Abstract:
According to a technique for determining delays through multi-stage datapath elements, estimates of the delays through each stage of the datapath element are computed in accordance with an equation such as: Ds=DbNb+C; where Ds is the estimated stage delay, Db is a delay associated with communication between bits in the stage, Nb is the number of bits in the datapath element, and C is a constant. The estimated stage delays are used to determine positions of pipelining stages in the datapath element.
Abstract:
A randomizer system (10) generates an undeterministic data block using standard cell library units and includes a random number generator (20). The generator includes at least two metastable blocks that each include a plurality of D-type flip-flops. Each flip-flop is coupled to a dedicated free-running oscillator and common jitter clock. The flip-flops are thus forcibly operated in a metastable state by intentionally violating the flip-flop set-up or hold time margins of incoming data related to the jitter clock. The flip-flop outputs are exclusively "OR"d and then passed through first and second shift registers of uneven and preferably even and odd bit lengths. The input from each shift register is then EX-OR'd and clocked out with a system clock to provide first and second channels of undeterministic data.
Abstract:
Lead systems of the subject invention include "coplanar leads" (12C) and "aplanar leads" (12A), which differ in structure at the inner bond finger. Coplanar leads (12C) are generally planar along the lead body (12) and the inner bond finger. Aplanar leads (12A) are bent or deformed at the inner bond finger, such that the inner bond finger terminus is not in the plane of the lead body (12) but instead is above or below the plane of the lead body. Deforming select inner bond fingers out of the general plane of the lead system provides a spatial separation for the bonding wires (22) which are attached to the inner bond fingers. This spatial separation acts to minimize wire crossing and shorting during fill processes and results in improved semiconductor package yield.
Abstract:
A digital-analog converter incorporates an array of current source cells connected at the output to a load as a function of an input code subdivided into respectively H and V, most significant bit (MSB) and least significant bit (LSB), converted into thermometric codes, respectively HT and VT, whose logic inverses are respectively horizontally and vertically routed to said array. Each position cell (h, v) comprises a first and a second P type metal oxide semiconductor field effect transistor in series, in parallel with at least one third P type metal oxide semiconductor field effect transistor.
Abstract:
An arithmetic logic unit (ALU) provides for zero-result prediction so as to eliminate the latency between sucessive operations (e.g., multiplication and division) when a zero detection is a condition for performance of the second operation. Instead of performing zero detection on the result, zero prediction is performed on the initial or intermediate operands, (e.g., partial products that are summed to generate a product). To this end, zero-prediction logic (ZP) determines whether or not both of the following conditions are met: 1) either the least significant bits of the addends are the same and the carry-in is zero or the least significant bits of the addends are different and the carry-in is one; 2) for each pair of adjacent bit positions, the four included bits are consistent with addend complementarity. If both conditions are met, a zero result is predicted; otherwise, a non-zero result is predicted.
Abstract:
The punchthrough capacity of a p-type semiconductor device is significantly improved by nonuniformly doping the p-channel with n-type implants such as phosphorus. The n-type dopants are implanted at large angles to form pocket implants within the channel region. The dose of the implants, angle of the implants and the thermal cycle annealing of the implants will be optimized for maximum punchthrough capability without substantially detracting from the performance of the semiconductor device.
Abstract:
A method determines approximate propagation delay through logic cells (30, 31) within a library. Each logic cell (30) within the library is characterized at baseline conditions to obtain parameters for each logic cell (30) which define propagation delay through each logic cell (30) at the baseline conditions. A subset of the logic cells (30) are characterized at conditions varying from the baseline conditions to obtain scaling parameters. The scaling parameters modify values of the parameters for all logic cells (30) within the library in order to approximate changes in propagation delay through each logic cell (30) resulting from changes in the baseline conditions. In the preferred embodiment, the conditions varying from the baseline conditions includes a change in at least one of operating temperature, power supply voltage and process conditions.
Abstract:
An image is written to a data frame buffer (18) for display by a monitor (19). The image includes a repeated pattern. The present invention uses a repeated pattern cache (22) which is not large enough to simultaneously contain an entire repeated pattern. When writing a pixel of the image, a horizontal pattern offset and a vertical pattern offset for a destination location of the pixel are determined. If a scan line for the repeated pattern which corresponds to the vertical pattern offset does not reside in the repeated pattern cache (22), the scan line for the repeated pattern which corresponds to the vertical pattern offset is fetched into the repeated pattern cache (22). When the scan line for the repeated pattern which corresponds to the vertical pattern offset resides in the repeated pattern cache (22), the pixel is accessed at a location in the repeated pattern cache (22) at a location which corresponds to the horizontal pattern offset. The accessed pixel is written to the buffer (18).
Abstract:
A flip-flop has both a system output (55, 95, 145) and a scan output (56, 96, 146). A system output signal for the flip-flop is placed on the system output (55, 95, 145). When the flip-flop is in a normal operating mode, a scan output signal on the scan output (56, 96, 146) is held at a static logic level. When the flip-flop is in a scan mode, the scan output signal on the scan output (56, 96, 146) transitions between logic 1 and logic 0 synchronous with transitions of the system output signal on the system output (55, 95, 145).
Abstract:
The present invention provides a low-cost computer system which includes a single shared memory that can be independently accessible as graphics memory or main store system memory without performance degradation. Because the "appetite" for main system memory (unlike that of a display memory) is difficult to satisfy, the memory granularity problem can be addressed by programmably reallocating an unused portion of a display memory for system memory use. Reallocation of the unused display memory alleviates any need to oversize the display memory, yet realizes the cost effectiveness of using readily available memory sizes. Further, reallocation of the graphics memory avoids any need to separately consider both the system memory and the display memory in accommodating worst case operational requirements.