Abstract:
One example includes an integrated circuit including at least one electrical interconnects disposed on an elongate are extending away from a main portion of the integrated circuit and a microelectromechanical layer including an oscillating portion, the microelectromechanical layer coupled to the main portion of the integrated circuit.
Abstract:
One example includes an integrated circuit including at least one electrical interconnects disposed on an elongate are extending away from a main portion of the integrated circuit and a microelectromechanical layer including an oscillating portion, the microelectromechanical layer coupled to the main portion of the integrated circuit.
Abstract:
Procédé de réalisation d'une structure comportant une partie active comportant au moins deux couches à partir d'un premier substrat silicium monocristallin, ledit procédé comportant les étapes : a) réalisation d'au moins une zone de silicium poreux dans le premier substrat, b) réalisation d'un dépôt par croissance épitaxiale d'une couche de silicium monocristallin sur toute la surface du premier substrat et sur la surface de la zone de silicium poreux, c) usinage de la couche de monocristalline obtenue par épitaxie au niveau de la zone en silicium poreux pur réaliser une première zone suspendue, d) retrait ou oxydation du silicium poreux, e) dépôt d'une couche sacrificielle sélective par rapport au silicium, f) usinage du premier substrat, g) libération des zones suspendues par retrait de la couche sacrificielle.
Abstract:
A method of fabricating an elastomeric structure, comprising: forming a first elastomeric layer on top of a first micromachined mold, the first micromachined mold having a first raised protrusion which forms a first recess extending along a bottom surface of the first elastomeric layer; forming a second elastomeric layer on top of a second micromachined mold, the second micromachined mold having a second raised protrusion which forms a second recess extending along a bottom surface of the second elastomeric layer, bonding the bottom surface of the second elastomeric layer onto a top surface of the first elastomeric layer such that a control channel forms in the second recess between the first and second elastomeric layers; and positioning the first elastomeric layer on top of a planar substrate such that a flow channel forms in the first recess between the first elastomeric layer and the planar substrate.
Abstract:
The utilization of single crystal diamond in a nano- or micro-machine (N/MEMS) device is difficult, and there has been no report on such utilization. The reason for this resides in that it is difficult to grow single crystal diamond on an oxide which is a sacrifice layer. In a conventional technique, a cantilever or the like is produced by forming polycrystalline diamond or nanodiamond on an oxide as a sacrifice layer, but the mechanical performance, vibration characteristics, stability, and reproducibility of the produced cantilever or the like are unsatisfactory. In the present invention, utilizing the fact that the high concentration ion-implanted region in a diamond substrate 101 is modified into graphite, the layer 104 modified into graphite as a sacrifice layer is removed by electrochemical etching to obtain the diamond layer remaining on the resultant substrate as a movable structure. The produced cantilever 106 exhibited high frequency resonance. The use of single crystal diamond makes it possible to improve the N/MEMS device in mechanical performance and stability as well as electric properties.
Abstract:
A microfluidic device (100) made from glass, ceramic or vitroceramic, comprises an upper layer (122), a lower layer (124) and an intermediate layer (114), the intermediate layer (114) comprising an upper face (114b) and a lower face (114a), the lower face (114a) comprising a first open structured surface defining a first microfluidic channel (126) and the upper face (114b) comprising a second open structured surface defining a second microfluidic channel (112); the lower surface of the intermediate layer (114) cooperating with a first planar layer closing the first microchannel (126); the upper face (114b) of the intermediate layer (114) cooperating with a second planar layer (130), closing the second microfluidic channel (112) in a sealed manner, and the second planar layer constituting an intermediate layer (130) which cooperates, on its face opposite the intermediate layer (114), with another layer (122) comprising on its inner face (122a) a structured surface defining a third microfluidic channel (128).
Abstract:
A method for at least partially inserting a plug into a hole, said method comprising the steps of a) providing a at least one substrate with at least one hole wherein said at least one hole has a largest dimension of from 1 μm to 300 μm, b) providing a piece of material, wherein said piece of material has a larger dimension than said at least one hole, c) pressing said piece of material against the hole with a tool so that a plug is formed, wherein at least a part of said piece of material is pressed into said hole, d) removing the tool from the piece of material. There is further disclosed a plugged hole manufactured with the method. One advantage of an embodiment is that an industrially available wire bonding technology can be used to seal various cavities. The existing wire bonding technology makes the plugging fast and cheap.
Abstract:
The invention relates to a MEMS device which is robust to the misalignment and does not require the double-side wafer processing in the manufacture of a MEMS device such as an angular velocity sensor, an acceleration sensor 1A, a combined sensor or a micromirror. After preparing a substrate 2 having a space 4 therein, holes 18 are formed in a device layer at positions where fixed components such as a fixing portion 11, a terminal portion 16 and a base 10 that are fixed to a supporting substrate 2a are to be formed, and the holes 18 are filled with a fixing material 19 so that the fixing material 19 reaches the supporting substrate 2a, thereby fixing the device layer 2c around the holes 18 to the supporting substrate 2.