Abstract:
A magnetoresistance sensor There is provided a magnetoresistance sensor comprising a graphene-black phosphorus hybrid structure, wherein the graphene-black phosphorus hybrid structure comprises a black phosphorus layer and a graphene layer disposed on the black phosphorus layer. In particular, the magnetoresistance of the graphene-black phosphorus hybrid structure may be determined by a difference in a charge mobility and/or carrier density between the graphene layer and the black phosphorus layer, wherein the charge mobility and/or the carrier density of the graphene layer may be tunable by a gate voltage applied to the graphene-black phosphorus hybrid structure.
Abstract:
Magnetic sensors are disclosed, as well as methods for fabricating and using the same. In some embodiments, an EMR effect sensor includes a semiconductor layer. In some embodiments, the EMR effect sensor may include a conductive layer substantially coupled to the semiconductor layer. In some embodiments, the EMR effect sensor may include a first voltage lead coupled to the semiconductor layer. In some embodiments, the first voltage lead may be configured to provide a voltage for measurement by a voltage measurement circuit. In some embodiments, the EMR effect sensor may include a second voltage lead coupled to the conductive layer. In some embodiments, the second voltage lead may be configured to provide a voltage for measurement by a voltage measurement circuit. Embodiments of a Hall effect sensor having the same or similar structure are also disclosed.
Abstract:
Methods and apparatus provide a sensor having an integrated component coupled to a leadframe. In one embodiment, a sensor includes external leads on an opposite side of a die from the integrated component. In another embodiment, a leadframe includes a slot to reduce eddy currents.
Abstract:
The present invention is directed to the use of perovskite manganite thin films and other magnetic films that exhibit both planar Hall effect and biaxial magnetic anisotropy to form the active area in magnetic sensor devices and in magnetic bit cells used in magnetoresistive random access memory (MRAM) devices. The manganite thin films of the invention are ferromagnetic manganites of the formula R 1-x A x MnO 3 , wherein R is a rare-earth metal, A is an alkaline earth metal, and x is generally between about 0.15 and about 0.5.
Abstract:
An apparatus is provided which comprises: a first magnetic junction; a second magnetic junction; an interconnect adjacent to the first and second magnetic junctions; a first structure adjacent to the interconnect such that the first structure is adjacent to the first magnetic junction, wherein the first structure comprises a magnet with a first magnetization relative to a plane of a device; and a second structure adjacent to the interconnect such that the second structure is adjacent the second magnetic junction, wherein the second structure comprises a magnet with a second magnetization relative to the x-y plane of the device.