SHUTTER ASSEMBLY WITH CALIBRATION MATERIAL
    101.
    发明公开
    SHUTTER ASSEMBLY WITH CALIBRATION MATERIAL 审中-公开
    VERSCHLUSSANORDNUNG MIT EINEM KALIBRIUNUNGSMATERIAL

    公开(公告)号:EP2673605A4

    公开(公告)日:2015-09-23

    申请号:EP12744189

    申请日:2012-02-07

    Applicant: DIRAMED LLC

    CPC classification number: G01J3/0297 G01J3/0232 G01J3/28 G01J3/44 G01N21/274

    Abstract: A shutter assembly for use with a spectrometer having at least one source of optical radiation such as at least one laser capable of generating an excitation light beam having an illumination path. The shutter assembly includes a shutter having at least one of (i) at least one calibration material capable of generating a consistent spectrum within wavelengths utilizable by the spectrometer and (ii) a mirror capable of diverting at least one of the illumination path and a collection path relative to a calibration standard capable of generating a consistent spectrum within wavelengths utilizable by the spectrometer. The shutter assembly further includes a mechanism capable of moving the shutter into at least a first position in the path of the light beam and a second position out of the path of the light beam to enable a sample to be analyzed.

    Abstract translation: 一种用于光谱仪的快门组件,其具有至少一个光学辐射源,例如能够产生具有照明路径的激发光束的至少一个激光器。 快门组件包括具有以下至少一个的快门:(i)能够在由光谱仪可利用的波长内产生一致的光谱的至少一种校准材料,以及(ii)能够转移至少一个照明路径和集合 相对于能够在由光谱仪可利用的波长内产生一致光谱的校准标准的路径。 快门组件还包括能够将快门移动到光束的路径中的至少第一位置和离开光束的路径的第二位置以使得能够分析样本的机构。

    METHODS FOR OPTICALLY DETERMINING A CHARACTERISTIC OF A SUBSTANCE
    102.
    发明公开
    METHODS FOR OPTICALLY DETERMINING A CHARACTERISTIC OF A SUBSTANCE 审中-公开
    光学确定物质特性的方法

    公开(公告)号:EP2841924A1

    公开(公告)日:2015-03-04

    申请号:EP13717141.9

    申请日:2013-04-08

    Abstract: Optical computing devices are disclosed. One exemplary optical computing device (300) includes an electromagnetic radiation source (308) configured to optically interact with a sample (306) and at least two integrated computational elements (302, 304). The at least two integrated computational elements are configured to produce optically interacted light (314) and further configured to be associated with a characteristic of the sample. The optical computing device further includes a first detector (316) arranged to receive the optically interacted light from the at least two integrated computational elements and thereby generate a first signal corresponding to the characteristic of the sample.

    Abstract translation: 公开了光学计算设备。 一个示例性光学计算设备(300)包括被配置为与样本(306)和至少两个集成计算元件(302,304)光学相互作用的电磁辐射源(308)。 该至少两个集成计算元件被配置为产生光学交互光(314)并且还被配置为与样本的特性相关联。 所述光学计算装置进一步包括第一检测器(316),所述第一检测器被布置成接收来自所述至少两个集成计算元件的光学相互作用的光,并由此生成对应于所述样品的所述特性的第一信号。

    Verfahren zur Signalanalyse und mit einem Transceiver ausgestattetes THz- Zeitbereichsspektrometer zu seiner Anwendung
    103.
    发明公开
    Verfahren zur Signalanalyse und mit einem Transceiver ausgestattetes THz- Zeitbereichsspektrometer zu seiner Anwendung 审中-公开
    信号分析的方法,和与收发器配备太赫兹时域分光其应用

    公开(公告)号:EP2803960A1

    公开(公告)日:2014-11-19

    申请号:EP13167488.9

    申请日:2013-05-13

    CPC classification number: G01J3/0232 G01J3/42 G01J3/433 G01N21/3586

    Abstract: Gegenstand der Erfindung ist ein Signalanalyseverfahren für die THz-Zeitbereichsspektroskopie, das eine Amplitudenmodulation einer Folge von Anrege- und einer Folge von Abfragepulsen mit unterschiedlichen Modulationsfrequenzen beinhaltet. Ein weiterer Gegenstand der Erfindung ist ein mit einem Transceiver ausgestattetes THz-Zeitbereichsspektrometer mit 0°-Reflexionsgeometrie, das unter Anwendung des erfindungsgemäßen Signalanalyseverfahrens die Extraktion eines THz-Signals im Zeitbereich aus einem mehrere Größenordnungen höheren Grundsignal gestattet.

    Abstract translation: 本发明是用于太赫兹时域光谱学,其包括起始的序列,并且具有不同的调制频率的询问脉冲序列的幅度调制的信号分析方法。 本发明的另一个目的是配有0°-Reflexionsgeometrie其允许使用本发明的信号分析方法中的时间范围内的THz信号的幅值从更高的背景信号的几个数量级提取太赫兹时域分光的收发器。

    SPECTRAL INFORMATION READ DEVICE
    107.
    发明公开
    SPECTRAL INFORMATION READ DEVICE 审中-公开
    LESEGERÄTFÜRSPEKTRALDATEN

    公开(公告)号:EP2498073A1

    公开(公告)日:2012-09-12

    申请号:EP09851065.4

    申请日:2009-11-04

    Abstract: The apparatus (500) for reading spectral information out of image patterns includes a solid-state image sensor (510) for taking pictures of image patterns (115), a unit (520) for making one-dimensional images out of light having reflected at the image patterns, a spectroscope (530) introducing the one-dimensional images into the solid-state image sensor (510), a shutter unit (511) located in front of the solid-state image sensor (510), and a synchronizer (540) turning the shutter unit (511) on or off in synchronization with movement of the image patterns, the spectroscope (530) disperses light having entered thereinto into each of wavelengths, and makes three-dimensional image spectrum which is wavelength dispersive for each of pixels in association with each of locations of the image patterns.

    Abstract translation: 用于从图像图案中读取光谱信息的装置(500)包括用于拍摄图像图案(115)的固态图像传感器(510),用于使一维图像从光反射的单位(520) 图像图案,将一维图像引入固态图像传感器(510)的分光镜(530),位于固态图像传感器(510)前方的快门单元(511)和同步器( 540)与图像图案的移动同步地打开或关闭快门单元(511),分光器(530)将其中输入的光分散到每个波长中,并且使每个波长分散的三维图像光谱 与图像图案的每个位置相关联的像素。

    IN-LINE PROCESS MEASUREMENT SYSTEMS AND METHODS
    110.
    发明公开
    IN-LINE PROCESS MEASUREMENT SYSTEMS AND METHODS 审中-公开
    测量系统和程序的在线工艺

    公开(公告)号:EP2140238A1

    公开(公告)日:2010-01-06

    申请号:EP08799741.7

    申请日:2008-03-27

    Abstract: A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.

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