Abstract:
A pattern forming method includes coating, on a wafer W, a negative resist 3 and a positive resist 4 which has a higher sensitivity; exposing the positive resist 4 and the negative resist 3 on the wafer W with an image of a line-and-space pattern; and developing the positive resist 4 and the negative resist 3 in a direction parallel to a normal line of a surface of the wafer W. A fine pattern, which exceeds the resolution limit of an exposure apparatus, can be formed by using the lithography process without performing the overlay exposure.
Abstract:
The present invention is directed to methods for coating monolayer films of surface-active polymers onto substrates of arbitrary shape. The present invention also provides molecular-based methods and processes that can be used to control the chemical and physical nature of surfaces and interfaces. The present invention is directed to methods for modifying a substrate having a surface comprising coating a macromolecular surfactant comprising modifiable functional group onto the surface, wherein the modifiable functional group assembles to the air-coating interface, thereby modifying the surface of the substrate; wherein if the substrate comprises a first polymer and the macromolecular surfactant comprises a second polymer having a modifiable functional group, then the group is not modifiable by an acid to functionally modify the surface of the substrate. The invention is directed to devices made by these methods.
Abstract:
The present invention is directed to methods for coating monolayer films of surface-active polymers onto substrates of arbitrary shape. The present invention also provides molecular-based methods and processes that can be used to control the chemical and physical nature of surfaces and interfaces. The present invention is directed to methods for modifying a substrate having a surface comprising coating a macromolecular surfactant comprising modifiable functional group onto the surface, wherein the modifiable functional group assembles to the air-coating interface, thereby modifying the surface of the substrate; wherein if the substrate comprises a first polymer and the macromolecular surfactant comprises a second polymer having a modifiable functional group, then the group is not modifiable by an acid to functionally modify the surface of the substrate. The invention is directed to devices made by these methods.
Abstract:
This invention relates to biomaterials, biocompatible photoresists, and electroactive photoresists, and methods to engineer the interactions between biomaterials and cells. In one aspect, this invention provides for modifying surface topography through micro-patterning techniques that require no organic solvent development to reveal the lithographic patterns. Cells can be cultured on these surfaces directly and exhibit strong cell alignment features.
Abstract:
A method of reducing undesired topographic features, increasing film density, and/or increasing adhesion to an underlying substrate in a polymer film formed on a microelectronic substrate, comprises: (a) providing a microelectronic substrate, the substrate having a polymer film deposited thereon; (b) contacting the substrate to carbon dioxide (optionally containing additional ingredients such as cosolvents or chemical intermediates); and (c) elevating the pressure of the carbon dioxide to plasticize the polymer film and reduce undesired topographic features, increase film density, and/or increase adhesion of the film to the underlying substrate.
Abstract:
A double exposure process is disclosed whereby a first exposure produced by conventional photolithograpic techniques generates a latent negative image in a photoresist etch mask layer (22), the image subsequently employed to modulate a second exposure generated by the multiple beam interferometric lithography technique. Periodic surface relief structures (80) patterned by the second exposure and formed after development of the exposed photoresist material, are restricted to regions (52) defined by the initial exposure, with the photoresist material (54) outside these regions remaining unmodulated, or devoid of the periodic structures (80), and suitable for use as a mask in a subsequent etching process.
Abstract:
A method of forming an integrated circuit layer material is described, comprising depositing a layer of templates on a substrate, said template including a first binding site having an affinity for the substrate, a second binding site having an affinity for a target integrated circuit material and a protecting material coupled to the second binding site via a labile linkage to prevent the binding site from binding to the target integrated circuit material; exposing the template to an external stimulus to degrade the labile linkage; removing the protecting material; and binding the integrated circuit material to the second binding site.