Apparatus and method for producing a substantially straight instrument image

    公开(公告)号:US20030071993A1

    公开(公告)日:2003-04-17

    申请号:US09951467

    申请日:2001-09-13

    CPC classification number: G01J3/28 G01J3/04

    Abstract: An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.

    Light spectrum detecting apparatus
    3.
    发明申请
    Light spectrum detecting apparatus 失效
    光谱检测装置

    公开(公告)号:US20030117621A1

    公开(公告)日:2003-06-26

    申请号:US10333991

    申请日:2003-01-27

    Inventor: Naoki Inamoto

    CPC classification number: G01J3/02 G01J3/0262 G01J3/2803

    Abstract: A light spectrum detecting apparatus according to the present invention comprises a photodetector (13) and a light transmitting plate (13b) covering a light receiving surface (13a) of the photodetector (13), and in the apparatus, a front surface S of the light transmitting plate 13b is inclined and, among incidents lights, any light once reflected by a back surface T of the light transmitting plate (13b) travels thereafter, with being totally reflected by the front surface S and the back surface T of the light transmitting plate (13b), to a side surface 13d of the light transmitting plate (13b). Any stray light can be prevented from entering the photodetector (13).

    Abstract translation: 根据本发明的光谱检测装置包括覆盖光电检测器(13)的光接收表面(13a)的光电检测器(13)和透光板(13b),并且在该装置中, 透光板13b是倾斜的,并且在事件发光中,一旦透光板(13b)的背面T反射的任何光在其之后行进,被透光板的前表面S和背面T完全反射 (13b)连接到透光板(13b)的侧表面13d。 可以防止任何杂散光进入光电检测器(13)。

    SNR calculation method and optical spectrum measurement apparatus
    4.
    发明申请
    SNR calculation method and optical spectrum measurement apparatus 失效
    SNR计算方法和光谱测量装置

    公开(公告)号:US20020113962A1

    公开(公告)日:2002-08-22

    申请号:US10080820

    申请日:2002-02-21

    Inventor: Manabu Kojima

    CPC classification number: G01J3/02 G01J3/027 G01J3/28

    Abstract: An SNR calculation method having the steps of measuring the wavelength characteristic of a dynamic range in an optical spectrum measurement apparatus for each wavelength in a multiplexed wavelength range and storing the wavelength characteristic in a storage unit, measuring the signal level and the noise level of a measured optical signal wavelength, reading the noise level of the wavelength of the measured optical signal produced by each of other optical signal wavelengths multiplexed on the measured optical signal wavelength from the storage unit, subtracting the noise level read from the storage unit from the noise level of the measured optical signal wave length to provide the corrected noise level, and calculating the SNR of the measured optical signal from the measured optical signal level and the corrected noise level.

    Abstract translation: 一种SNR计算方法,具有以下步骤:在多个波长范围内测量光谱测量装置中每个波长的动态范围的波长特性,并将波长特性存储在存储单元中,测量信号电平和噪声电平 测量光信号波长,从存储单元读取在测量的光信号波长上复用的其他光信号波长中的每一个产生的测量光信号的波长的噪声电平,从存储单元读取的噪声电平从噪声电平 的测量光信号波长以提供校正的噪声电平,以及根据测量的光信号电平和校正的噪声电平计算测量的光信号的SNR。

    Measuring weavelength change
    5.
    发明申请
    Measuring weavelength change 有权
    测量波长变化

    公开(公告)号:US20030156287A1

    公开(公告)日:2003-08-21

    申请号:US10275119

    申请日:2003-02-27

    Inventor: Lun Kai Cheng

    Abstract: An optical wavelength analyser including: an entrance slit (4) for receiving a light beam (3) including signals with various wavelengths and passings the beam at least partly; a diffractor (6, 7, 9) for receiving the passed beam and diffracting the signals dependent on their wavelength; a detector (8) including adjacent detector elements (32, 33, 35, 36, 38, 39) for receiving the diffracted signals and generating their output signals; a processor (21) for determining the wavelengths from the output signals, in which the received light beam has a spatially uniform intensity; the diffractor diffracts each signal on a different detector element subset, consisting of at least a first element (32, 33, 35, 36, 38, 39) for receiving at least a first signal with a first signal level; the processor determines each signal's wavelength dependent on the first signal level and a calibration value.

    Abstract translation: 一种光波长分析仪,包括:用于接收光束(3)的入射狭缝(4),其包括具有各种波长的信号并且至少部分地传递所述光束; 用于接收经过的光束并根据其波长衍射信号的衍射器(6,7,9); 包括用于接收衍射信号并产生其输出信号的相邻检测器元件(32,33,35,36,38,39)的检测器(8); 用于根据所述输出信号确定所述波长的处理器(21),其中所接收的光束具有空间上均匀的强度; 所述衍射器将不同的检测器元件子集上的每个信号衍射,所述检测器元件子集由至少第一元件(32,33,35,36,38,39)组成,用于至少接收具有第一信号电平的第一信号; 处理器根据第一信号电平和校准值确定每个信号的波长。

    Apparatus and methods to compensate for polarization-dependent losses
    6.
    发明申请
    Apparatus and methods to compensate for polarization-dependent losses 审中-公开
    用于补偿偏振相关损耗的装置和方法

    公开(公告)号:US20020105644A1

    公开(公告)日:2002-08-08

    申请号:US10068129

    申请日:2002-02-05

    CPC classification number: G01J3/44 G01J3/02 G01J3/0224 G02B5/3025

    Abstract: Polarization-dependent losses (PDL) are balanced in an optical system through the use of a weak polarizer placed in an optical path so as to compensate for the static PDL of the rest of the system. The weak polarizer comprises an interface or a layer of material having a different refractive index in the operating wavelength band, placed in the optical path at an angle to provide a desired level of PDL compensation. The geometry and indices of the two material are deliberately chosen to compensate for PDL elsewhere in the system. One implementation of the invention involves the use glass and air as the two materials, either in the form of a prism or a glass plate. The invention may alternatively take the form of a weak polarizer adhered to, or sandwiched between, a block of optical material such as glass. Preferably, a material having an index close to that of glass would be used in such a case, such as a polymer. The invention is applicable to many different optical configurations, including spectrum analysis, optical telecommunication networks and multiplexing devices. A Raman/fluorescence detection system is disclosed including a grating which diffracts and spectrally disperses light at characteristic wavelengths. In this embodiment, the PDL compensator is preferably placed in the optical path upstream of the grating (whether reflective or transmissive), with a trap being used to collect energy of the unwanted polarization.

    Abstract translation: 偏振相关损耗(PDL)在光学系统中通过使用放置在光路中的弱偏振片进行平衡,以补偿系统其余部分的静态PDL。 弱偏振器包括在工作波长带中具有不同折射率的界面或一层材料,以一角度放置在光路中以提供期望的PDL补偿水平。 故意选择两种材料的几何和指数,以补偿系统中其他地方的PDL。 本发明的一个实施方案涉及使用玻璃和空气作为棱镜或玻璃板形式的两种材料。 本发明可以替代地采用粘附到或夹在诸如玻璃之类的光学材料块的弱偏振片的形式。 在这种情况下,优选使用具有接近玻璃的折射率的材料,例如聚合物。 本发明适用于许多不同的光学配置,包括频谱分析,光通信网络和复用设备。 公开了一种拉曼/荧光检测系统,其包括衍射和光谱分散特征波长的光的光栅。 在该实施例中,PDL补偿器优选地被放置在光栅上游的光路(无论是反射还是透射)中,捕获器用于收集不需要的偏振的能量。

    Spectral bandwidth calibration of an optical spectrum analyzer
    7.
    发明申请
    Spectral bandwidth calibration of an optical spectrum analyzer 失效
    光谱分析仪的光谱带宽校准

    公开(公告)号:US20020080353A1

    公开(公告)日:2002-06-27

    申请号:US10000635

    申请日:2001-11-01

    CPC classification number: G01J3/02 G01J3/027 G01J3/28

    Abstract: In an optical spectrum analyzer, the respective wavelength bandwidths of the optical spectrum analyzer are determined at the wavelengths of the reference lines and used as calibration data for determining measurement tolerances by means of reference lines of known wavelength and known wavelength bandwidths from the known wavelength bandwidths of the reference lines and from the wavelength bandwidths of the reference lines measured with the optical spectrum analyzer

    Abstract translation: 在光谱分析仪中,光谱分析仪的波长带宽在参考线的波长处确定,并用作通过已知波长的参考线和已知波长带宽的已知波长带宽确定测量公差的校准数据 的参考线和用光谱分析仪测量的参考线的波长带宽

    Miniaturised spectrometer
    8.
    发明申请
    Miniaturised spectrometer 失效
    小型光谱仪

    公开(公告)号:US20040017567A1

    公开(公告)日:2004-01-29

    申请号:US10169032

    申请日:2003-03-11

    Abstract: The invention concerns a miniaturized spectrometer, especially in the form of a probe, for determination of the ingredients of a gaseous or liquid fluid with a light source (3) and a spectrometer (2), at least one measurement beam and at least one reference beam. The invention is characterized by the fact that the light of the light source (3) is optionally fanned out and bundled by means of at least one optical lens (8) to an essentially parallel beam, that at least one measurement beam is passed through a light transparent window from the probe into the fluid being investigated and through an additional light transparent window back into the probe, that at least one reference beam is guided in the probe interior, that a collecting optics (14), consisting of at least one lens, diverts the beams to the impingement point of the light guide (5) or the inlet of the spectrometer (2), and that a beam selector (7) is provided in the region of the collecting optics (14) that passes through one of the partial beams and interrupts all the others.

    Abstract translation: 本发明涉及一种小型化的光谱仪,特别是探针的形式,用于利用光源(3)和光谱仪(2)测定气体或液体流体的成分,至少一个测量光束和至少一个参考 光束。 本发明的特征在于,光源(3)的光可选地被至少一个光学透镜(8)扇出并捆扎成基本平行的光束,使得至少一个测量光束通过 透明窗口,从探针进入被研究的流体,并通过另外的光透明窗口回到探针中,至少一个参考光束在探测器内部被引导,聚集光学器件(14)由至少一个透镜 将光束转移到光导(5)的入射点或光谱仪(2)的入射点,并且在收集光学器件(14)的区域中设置光束选择器(7),该选择器通过 部分光束和所有其他的中断。

    Method for imaging measurement, imaging measurement device and use of measured information in process control
    9.
    发明申请
    Method for imaging measurement, imaging measurement device and use of measured information in process control 失效
    成像测量方法,成像测量装置以及过程控制中测量信息的使用

    公开(公告)号:US20030038944A1

    公开(公告)日:2003-02-27

    申请号:US10240264

    申请日:2002-09-30

    CPC classification number: G01J5/60

    Abstract: The invention relates to method for imaging measurement of a moving or flowing target and to an imaging measuring device for implementing the aforementioned method. Moreover, the invention relates to the use of information measured by means of imaging measurement in the control and/or adjustment of a process. According to the invention, electromagnetic radiation obtained from the moving or flowing target (T) is focused by means of imaging optics to produce an image to the screen of a two-dimensional matrix detector at least via a first and a second filter (F1, F2) which transmit electromagnetic radiation in manners differing from each other. Said at least first and second filter form on the screen of the detector at least a first and a second filter area (FR1, R2) that partly cover the light-sensitive area (DA) of the detector. The properties of the target (T) are determined spectroscopically by comparing and/or combining spectrally resolved information, which is recorded when a pixel which corresponds to a determined part of the target kto be measured and is focused on the screen (DA) of the matrix detector without beamsplitting travels under the effect of the movement of the target (T) via said at least first and second filter area (FR1, FR2). The area of the screen (DA) of the detector remaining outside siad filter areas (FR1, FR2) is used for other kind of imaging non-spectroscopic measurement and/or visualization of the target.

    Abstract translation: 本发明涉及用于对移动或流动的目标进行成像测量的方法以及用于实现上述方法的成像测量装置。 此外,本发明涉及在过程的控制和/或调整中通过成像测量测量的信息的使用。 根据本发明,通过成像光学器件聚焦从移动或流动的目标(T)获得的电磁辐射,以至少经由第一和第二滤光器(F1,...)产生到二维矩阵检测器的屏幕的图像, F2),其以不同的方式传送电磁辐射。 所述至少第一和第二滤波器形式在检测器的屏幕上至少第一和第二滤波器区域(FR1,R2),其部分地覆盖检测器的感光区域(DA)。 通过比较和/或组合光谱解析信息来确定目标(T)的属性,该信息是当与要测量的目标k的确定部分相对应并且聚焦在目标k的确定部分上的像素聚焦在 矩阵检测器,不经过所述至少第一和第二滤波器区域(FR1,FR2)在目标(T)的运动的作用下行走。 剩余在锡拉德过滤区域(FR1,FR2)外的检测器的屏幕面积(DA)用于其他类型的成像非光谱测量和/或目标可视化。

    Convolution method for measuring laser bandwidth
    10.
    发明申请
    Convolution method for measuring laser bandwidth 有权
    用于测量激光器带宽的卷积方法

    公开(公告)号:US20020122176A1

    公开(公告)日:2002-09-05

    申请号:US09931726

    申请日:2001-08-16

    Abstract: A simple, reliable, easy to use method for calculating bandwidth data of very narrow band laser beams based on bandwidth data obtained with a spectrometer in circumstances where the laser bandwidths are not large compared to the slit function of the spectrometer. The slit function of the spectrometer is determined. Spectral data of the laser beam is measured with the spectrometer to produce a measured laser beam spectrum which represents a convolution of the laser beam spectrum and the spectrometer slit function. This measured laser spectrum is then mathematically convolved with the slit function of the spectrometer to produce a doubly convolved spectrum. Bandwidth values representing true laser bandwidths are determined from measured laser spectrum and the doubly convolved spectrum. Preferably the true laser bandwidths are calculated by determining the difference between nulltwice a measured laser bandwidthnull and a corresponding nulldoubly convolved bandwidthnull. This method provides an excellent estimate of the true laser bandwidth because nulltwice the measured laser bandwidthnull represents two laser bandwidths and two spectrometer slit function bandwidths and the nulldoubly convolved bandwidthnull represents one laser bandwidth and two spectrometer slit function bandwidths. Thus, the difference is a representation of the true laser bandwidth. In a preferred embodiment the bandwidth parameters measured are the full width half-maximum bandwidth and the 95% integral bandwidth.

    Abstract translation: 基于在与光谱仪的狭缝功能相比激光带宽不大的情况下,利用光谱仪获得的带宽数据,计算非常窄带激光束的带宽数据的简单,可靠,易于使用的方法。 确定光谱仪的狭缝功能。 使用光谱仪测量激光束的光谱数据,以产生测量的激光束光谱,其表示激光束光谱和光谱仪狭缝功能的卷积。 然后将该测量的激光光谱与光谱仪的狭缝函数进行数学卷积以产生双卷积光谱。 表示真实激光带宽的带宽值由测量的激光光谱和双卷积光谱确定。 优选地,通过确定“两次测量的激光器带宽”和相应的“双卷积带宽”之间的差异来计算真实的激光器带宽。 该方法提供了真正的激光器带宽的极好估计,因为“两倍测量激光带宽”代表两个激光带宽和两个光谱仪狭缝功能带宽,“双卷积带宽”代表一个激光带宽和两个光谱仪狭缝功能带宽。 因此,不同之处在于真正的激光带宽的表示。 在优选实施例中,测量的带宽参数是全宽度半最大带宽和95%积分带宽。

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