摘要:
A photodiode device and a photodiode detector are provided. According to an embodiment, the photodiode device may include a first type lightly doped semiconductor base including a first surface and a second surfaces opposite to each other, a first electrode region being first type heavily doped and disposed on the first surface of the semiconductor base, a second electrode region being second type heavily doped and disposed on the second surface of the semiconductor base, wherein the first surface is a light incident surface.
摘要:
The present invention relates to a technique of producing spontaneous radiation sources on the basis on A III B V semiconductor compounds for the spectral range of 2.6 - 4.7 µm, and to a technology of producing photosensitive structures for the spectral range of 2.0 - 4.7 µm. In the first embodiment, the heterostructure comprises a substrate containing InAs, a barrier layer which contains InSbP and which is arranged on the substrate, and an active layer which contains InAsSbP and which is arranged on the barrier layer. Light-emitting diodes produced on the basis of the first embodiment of the heterostructure emit at a wavelength in the range of 2.6 - 3.1 µm. In the second embodiment, the heterostructure comprises a substrate containing InAs, an active area which contains InAsSb and which is arranged on the substrate, and a barrier layer which contains InSbP and which is arranged on the active area. The active area can comprise a InAsSb bulk active layer, InAs/InAsSb quantum wells or a GaInAs/InAsSb strained superlattice. Light-emitting diodes produced on the basis of the second embodiment of the heterostructure emit at a wavelength in the range of 3.1- 4.7pm, and photodiodes have broadband sensitivity in the range of 2.0 - 4.7 µm. In the method of producing a heterostructure, tert-butylarsine is used as a source of arsenic, and tert-butylphosphine is used as a source of phosphorus.
摘要翻译:本发明涉及一种在2.6-7.4μm的光谱范围内基于A III B V半导体化合物生产自发辐射源的技术,以及产生光谱范围为2.0-4.7μm的光敏结构的技术。 在第一实施例中,异质结构包括含有InAs的衬底,包含InSbP并且布置在衬底上的阻挡层,以及包含InAsbB并且布置在阻挡层上的有源层。 基于异质结构的第一实施例制造的发光二极管的发射波长在2.6-3.1μm的范围内。 在第二实施例中,异质结构包括含有InAs的衬底,其包含InAsSb并且布置在衬底上的有源区,以及包含InSbP并且布置在有源区上的阻挡层。 有源区可包括InAsSb体活性层,InAs / InAsSb量子阱或GaInAs / InAsSb应变超晶格。 基于异质结构的第二实施例产生的发光二极管的波长为3.1-4.7μm,光电二极管的宽度灵敏度在2.0-4.7μm的范围内。 在异质结构的制造方法中,使用叔丁基胂作为砷源,叔丁基膦用作磷源。
摘要:
The present invention provides strategies for improving the quality of the insulating layer in MIS and SIS devices in which the insulator layer interfaces with at least one pnictide-containing film. The principles of the present invention are based at least in part on the discovery that very thin (20 nm or less) insulating films comprising a chalcogenide such as i-ZnS are surprisingly superior tunnel barriers in MIS and SIS devices incorporating pnictide semiconductors. In one aspect, the present invention relates to a photovoltaic device, comprising: a semiconductor region comprising at least one pnictide semiconductor; an insulating region electrically coupled to the semiconductor region, wherein the insulating region comprises at least one chalcogenide and has a thickness in the range from 0.5 nm to 20 nm; and a rectifying region electrically coupled to the semiconductor region in a manner such that the insulating region is electrically interposed between the collector region and the semiconductor region.
摘要:
A III-nitride based field effect transistor obtains improved performance characteristics through manipulation of the relationship between the in-plane lattice constant of the interface of material layers. A high mobility two dimensional electron gas generated at the interface of the III-nitride materials permits high current conduction with low ON resistance, and is controllable through the manipulation of spontaneous polarization fields obtained according to the characteristics of the III-nitride material. The field effect transistor produced can be made to be a nominally on device where the in-plane lattice constants of the material forming the interface match. A nominally off device may be produced where one of the material layers has an in-plane lattice constant that is larger than that of the other layer material. The layer materials are preferably InAlGaN/GaN layers that are particularly tailored to the characteristics of the present invention.
摘要:
A compound semiconductor device discloses a substrate (10), active layers or compound semiconductor material layer (12, 14, 16) that are sequentially formed overt the substrate, an opening (20) in the layer (16), insulating layers (30) at side walls of the opening, a fourth compound semiconductor material (50) and reaction regions (74) within the opening, metal contacts (70) on the reaction region, and an insulating layer (80) and metal layer (72) on top of the layer (16).
摘要:
A channel (16) of a FinFET (10) has a channel core (24) and a channel envelope (32), each made from a semiconductor material defining a different lattice structure to exploit strained silicon properties. A gate is coupled to the channel envelope through a gate dielectric. Exemplary materials are Si and SixGe1-x, wherein 78