IMAGING METHOD, APPARATUS AND SYSTEM HAVING EXTENDED DEPTH OF FIELD
    1.
    发明申请
    IMAGING METHOD, APPARATUS AND SYSTEM HAVING EXTENDED DEPTH OF FIELD 审中-公开
    成像方法,装置和系统具有扩大的场深度

    公开(公告)号:WO2008042137A2

    公开(公告)日:2008-04-10

    申请号:PCT/US2007/020575

    申请日:2007-09-24

    Abstract: Various exemplary embodiments of the invention provide an extended depth of field. One embodiment provides an image restoration procedure, comprising determining sample point pixels from a pixel array based upon a distance of an object being imaged to the pixel array, and reading intensities of the sample point pixels into a memory. Another embodiment provides an image capture procedure comprising capturing light rays on a pixel array of an imaging sensor, wherein specific sampling point pixels are selected to be evaluated based on spread of an image spot across a based on spread of an image spot across the plurality of pixels of the pixel array plurality of pixels of the pixel array.

    Abstract translation: 本发明的各种示例性实施例提供了扩展的景深。 一个实施例提供了一种图像恢复过程,包括基于成像到像素阵列的对象的距离来确定来自像素阵列的采样点像素,并且将采样点像素的强度读取到存储器中。 另一个实施例提供了一种图像捕获过程,包括捕获成像传感器的像素阵列上的光线,其中选择特定的采样点像素以基于图像点跨越多个像素 像素阵列的像素阵列多个像素的像素。

    HIGH RESOLUTION SPECTRAL MEASUREMENT DEVICE
    2.
    发明申请
    HIGH RESOLUTION SPECTRAL MEASUREMENT DEVICE 审中-公开
    高分辨率光谱测量装置

    公开(公告)号:WO2003078940A2

    公开(公告)日:2003-09-25

    申请号:PCT/US2003/002052

    申请日:2003-01-15

    IPC: G01J

    Abstract: A high resolution spectral measurement device. A preferred embodiment presents an extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow-band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser and the diffused light exiting the diffuser illuminates an etalon. A portion of its light exiting the etalon is collected and directed into a slit positioned at a fringe pattern of the etalon. Light passing through the slit is collimated and the collimated light illuminates a grating positioned in an approximately Littrow configuration which disburses the light according to wavelength. A portion of the dispursed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit and monitored by a light detector. When the etalon and the grating are tuned to the same precise wavelength a slit function is defined which is extremely narrow such as about 0.034pm (FWHM) and about 0.091pm (95 percent integral). The bandwidth of a laser beam can be measured very accurately by a directing portion of the laser beam into the insulator and scanning the laser wavelength over a range which includes the monochromator slit wavelength. In a second embodiment the second slit and the light detector is replaced by a photodiode array and the bandwidth of a laser beam is determined by analyzing a set of scan data from the photodiode array. Alternately, the laser wavelength can be fixed near the middle of the spectrum range of the grating spectrometer, and the etalon can be scanned.

    Abstract translation: 高分辨率光谱测量装置。 优选的实施例在紫外线范围内呈现非常窄的狭缝功能,并且对于测量用于集成电路光刻的窄带准分子激光器的带宽是非常有用的。 来自激光器的光聚焦成漫射器,离散扩散器的散射光照射标准具。 将其从标准具出射的光的一部分收集并引导到位于标准具的边缘图案处的狭缝中。 通过狭缝的光线被准直,并且准直光照射位于大约Littrow配置中的光栅,其根据波长散发光。 表示对应于所选择的标准具条纹的波长的调度光​​的一部分通过第二狭缝并由光检测器监视。 当标准具和光栅调谐到相同的精确波长时,定义了狭缝功能,其极窄,例如约0.034pm(FWHM)和约0.091μm(95%积分)。 通过激光束的引导部分进入绝缘体并且在包括单色器狭缝波长的范围内扫描激光波长,可以非常精确地测量激光束的带宽。 在第二实施例中,第二狭缝和光检测器被光电二极管阵列代替,并且通过分析来自光电二极管阵列的一组扫描数据来确定激光束的带宽。 或者,激光波长可以固定在光栅光谱仪的光谱范围附近,可以扫描标准具。

    FUSED MULTI-ARRAY COLOR IMAGE SENSOR
    5.
    发明申请
    FUSED MULTI-ARRAY COLOR IMAGE SENSOR 审中-公开
    融合多阵列彩色图像传感器

    公开(公告)号:WO2007103212A1

    公开(公告)日:2007-09-13

    申请号:PCT/US2007/005439

    申请日:2007-03-02

    CPC classification number: H04N9/093 H01L27/14621 H01L27/14623 H04N5/3415

    Abstract: The invention, in various exemplary embodiments, incorporates multiple image sensor arrays, with separate respective color filters, on the same imager die. One exemplary embodiment is an image sensor comprising a plurality of arrays of pixel cells at a surface of a substrate, wherein each pixel cell comprises a photo-conversion device. The arrays are configured to commonly capture an image. An image processor circuit is connected to said plurality of arrays and configured to combine the captured images, captured by the plurality of arrays, and output a color image.

    Abstract translation: 在各种示例性实施例中,本发明在相同的成像器模具上并入多个图像传感器阵列以及单独的各自的滤色器。 一个示例性实施例是包括在衬底的表面处的多个像素单元阵列的图像传感器,其中每个像素单元包括光转换器件。 阵列被配置为通常捕获图像。 图像处理器电路连接到所述多个阵列并且被配置为组合由多个阵列捕获的所捕获的图像,并输出彩色图像。

    HIGH RESOLUTION SPECTRAL MEASUREMENT DEVICE
    6.
    发明申请

    公开(公告)号:WO2003078940A3

    公开(公告)日:2003-09-25

    申请号:PCT/US2003/002052

    申请日:2003-01-15

    Abstract: A high resolution spectral measurement device. A preferred embodiment presents an extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow-band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser (D) and the diffused light exiting the diffuser (D) illuminates an etalon (ET). A portion of its light exiting the etalon (ET) is collected and directed into a slit (S1) positioned at a fringe pattern of the etalon (ET). Light passing through the slit (S1) is collimated and the collimated light illuminates a grating (GR1) positioned in an approximately Littrow configuration which disperses the light according to wavelength. A portion of the dispersed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit and monitored by a light detector. When the etalon (ET) and the grating (GR1) are tuned to the same precise wavelength a slit function is defined which is extremely narrow such as about 0.034pm (FWHM) and about 0.091pm (95 percent integral). The bandwidth of a laser beam can be measured very accurately by a directing portion of the laser beam into the insulator and scanning the laser wavelength over a range which includes the monochromator slit wavelength. In a second embodiment the second slit and the light detector is replaced by a photodiode array (PDA) and the bandwidth of a laser beam is determined by analyzing a set of scan data from the photodiode array (PDA). Alternately, the laser wavelength can be fixed near the middle of the spectrum range of the grating spectrometer (50), and the etalon (ET) can be scanned.

    DEEP ULTRAVIOLET CATADIOPTRIC ANAMORPHIC TELESCOPE
    7.
    发明申请
    DEEP ULTRAVIOLET CATADIOPTRIC ANAMORPHIC TELESCOPE 审中-公开
    深层超声波非线性非线性电缆

    公开(公告)号:WO2001039337A1

    公开(公告)日:2001-05-31

    申请号:PCT/US2000/031323

    申请日:2000-11-15

    Inventor: SMITH, Scott, T.

    Abstract: A catadioptric anamorphic beam expanding telescope (2A, 2B) expands a beam in a first axis substantially perpendicular to the beam propagation axis, and deflects it in a plane substantially perpendicular to the first axis. The beam expanding telescope (2A, 2B) can include reflective, refractive, and combined reflective/refractive elements. An embodiment includes an off axis convex spheric reflector (205) and off axis combined reflective/refractive optical element, commonly known as a Mangin mirror (206), incorporating a refractive first surface and a reflective rear surface, which compensate for aberrations introduced by the off axis deflection of the beam. The telescope is particularly useful for deep ultraviolet (DUV) applications at wavelengths shorter than about 250 nm.

    Abstract translation: 反射折射变形光束扩展望远镜(2A,2B)在基本上垂直于光束传播轴线的第一轴线上扩展光束,并使其在基本上垂直于第一轴线的平面中偏转。 扩束望远镜(2A,2B)可以包括反射,折射和组合的反射/折射元件。 一个实施例包括离轴凸球面反射器(205)和离轴组合的反射/折射光学元件,通常称为Mangin镜(206),其包括折射第一表面和反射后表面,其补偿由 梁的偏轴偏转。 望远镜特别适用于波长短于约250 nm的深紫外(DUV)应用。

    IMAGING METHOD, APPARATUS AND SYSTEM HAVING EXTENDED DEPTH OF FIELD
    8.
    发明申请
    IMAGING METHOD, APPARATUS AND SYSTEM HAVING EXTENDED DEPTH OF FIELD 审中-公开
    成像方法,具有扩展深度的装置和系统

    公开(公告)号:WO2008042137A3

    公开(公告)日:2008-06-19

    申请号:PCT/US2007020575

    申请日:2007-09-24

    Abstract: Various exemplary embodiments of the invention provide an extended depth of field. One embodiment provides an image restoration procedure, comprising determining sample point pixels from a pixel array based upon a distance of an object being imaged to the pixel array, and reading intensities of the sample point pixels into a memory. Another embodiment provides an image capture procedure comprising capturing light rays on a pixel array of an imaging sensor, wherein specific sampling point pixels are selected to be evaluated based on spread of an image spot across a based on spread of an image spot across the plurality of pixels of the pixel array plurality of pixels of the pixel array.

    Abstract translation: 本发明的各种示例性实施例提供了扩展的景深。 一个实施例提供一种图像恢复过程,其包括基于被成像对象到像素阵列的距离,以及将采​​样点像素的强度读取到存储器中,从像素阵列确定采样点像素。 另一个实施例提供了一种图像捕获程序,其包括在成像传感器的像素阵列上捕获光线,其中,基于图像点跨越多个图像点的扩展,基于图像点的扩展来选择特定采样点像素 像素阵列的像素阵列的像素阵列的多个像素。

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