Abstract:
本発明の例に関わる情報記録再生装置は、記録層と、前記記録層に電圧を印加して前記記録層に相変化を発生させて情報を記録する手段とを具備し、前記記録層は、少なくとも、化学式1:A x M y X 4 (0.1≦x≦2.2、1.5≦y≦2)で表されるスピネル構造を有する第1化合物を含むように構成されることを特徴とする。但し、Aは、Zn, Cd, Hgのグループから選択される少なくとも1種類の元素であり、Mは、Cr, Mo, W, Mn, Reのグループから選択される少なくとも1種類の遷移元素であり、Xは、Oである。
Abstract translation:信息记录/再现装置设有记录层,以及用于通过向记录层施加电压而在记录层中产生相变来记录信息的装置。 记录层至少含有由化学式(1)表示的具有尖晶石结构的第一化合物:AxMyX4(0.1 = x = 2.2,1.5 = y = 2),其中A是选自以下的至少一种元素: 由Zn,Cd和Hg组成的组,M是选自Cr,Mo,W,Mn和Re中的至少一种的过渡元素,X是O.
Abstract:
A method and apparatus for adaptive read and read-after-write for carbon nanotube recorders is described. In one embodiment, the invention is an apparatus, utilizing carbon nanotubes (CNTs) to read and write data, and deflecting the emissions of such CNTs precisely in the process. In an alternate embodiment, the invention is a method of locating CNTs for purposes of reading and writing data on a disk, using a rough location and feedback to refine the location into a precise location for the track, both for a group of heads and for individual heads within the group. Location may include both physical movement of the heads and deflection of emissions of the heads.
Abstract:
Le dispositif d'enregistrement comporte un réseau de micro-pointes (6), de dimension d'apex nanométrique, solidaires d'un même substrat 7. Ce réseau de micropointes coopère avec un support de mémoire (1), déformable, absorbant la dispersion de hauteur des micro-pointes (6) lors de la mise en contact du réseau et du support de mémoire, avant enregistrement, thermique, électrique et/ou mécanique des données. Le support de mémoire (1) comporte un empilement comprenant au moins une couche mémoire déformable déposée sur un substrat (4). La couche mémoire déformable peut être constituée par l'empilement d'une couche mémoire (2) et d'une couche souple (3), cette dernière étant déposée sur le substrat (4). Une couche (5) d'interface avec les micro-pointes (6) peut recouvrir la couche mémoire (2). L'appui d'une micro-pointe (6) sur le support de mémoire (1) provoque une déformation progressive de l'empilement, jusqu'à la couche souple (3).
Abstract:
A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium (202) of the data storage device (200) with respect to each other in first and second predefined directions. The positioning system (100) comprises a positioning apparatus comprising microfabricated first and second positioning assemblies. The positioning system further comprises a controller (102) to position a positionable support structure (140) of the first positioning assembly (104) in a first predefined direction within a range of positioning that is larger than the range of movement of a moveable support structure (118) of the first positioning assembly by controlling (A) a stationary support structure clamp (150) in clamping and unclamping the positionable support structure to and from the stationary support structure, (B) a moveable support structure clamp (144) in clamping and unclamping the positionable support structure to and from the moveable support structure, and (C) the movement of the moveable support structure.
Abstract:
There is disclosed herein an integrated scanning tunneling microscope and an integrated piezoelectric transducer and methods for making both. The device consists of one or two arm piezoelectric bimorph cantilevers (42, 46) formed by micromachining using standard integrated circuit processing steps. These cantilevers are attached to the substrate (32) at one area (80) and are free to move under the influence of piezoelectric forces which are caused by the application of appropriate voltages generated by control circuitry (88) and applied to pairs of electrodes (48, 36, 44; 52, 49, 44) formed as an integral part of the bimorph cantilever structure. The electric fields caused by the control voltages cause the piezoelectric bimorphs to move in any desired fashion within ranges determined by the design. The bimorph cantilevers have tips (66) with very sharp points formed thereon which are moved by the action of the control circuit (88) and the piezoelectric bimorphs so to stay within a very small distance of a conducting surface (84). The movements of the tip can be tracked to yield an image of the surface at atomic resolution.
Abstract:
There is disclosed herein an integrated scanning tunneling microscope and an integrated piezoelectric transducer and methods for making both. The device consists of one or two arm piezoelectric bimorph cantilevers (42, 46) formed by micromachining using standard integrated circuit processing steps. These cantilevers are attached to the substrate (32) at one area (80) and are free to move under the influence of piezoelectric forces which are caused by the application of appropriate voltages generated by control circuitry (88) and applied to pairs of electrodes (48, 36, 44; 52, 49, 44) formed as an integral part of the bimorph cantilever structure. The electric fields caused by the control voltages cause the piezoelectric bimorphs to move in any desired fashion within ranges determined by the design. The bimorph cantilevers have tips (66) with very sharp points formed thereon which are moved by the action of the control circuit (88) and the piezoelectric bimorphs so to stay within a very small distance of a conducting surface (84). The movements of the tip can be tracked to yield an image of the surface at atomic resolution.
Abstract:
A scanning probe microscope comprises a base, a positioning stage mounted on the base, a platform mounted on the positioning stage and a probe tip on the platform, the positioning stage comprising - a first and second linear displacement actuator, each having a main direction of displacement, the main directions of displacement of the first and second linear displacement actuator being oriented substantially parallel to each other, - a first and second strut or struts coupled directly or indirectly between the platform and ends of the first and second actuators where the first and second actuators terminate in the main direction of displacement respectively, at least the first strut or struts being directed at an oblique angle to the main direction of displacement of the actuators.