Scalable thermoelectric-based infrared detector

    公开(公告)号:US10903262B2

    公开(公告)日:2021-01-26

    申请号:US16517653

    申请日:2019-07-21

    摘要: Device and method of forming the device are disclosed. The method includes providing a substrate prepared with a complementary metal oxide semiconductor (CMOS) region and a sensor region. A substrate cavity is formed in the substrate in the sensor region, the substrate cavity including cavity sidewalls and cavity bottom surface and a membrane which serves as a substrate cavity top surface. The cavity bottom surface includes a reflector. The method also includes forming CMOS devices in the CMOS region, forming a micro-electrical mechanical system (MEMS) component on the membrane, and forming a back-end-of-line (BEOL) dielectric disposed on the substrate having a plurality of interlayer dielectric (ILD) layers. The BEOL dielectric includes an opening to expose the MEMS component. The opening forms a BEOL cavity above the MEMS component.

    THERMAL PILE SENSING STRUCTURE INTEGRATED WITH CAPACITOR

    公开(公告)号:US20170138795A1

    公开(公告)日:2017-05-18

    申请号:US15249214

    申请日:2016-08-26

    IPC分类号: G01J5/16

    CPC分类号: G01J5/16 G01J5/024 G01J5/12

    摘要: The present invention discloses a thermal pile sensing structure integrated with one or more capacitors, which includes: a substrate, an infrared sensing unit and a partition structure. The infrared sensing unit includes a first and a second sensing structure. A hot junction is formed between the first and the second sensing structures at a location where the first and the second sensing structures are close to each other. A cold junction is formed between the partition structure and the first sensing structure at a location where these two structures are close to each other. Another cold junction is formed between the partition structure and the second sensing structure at a location where these two structures are close to each other. A temperature difference between the hot junction and the cold junction generates a voltage difference signal. Apart of the partition structure forms at least one capacitor.

    Infrared detection element, infrared detector, and infrared type gas sensor

    公开(公告)号:US09494467B2

    公开(公告)日:2016-11-15

    申请号:US14761807

    申请日:2014-01-20

    摘要: An infrared detection element includes first and second pyroelectric elements which are arranged in a single pyroelectric substrate. First pyroelectric element includes a first surface electrode, a first back face electrode, and a first portion interposed between first surface and back face electrodes. First portion is provided as part of pyroelectric substrate. Second pyroelectric element includes a second surface electrode, a second back face electrode, and a second portion interposed between second surface and back face electrodes. Second portion is provided as part of pyroelectric substrate. Pyroelectric substrate is provided in part thereof surrounding first pyroelectric element with a slit shaped along an outer periphery of first pyroelectric element. Slit is formed out of regions in which a first surface wiring and a first back face wiring are disposed. Part of pyroelectric substrate surrounding second pyroelectric element is continuously formed over an entire circumference of second portion.

    Sensor Element
    9.
    发明申请
    Sensor Element 有权
    传感器元件

    公开(公告)号:US20070297485A1

    公开(公告)日:2007-12-27

    申请号:US11570305

    申请日:2005-06-08

    IPC分类号: G01J5/16

    CPC分类号: G01J5/16 G01J5/06

    摘要: A sensor element (10) for detecting electromagnetic radiation, particularly in the infrared range, comprises one or more heat-sensitive portions (4a, 4b) provided on a substrate (1-3) and one or more influencing layers (5a, 5b) for influencing the absorption and/or reflection of the electromagnetic radiation to be detected. The heat-sensitive portion(s) and/or the influencing layers are arranged on the substrate in accordance with the thermal properties of the influencing layers, preferably asymmetrically.

    摘要翻译: 用于检测特别是红外范围的电磁辐射的传感器元件(10)包括一个或多个设置在基板(1-3)上的热敏部分(4a,4b)和一个或多个影响层(5a) ,5b)用于影响待检测的电磁辐射的吸收和/或反射。 热敏部分和/或影响层根据影响层的热性质优选不对称地布置在基底上。

    Infrared detecting element, method of manufacturing the same and temperature measuring device
    10.
    发明授权
    Infrared detecting element, method of manufacturing the same and temperature measuring device 失效
    红外线检测元件及其制造方法及温度测量装置

    公开(公告)号:US06909093B2

    公开(公告)日:2005-06-21

    申请号:US10258641

    申请日:2002-01-31

    CPC分类号: G01J5/16

    摘要: To provide a thermopile infrared detecting element capable of accurate temperature measurement at low cost. An infrared detecting element 1 using a silicon nitride film as a first structure layer 22 constituting a structure of a membrane portion 4 is provided. Unlike silicon oxide, the first structure layer 22 has internal stress in the tensile direction, and can thus prevent the occurrence of bending. Also, diodes D1 and D2 can be formed in a silicon substrate 2 by using the first structure layer 22 as an element isolation region, and thus deformation of a thermopile 12 due to a change in the environment can be prevented to suppress measurement error of the thermopile 12. Furthermore, a high accuracy infrared detecting element capable of accurately detecting the temperature of cold junctions using the diodes D1 and D2 can be provided.

    摘要翻译: 提供能够以低成本进行精确的温度测量的热电堆红外线检测元件。 提供了使用氮化硅膜作为构成膜部4的结构的第一结构层22的红外线检测元件1。 与氧化硅不同,第一结构层22在拉伸方向具有内应力,因此可以防止弯曲的发生。 此外,通过使用第一结构层22作为元件隔离区域,也可以在硅衬底2中形成二极管D1和D2,从而可以防止由于环境变化导致的热电堆12的变形,从而抑制测量误差 的热电堆12。 此外,可以提供能够精确地检测使用二极管D1和D2的冷接点的温度的高精度红外线检测元件。