DUAL WRITE WORDLINE SRAM CELL
    21.
    发明公开
    DUAL WRITE WORDLINE SRAM CELL 审中-公开
    SRAM-ZELLE MIT双写WORTLEITUNG

    公开(公告)号:EP3143622A1

    公开(公告)日:2017-03-22

    申请号:EP15730011.2

    申请日:2015-06-04

    IPC分类号: G11C8/14 G11C11/412 G11C7/20

    摘要: A static random-access memory (SRAM) memory cell includes a pair of cross-coupled inverters and a gating transistor coupled to a first node of a first inverter of the pair of cross-coupled inverters. A gate of the gating transistor is coupled to a first wordline. The gating transistor is configured to selectively couple a bitline to the first node of the first inverter responsive to a first wordline signal. The first inverter has a second node coupled to a second wordline. The first wordline and the second wordline are each independently controllable.

    摘要翻译: 静态随机存取存储器(SRAM)存储单元包括一对交叉耦合的反相器和耦合到该对交叉耦合的反相器的第一反相器的第一节点的选通晶体管。 门控晶体管的栅极耦合到第一字线。 门控晶体管被配置为响应于第一字线信号选择性地将位线耦合到第一反相器的第一节点。 第一反相器具有耦合到第二字线的第二节点。 第一个字线和第二个字线都是独立可控的。

    SELECTIVE CONDUCTIVE BARRIER LAYER FORMATION
    28.
    发明公开
    SELECTIVE CONDUCTIVE BARRIER LAYER FORMATION 审中-公开
    BULDUNG EINER SELEKTIVENLEITFÄHIGENBARRIERESCHICHT

    公开(公告)号:EP3111473A2

    公开(公告)日:2017-01-04

    申请号:EP15718278.3

    申请日:2015-02-19

    IPC分类号: H01L21/768 H01L23/532

    摘要: A semiconductor device includes a die having a via coupling a first interconnect layer to a trench. The semiconductor device also includes a barrier layer on sidewalls and adjacent surfaces of the trench, and on sidewalls of the via. The semiconductor device has a doped conductive layer on a surface of the first interconnect layer. The doped conductive layer extends between the sidewalls of the via. The semiconductor device further includes a conductive material on the barrier layer in both the via and the trench. The conductive material is on the doped conductive layer disposed on the surface of the first interconnect layer.

    摘要翻译: 半导体器件包括具有将第一互连层耦合到沟槽的通孔的管芯。 半导体器件还在沟槽的侧壁和相邻表面上以及通孔的侧壁上还包括阻挡层。 半导体器件在第一互连层的表面上具有掺杂的导电层。 掺杂导电层在通孔的侧壁之间延伸。 半导体器件还包括在通孔和沟槽中的阻挡层上的导电材料。 导电材料位于配置在第一互连层表面上的掺杂导电层上。