摘要:
A semiconductor device such as an ID chip of the present invention includes an integrated circuit using a semiconductor element formed by using a thin semiconductor film, and an antenna connected to the integrated circuit. It is preferable that the antenna is formed integrally with the integrated circuit, since the mechanical strength of an ID chip can be enhanced. Note that the antenna used in the present invention also includes a conducting wire that is wound round circularly or spirally and fine particles of a soft magnetic material are arranged between the conducting wires. Specifically, an insulating layer in which fine particles of a soft magnetic material are arranged between the conducting wires. Specifically, an insulating layer in which fine particles of a soft magnetic material are included is arranged between the conducting wires.
摘要:
A semiconductor device such as an ID chip of the present invention includes an integrated circuit using a semiconductor element formed by using a thin semiconductor film, and an antenna connected to the integrated circuit. It is preferable that the antenna is formed integrally with the integrated circuit, since the mechanical strength of an ID chip can be enhanced. Note that the antenna used in the present invention also includes a conducting wire that is wound round circularly or spirally and fine particles of a soft magnetic material are arranged between the conducting wires. Specifically, an insulating layer in which fine particles of a soft magnetic material are arranged between the conducting wires. Specifically, an insulating layer in which fine particles of a soft magnetic material are included is arranged between the conducting wires.
摘要:
An electro-optically active organic diode, for example an organic light emitting diode (OLED), comprises an anode electrode (102), a cathode electrode (122) and an electro-optically active organic layer (110) arranged in-between. A cover layer (124) is arranged in contact with a surface of the cathode layer (122) so that the cathode layer (122) is positioned between the organic layer (110) and the cover layer (124), which is formed of a substantially inert material with respect to a cathode layer (122) material in contact with said cover layer (124). The inert material is deposited on said surface of the cathode layer (122) so that the complete surface is covered and surface defects eliminated. A short protection layer (120) is further arranged between said cathode electrode (122) and said electro-optically active organic layer (110), and adjacent to said cathode electrode (122), and is formed of an inorganic semiconductor material. The cover layer (124) and the short protection layer (120) together reduce the risk of shorts to occur between the cathode (122) and the anode (102) and thus increase reliability of the electro-optically active organic diode.
摘要:
Thin film bulk acoustic wave sensors with coatings of biological and chemical materials, multiple electrode depositions and a piezo-active thin film transducer layer are hosted on a substrate. The thin film bulk acoustic wave sensor suite, or T-BASS, produces a low-voltage, IC-compliant thickness-directed electric field that is substantially uniform over a substantial portion of the active area of the BAW structure. The BAWs produced are essentially extensional plane waves propagating away from the substrate surface and having phase progression substantially oblique to the substrate surface. For BAW applications requiring sensing by an active layer, it would be most desirable to have an electrode structure that is both IC-compliant and can be energized from a low-voltage source of electrical energy. The thin film BAW sensors are compatible with IC fabrication and processing techniques, such as photolithography. Both single channel and multiple channel thin film bulk acoustic wave sensors are provided.
摘要:
A method for forming a residue free patterned polysilicon layer upon a high step height patterned substrate layer. First, there is provided a semiconductor substrate having formed thereon a high step height patterned substrate layer. Formed upon the high step height patterned substrate layer is a polysilicon layer, and formed upon the polysilicon layer is a patterned photoresist layer. The patterned photoresist layer exposes portions of the polysilicon layer at a lower step level of the high step height patterned substrate layer. The polysilicon layer is then patterned through the patterned photoresist layer as an etch mask employing an anisotropic first etch process to yield a patterned polysilicon layer upon the surface of the high step height patterned substrate layer and polysilicon residues at the lower step level of the high step height patterned substrate layer. The anisotropic first etch process is a Reactive Ion Etch (RIE) anisotropic first etch process which simultaneously passivates the exposed sidewall edges of the patterned polysilicon layer. Finally, the polysilicon residues formed at the lower step level of the high step height patterned substrate layer are removed through an isotropic second etch process. The isotropic second etch process is a Reactive Ion Etch (RIE) isotropic second etch process which employs hydrogen bromide (HBr) and sulfur hexafluoride (SF6) as the reactant gases.
摘要:
A highly planarized integrated circuit structure having at least one bipolar device is described as well as a method of making the structure. The structure comprises a substrate having a field oxide grown thereon with openings defined therein respectively for formation of a collector contact region and a base/emitter region for a bipolar device in the substrate. All of the contacts of the bipolar device are formed using polysilicon which fills the defined openings in the field oxide resulting in a highly planarized structure.