Method for manufacturing semiconductor device
    34.
    发明公开
    Method for manufacturing semiconductor device 审中-公开
    制造半导体器件的方法

    公开(公告)号:EP1528594A3

    公开(公告)日:2006-06-28

    申请号:EP04024864.3

    申请日:2004-10-19

    IPC分类号: H01L21/762 H01L21/84

    摘要: It is an object of the invention to provide a peeling method which does not damage a peeling layer, and to perform peeling not only a peeling layer having a small-size area but also an entire peeling layer having a large-size area with a preferable yield. In the invention, after pasting a fixing substrate, a part of a glass substrate is removed by scribing or performing laser irradiation on the glass substrate which leads to providing a trigger. Then, peeling is performed with a preferable yield by performing peeling from the removed part. In addition, a crack is prevented by covering the entire face except for a connection portion of a terminal electrode (including a periphery region of the terminal electrode) with a resin.

    摘要翻译: 本发明的目的是提供一种剥离方法,其不损害剥离层,并且不仅剥离具有小尺寸区域的剥离层,而且还剥离具有大尺寸面积的整个剥离层 产量。 在本发明中,在粘贴固定基板之后,通过在玻璃基板上划线或者执行激光照射来去除玻璃基板的一部分,从而提供触发。 然后,通过从去除部分进行剥离,以优选的收率进行剥离。 另外,通过用树脂覆盖除端子电极的连接部分(包括端子电极的外围区域)之外的整个面来防止裂缝。

    Method for manufacturing semiconductor device
    36.
    发明公开
    Method for manufacturing semiconductor device 审中-公开
    赫尔斯特朗·赫斯特伦

    公开(公告)号:EP1528594A2

    公开(公告)日:2005-05-04

    申请号:EP04024864.3

    申请日:2004-10-19

    IPC分类号: H01L21/762 H01L21/84

    摘要: It is an object of the invention to provide a peeling method which does not damage a peeling layer, and to perform peeling not only a peeling layer having a small-size area but also an entire peeling layer having a large-size area with a preferable yield. In the invention, after pasting a fixing substrate, a part of a glass substrate is removed by scribing or performing laser irradiation on the glass substrate which leads to providing a trigger. Then, peeling is performed with a preferable yield by performing peeling from the removed part. In addition, a crack is prevented by covering the entire face except for a connection portion of a terminal electrode (including a periphery region of the terminal electrode) with a resin.

    摘要翻译: 本发明的目的是提供一种不损伤剥离层的剥离方法,并且不仅剥离具有小尺寸区域的剥离层,而且还可以剥离具有大尺寸区域的整个剥离层 产量。 在本发明中,在粘贴固定基板之后,通过在导致提供触发的玻璃基板上划线或进行激光照射来去除玻璃基板的一部分。 然后,通过从去除部分剥离而以优选的收率进行剥离。 此外,通过用树脂覆盖除了端子电极(包括端子电极的周边区域)的连接部分之外的整个表面来防止裂纹。

    Ultrathin integrated circuit: manufacture and application as label
    37.
    发明公开
    Ultrathin integrated circuit: manufacture and application as label 审中-公开
    UltradünnIntegrierter Schaltkreis:Anwendung als Etikett und Herstellung

    公开(公告)号:EP1453088A2

    公开(公告)日:2004-09-01

    申请号:EP04004083.4

    申请日:2004-02-23

    IPC分类号: H01L21/82 G06K19/04

    摘要: The present invention provides an ultrathin thin film integrated circuit and a thin film integrated circuit device including the thin film integrated circuit device. Accordingly, the design of a product is not spoilt while an integrated circuit formed from a silicon wafer, which is thick and produces irregularities on the surface of the product container. The thin film integrated circuit according to the present invention includes a semiconductor film as an active region (for example a channel region in a thin film transistor), unlike an integrated circuit formed from a conventional silicon wafer. The thin film integrated circuit according to the present invention is thin enough that the design is not spoilt even when a product such as a card or a container is equipped with the thin film integrated circuit.

    摘要翻译: 本发明提供一种超薄薄膜集成电路和包括薄膜集成电路器件的薄膜集成电路器件。 因此,产品的设计不会被损坏,而由硅晶片形成的集成电路是厚的并且在产品容器的表面上产生不规则性。 根据本发明的薄膜集成电路不同于由常规硅晶片形成的集成电路,包括半导体膜作为有源区(例如,薄膜晶体管中的沟道区)。 根据本发明的薄膜集成电路足够薄,即使当诸如卡或容器的产品配备有薄膜集成电路时,该设计也不会损坏。