Abstract:
A spectral feature of a pulsed light beam produced by an optical source is controlled by a method. The method includes producing a pulsed light beam at a pulse repetition rate; directing the pulsed light beam toward a substrate received in a lithography exposure apparatus to expose the substrate to the pulsed light beam; modifying a pulse repetition rate of the pulsed light beam as it is exposing the substrate. The method includes determining an amount of adjustment to a spectral feature of the pulsed light beam, the adjustment amount compensating for a variation in the spectral feature of the pulsed light beam that correlates to the modification of the pulse repetition rate of the pulsed light beam. The method includes changing the spectral feature of the poised light beam by the determined adjustment amount as the substrate is exposed to thereby compensate for the variation in the spectral feature.
Abstract:
Online calibration of laser performance as a function of the repetition rate at which the laser is operated is disclosed. The calibration can be periodic and carried out during a scheduled during a non-exposure period. Various criteria can be used to automatically select the repetition rates that result in reliable in-spec performance. The reliable values of repetition rates are then made available to the scanner as allowed values and the laser/scanner system is then permitted to use those allowed repetition rates.
Abstract:
A lithography system includes an optical source configured to emit a pulsed light beam; a lithography apparatus including an optical system, the optical system being positioned to receive the pulsed light beam from the optical source at a first side of the optical system and to emit the pulsed light beam at a second side of the optical system; and a control system coupled to the optical source and the optical lithography apparatus, the control system configured to: receive an indication of an amount of energy in the pulsed light beam at the second side of the optical system, determine an energy error, access art initial control sequence, the initial control sequence being associated with the optical source, determine a second control sequence based on the determined energy error and the initial control sequence, and apply the second control sequence to the optical source.
Abstract:
Ein Beleuchtungssystem einer lithographischen Projektionsbelichtungsanlage (12) umfasst eine Lichtquelle (LS; LS 1, LS 2), die zur Erzeugung einer Abfolge von Lichtpulsen (42-1 bis 42-3; 42-1, 42-2, 52-1, 52-2) eingerichtet ist. Ferner umfasst das Beleuchtungssystem ein Array (28) von optischen Elementen (32), die zwischen zwei Schaltstellungen digital umschaltbar sind. Eine Steuereinrichtung (34) steuert die optischen Elemente (32) so an, dass sie nur zwischen zwei aufeinander folgenden Lichtpulsen ihre Schaltstellung ändern und während der Lichtpulse ihre Schaltstellung beibehalten.
Abstract translation:光刻投射曝光设备(12)的一种照明系统,包括光源(LS; LS 1,LS 2)(用于产生光脉冲的42-1到42-3的序列; 52-1 42-1,42-2,52 -2)被设置。 此外,该照明系统包括光学元件(32),其被两个切换位置之间切换的数字的阵列(28)。 控制器(34)控制所述光学元件(32)以这样的方式使得它们仅改变两个连续的光脉冲和光脉冲之间它们的开关位置,同时保持他们的切换位置。
Abstract:
The invention concerns a device (10) for generating an output radiation through an output aperture (5), said device (10) comprising a plurality of radiation sources (11-14) and a temporal multiplexer (15) for temporally- multiplexing the radiation sources (11-14). Each radiation source comprises a plasma (211) in which an elementary radiation is generated and in which rays of this elementary radiation are selectively deviated as a function of their wavelength. Such sources have a small size and a small etendue. The device can comprise for example one hundred or more radiation sources. Each radiation source can be used to generate a dynamically modified radiation pattern (24, 25, 26), or as a reserve source that replaces a broken down source, or as a supportive source that generates a radiation only if the power of the output radiation is lower than a minimum threshold value. The invention also relates to a process implemented by said device, and to a photolithography apparatus comprising said device.
Abstract:
A gas discharge laser system bandwidth control mechanism and method of operation for controlling bandwidth in a laser output light pulse generated in the gas discharge laser system is disclosed which may comprise a bandwidth controller which may comprise an active bandwidth adjustment mechanism; a controller actively controlling the active bandwidth adjustment mechanism utilizing an algorithm implementing bandwidth thermal transient correction based upon a model of the impact of laser system operation on the wavefront of the laser light pulse being generated and line narrowed in the laser system as it is incident on the bandwidth adjustment mechanism. The controller algorithm may comprises a function of the power deposition history in at least a portion of an optical train of the gas discharge laser system, e.g., a linear function, e.g., a combination of a plurality of decay functions each comprising a respective decay time constant and a respective coefficient.