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45 条记录 (耗时 0.016 秒)

    METHOD AND APPARATUS FOR REMOTELY BUFFERING TEST CHANNELS
    1.
    发明公开
    METHOD AND APPARATUS FOR REMOTELY BUFFERING TEST CHANNELS 审中-公开
    对于测试方法和装置中的频道，FERNPUFFERUNG

    公开(公告)号：EP1794607A2

    公开(公告)日：2007-06-13

    申请号：EP05795133.7

    申请日：2005-09-08

    申请人： FormFactor, Inc.

    发明人： MILLER, Charles, A.

    IPC分类号： G01R31/28

    CPC分类号： G01R31/3008

    摘要： A system is provided to enable leakage current measurement or parametric tests to be performed with an isolation buffer provided in a channel line. Multiple such isolation buffers are used to connect a single signal channel to multiple lines. Leakage current measurement is provided by providing a buffer bypass element, such as a resistor or transmission gate, between the input and output of each buffer. The buffer bypass element can be used to calibrate buffer delay out of the test system by using TDR measurements to determine the buffer delay based on reflected pulses through the buffer bypass element. Buffer delay can likewise be calibrated out by comparing measurements of a buffered and non-buffered channel line, or by measuring a device having a known delay.

    CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST
    2.
    发明公开
    CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST 审中-公开
    要检查测试信号的一个设备进行无接触ANSWER

    公开(公告)号：EP1754074A2

    公开(公告)日：2007-02-21

    申请号：EP05712707.8

    申请日：2005-02-02

    申请人： FormFactor, Inc.

    发明人： MILLER, Charles, A.

    IPC分类号： G01R31/302

    CPC分类号： G01R1/0491 ,  G01R1/07 ,  G01R1/07378 ,  G01R31/3025

    摘要： An interface device receives test data from a tester. A signal representing the test data is transmitted to a device under test through electromagnetically coupled structures on the interface device and the device under test. The device under test processes the test data and generates response data. A signal representing the response data is transmitted to the interface device through electromagnetically coupled structures on the device under test and the interface device.

    HIGH BANDWIDTH PASSIVE INTEGRATED CIRCUIT TESTER PROBE CARD ASSEMBLY
    3.
    发明授权
    HIGH BANDWIDTH PASSIVE INTEGRATED CIRCUIT TESTER PROBE CARD ASSEMBLY 有权
    被动宽带测试卡集成电路

    公开(公告)号：EP1159624B1

    公开(公告)日：2004-01-02

    申请号：EP00914677.0

    申请日：2000-02-23

    申请人： FormFactor, Inc.

    发明人： MILLER, Charles, A.

    IPC分类号： G01R1/073 ,  G01R1/067

    CPC分类号： G01R1/073 ,  G01R1/06766 ,  G01R1/06772

    摘要： Described herein is a probe card assembly providing signal paths for conveying high frequency signals between bond pads of an integrated circuit (IC) and an IC tester. The frequency response of the probe card assembly is optimized by appropriately distributing, adjusting and impedance matching resistive, capacitive and inductive impedance values along the signal paths so that the interconnect system behaves as an appropriately tuned Butterworth or Chebyshev filter.

    PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS
    5.
    发明公开
    PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS 审中-公开
    为了路由信号的可编程设备上的探针卡

    公开(公告)号：EP1851558A1

    公开(公告)日：2007-11-07

    申请号：EP06719969.5

    申请日：2006-01-30

    申请人： FormFactor, Inc.

    发明人： GRANICHER, Dane, C. ,  HENSON, Roy, J. ,  MILLER, Charles, A.

    IPC分类号： G01R31/02

    CPC分类号： G01R31/31926 ,  G01R1/07385 ,  G01R31/2889

    摘要： A probe card of a wafer test system includes one or more programmable Ics , such as FPGAS (150), to provide routing from individual test signal channels to one of multiple probes (16). The programmable ICs can be placed on a base PCB (30) of the probe card, or on a daughtercard (100) attached to the probe card. With programmability, the PCB (30) can be used to switch limited test system channels away from unused probes (16). Programmability further enables a single probe card to more effectively test devices having the same pad array, but having different pin-outs for different device options. Reprogrammability also allows test engineers to re-program as they are debugging a test program. Because the programmable IC (150) typically includes buffers that introduce an unknown delay, in one embodiment measurement of the delay is accomplished by first programming the programmable IC (150) to provide a loop back path to the test system so that buffer delay can be measured, and then reprogramming the programmable IC (150) now with a known delay to connect to a device being tested.

    A METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS
    6.
    发明公开
    A METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS 审中-公开
    方法和设备校准和/或歪斜消除KOMMUNIKAITONSKANÄLEN的

    公开(公告)号：EP1787234A2

    公开(公告)日：2007-05-23

    申请号：EP05764595.4

    申请日：2005-07-11

    申请人： FormFactor, Inc.

    发明人： MILLER, Charles, A.

    IPC分类号： G06K5/04

    CPC分类号： G01R35/005 ,  G01R31/3016 ,  G01R31/31723 ,  G01R31/318511 ,  G01R31/3191 ,  G01R31/31937

    摘要： A series of pulses may be driven down each drive channel ('A', and 514, 516, 518, Fig. 5), which creates a series of composite pulses at the output of the buffer (532). Each composite pulse is a composition of the individual pulses driven down the drive channels. Timing offsets associated with the drive channels may be adjusted (406) until the individual pulses of the composite pulse align or closely align. Those timing offsets calibrate and/or deskew the drive channels, compensating for differences in the propagation delays through the drive channels. The composite pulse may be feed back to the tester through compare channels (544 and 546), and offsets associated with compare signals for each compare channel may be aligned to the composite pulse, which calibrates and/or deskews the compare channels.

    WIRELESS TEST CASSETTE
    7.
    发明公开
    WIRELESS TEST CASSETTE 审中-公开
    DRAHTLOSE检验盒，

    公开(公告)号：EP1735628A2

    公开(公告)日：2006-12-27

    申请号：EP05736081.0

    申请日：2005-04-08

    申请人： FormFactor, Inc.

    发明人： ELDRIDGE, Benjamin, N. ,  KHANDROS, Igor, Y. ,  MILLER, Charles, A. ,  SPORCK, Nicholas, A.

    IPC分类号： G01R31/02

    CPC分类号： G01R1/0491 ,  G01R1/073 ,  G01R31/3025

    摘要： A base controller (210) disposed in a test cassette (110) receives test data for testing a plurality of electronic devices (236a,236b). The base controller wirelessly transmits the test data to a plurality of wireless test control chips (214a,214b,214c,214d,214e,214f,214g), which write the test data to each of the electronic devices. The wireless test control chips (214a,214b,214c,214d,214e,214f,214g), then read response data generated by the electronic devices (236a, 236b), and the wireless test control chips wirelessly transmit the response data to the base controller (210).