摘要:
A method of forming a wafer level packaged circuit device includes forming a device wafer, the device wafer including a first group of one or more material layers left remaining in a first region of a substrate of the device wafer; and forming a cap wafer configured to be attached to the device wafer, the cap wafer including a second group of one or more material layers left remaining in a second region of a substrate of the cap wafer; wherein a combined thickness of the first and second groups of one or more material layers defines an integrated bond gap control structure upon bonding of the device wafer and the cap wafer.
摘要:
Imaging and ALPD device and method of use is disclosed. A detector (104) generates an electrical signal in response to receiving an optical signal (115), wherein a frequency of the electrical signal is indicative of a frequency of the optical signal. A first detection/readout circuit (ROIC1) is sensitive to a first frequency range, and a second detection/readout circuit (ROIC2) is sensitive to a second frequency range. The first detection/readout circuit allows the electrical signal to pass from the first detection/readout circuit to the second detection/readout circuit.
摘要:
A microelectromechanical systems (MEMS) package includes a substrate extending between a first pair of outer edges to define a length and a second pair of outer edges to define a width. A seal ring assembly is disposed on the substrate and includes at least one seal ring creating a first boundary point adjacent to at least one MEMS device and a second boundary point adjacent at least one of the outer edges. The package further includes a window lid on the seal ring assembly to define a seal gap containing the at least one MEMS device. The seal ring assembly anchors the window lid to the substrate at the second boundary point such that deflection of the window lid into the seal gap is reduced.
摘要:
A receiver chip for use in an imaging system includes a plurality of receiver dies, each of the receiver dies comprising one or more receiver circuits; a die interconnection layer located on top of the plurality of receiver dies; a quarter wave dielectric layer located on top of the die interconnection layer; and a plurality of antennae located on the quarter wave dielectric layer, each of the plurality of antennae corresponding to a respective receiver circuit, wherein the plurality of antennae are connected to the one or more receiver circuits through the quarter wave dielectric layer and the die interconnection layer by respective vias, such that a distance between a topmost layer of the die interconnection layer and the plurality of antennae is determined by a thickness of the quarter wave dielectric layer.
摘要:
A radiation detector (10) has a base (30), a frame (48), a window (46), and solder layers (50,52) formed from a solder pre-form to define a vacuum chamber (56). Feedthroughs (18,40,44) penetrate the base (30) for electrical connection to internal components. A method for sealing the detector aligns a lower detector assembly (62), the frame (48), the window (46), and the solder pre-forms (58,60) in a non-sealed relation within a processing chamber (80,94). High temperature and low pressure is imposed, and the getter (42) is activated by resistive heating imposed by current leads. The window (46), frame (48), and lower detector assembly (62) are then pressed together and sealed by the liquefied solder pre-forms (58,60). The method eliminates the need for a seal port, combines several steps within the processing chamber, and eliminates certain prior art cleaning steps.