第一发射机通过第一接收机通过光介质之后测量来自第一发射机的信号,在通过光学介质之前测量来自第二接收机中的第一发射机的信号,测量 来自第二发射机的信号在其通过第二接收机通过光介质之后,在通过光学介质之前由第一接收机测量来自第二发射机的信号。 然后处理这四个值以确定光学介质的精确衰减。

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