Semiconductor chip carrier and method of making it
    1.
    发明公开
    Semiconductor chip carrier and method of making it 失效
    Halbleiterchipträgerund Verfahren zu dessen Herstellung。

    公开(公告)号:EP0359513A2

    公开(公告)日:1990-03-21

    申请号:EP89309232.0

    申请日:1989-09-12

    申请人: HITACHI, LTD.

    摘要: A semiconductor chip carrier for carrying a single chip (15) and having a built-in capacitor, comprises a ceramic insulator body (2) having first and second opposite main faces, and a plurality of conductor lines (6,7) comprising power lines, ground lines and signal lines for forming connections to said chip extending through said ceramic body (2) from one main face to the other. A layer (3) of ceramic dielectric material is embedded in said ceramic body remote from said main faces, and electrode layers embedded in the ceramic body (2) contact the capacitor layer (3), to form the built-in capacitor. The power and ground lines (16) pass through and contact the capacitor layer (3) and are connected to said electrodes so that said capacitor provides capacitance between the power lines and the ground lines. To minimize noise generation and improve signal processing speed, the signal lines (7) do not contact said capacitor layer (3) and extend past it at locations spaced laterally from it.

    摘要翻译: 一种用于承载单芯片(15)并具有内置电容器的半导体芯片载体,包括具有第一和第二相对主面的陶瓷绝缘体(2),以及包括电力线 ,接地线和信号线,用于形成从所述陶瓷体(2)延伸穿过所述芯片从一个主面到另一主面的连接。 陶瓷电介质材料的层(3)嵌入在远离所述主面的所述陶瓷体中,并且嵌入陶瓷体(2)中的电极层与电容器层(3)接触,形成内置的电容器。 电源和接地线(16)通过并接触电容器层(3)并与所述电极连接,使得所述电容器在电源线和接地线之间提供电容。 为了最小化噪声产生并提高信号处理速度,信号线(7)不与所述电容器层(3)接触并且在与其横向间隔开的位置延伸过去。

    Oxide resistor
    10.
    发明公开
    Oxide resistor 失效
    氧化物电阻

    公开(公告)号:EP0165821A3

    公开(公告)日:1986-07-16

    申请号:EP85304428

    申请日:1985-06-20

    申请人: HITACHI, LTD.

    摘要: A composite sintered oxide resistor comprising crystal grains of zinc oxide and crystal grains of a zinc oxide compound of other metal or semi-metal element than zinc, and a grain boundary layer having an electric resistance equal to or lower than that of the crystal grains of zinc oxide between the individual crystal grains has a very large withstanding capacity against switch surge, a small non-linear coefficient of voltage in the voltage-current characteristics, a positive, smaller resistance-temperature coefficient, and a small percent change in resisitivity after heat treatment at 500° in the atmosphere.