Abstract:
This invention relates to a confocal fluorescence correlation microscope with real-time alignment read out. With this instrument it is possible to do confocal imaging together with the particle size determination at a chosen location in the specimen. In particular, this invention relates to a detector module with a fixed aperture and detection electronics that can be conveniently connected to an existing confocal or multiphoton microscope, near the base of the objective lens of the microscope. This detector splits a part of the signal and uses it to generate a spot on the confocal image. This shows the spot where an FCS measurement can be carried out, and the same signal can then be used to perform a fluorescence correlation measurement after parking the excitation beam of the confocal to that spot. No alignment step is necessary for obtaining the measurement.
Abstract:
A spectrometer (10) includes a two-dimensional array of modulatable microm-irrors (18), a detector (20), and an analyzer (22). The micro-mirrors are positioned for receiving individual radiation components forming a part of a radiation source. The micro-mirrors are modulated at different modulation rates in order to reflect individual radiation components at known and different modulation rates. The micro-mirrors combine a number of the reflected individual radiation components and reflect them to the detector. The detector receives the combined radiation components and creates an output signal. The analyzer is coupled to the detector to receive the output signal and to analyze at least some of the individual radiation components making up the combined reflection. By using a micro-mirror array that modulates the radiation components at different rates, all of the radiations components can be focused onto a single detector to maximize the signal-to-noise ratio of the detector.
Abstract:
A method and hardware for chromosome classification by decorrelation statistical analysis to provide color (spectral) karyotypes and to detect chromosomal aberrations.
Abstract:
A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of:
a) measuring in a repetitive mode a length of time intervals between photon counts, b) determining a function of the length of said time intervals, c) determining a function of at least one specific physical property of said units on basis of said function of the length of time intervals.
Abstract:
A dispersion measurement apparatus 1A includes a pulse forming unit 3, an imaging unit 5, and an operation unit 6. The pulse forming unit 3 forms a light pulse train Pb including a plurality of light pulses having time differences and center wavelengths different from each other from a light pulse Pa output from a pulsed laser light source 2. The imaging unit 5 includes an image sensor 51 capable of performing imaging at an imaging interval shorter than a minimum peak interval of the light pulse train Pb, and images a light pulse train Pc output from the pulse forming unit 3 and then passed through a measurement object B to generate imaging data. The operation unit 6 receives the imaging data, detects a temporal waveform of the light pulse train Pc for each pixel of the image sensor 51, and estimates a wavelength dispersion amount of the measurement object B for each pixel of the image sensor 51 based on a feature value of the temporal waveform. Thus, a dispersion measurement apparatus and a dispersion measurement method capable of measuring a wavelength dispersion by a simple configuration are realized.