摘要:
To provide a Cu core ball that prevents any soft errors and decreases any connection failure. A solder plating film formed on a surface of a Cu ball is an Sn solder plating film or is made of lead-free solder alloy, a principal ingredient of which is Sn. The solder plating film contains U content of 5 ppb or less and Th content of 5 ppb or less. The Cu ball includes purity of not less than 99.9 % through not more than 99.995%. Pb and/or Bi contents therein are a total of 1 ppm or more. A sphericity thereof is 0.95 or more. The obtained Cu core ball has ± dose of 0.0200 cph/cm 2 or less.
摘要翻译:提供一个铜芯球,防止任何软错误并减少任何连接失败。 在Cu球表面上形成的焊料镀膜是Sn焊料镀膜,或者由主要成分为Sn的无铅焊料合金制成。 该镀锡膜包含5ppb或更少的U含量和5ppb或更少的Th含量。 Cu球的纯度不低于99.9%,不超过99.995%。 其中Pb和/或Bi含量总计为1ppm或更多。 球形度为0.95以上。 所获得的Cu芯球的剂量为±0.0200cph / cm 2或更小。
摘要:
To provide a Cu core ball that prevents any soft errors and decreases any connection failure. A solder plating film formed on a surface of a Cu ball is an Sn solder plating film or is made of lead-free solder alloy, a principal ingredient of which is Sn. The solder plating film contains U content of 5 ppb or less and Th content of 5 ppb or less. The Cu ball includes purity of not less than 99.9 % through not more than 99.995%. Pb and/or Bi contents therein are a total of 1 ppm or more. A sphericity thereof is 0.95 or more. The obtained Cu core ball has α dose of 0.0200 cph/cm 2 or less.
摘要翻译:提供防止任何软错误并减少任何连接故障的铜芯球。 在Cu球的表面形成的焊锡镀膜是Sn焊锡镀膜,或者是由Sn的主要成分的无铅焊料合金构成。 焊料镀膜含有5ppb以下的U含量和5ppb以下的Th含量。 Cu球的纯度不低于99.9%,不超过99.995%。 其中Pb和/或Bi含量总共为1ppm以上。 其球形度为0.95以上。 得到的Cu芯球的剂量为0.0200cph / cm 2以下。
摘要:
The present invention provides a transfer substrate for transferring a metal wiring material to a transfer-receiving object, the transfer substrate comprising a substrate, at least one metal wiring material formed on the substrate and an underlying metal film formed between the substrate and the metal wiring material, wherein the metal wiring material is a molded article prepared by sintering, e.g., gold powder having a purity of 99.9% by weight or more and an average particle size of 0.01 µm to 1.0 µm and the underlying metal film is composed of a metal such as gold or an alloy. The transfer substrate is capable of transferring a metal wiring material to the transfer-receiving object even at a temperature for heating the transfer-receiving object of 80 to 300°C.
摘要:
To provide a Cu core ball that prevents any soft errors and decreases any connection failure. A solder plating film formed on a surface of a Cu ball is an Sn solder plating film or is made of lead-free solder alloy, a principal ingredient of which is Sn. The solder plating film contains U content of 5 ppb or less and Th content of 5 ppb or less. The Cu ball includes purity of not less than 99.9 % through not more than 99.995%. Pb and/or Bi contents therein are a total of 1 ppm or more. A sphericity thereof is 0.95 or more. The obtained Cu core ball has ± dose of 0.0200 cph/cm 2 or less.
摘要:
A transfer substrate for transferring a metal wiring material to a transfer target including a substrate, at least one metal wiring material formed on the substrate, at least one coating layer formed on a surface of the metal wiring material, and an underlying metal film formed between the substrate and the metal wiring material, in which the metal wiring material is a compact formed by sintering metal powder such as gold powder having a purity of 99.9 wt% or more and an average particle size of 0.01 µm to 1.0 µm, and the coating layer is a predetermined metal such as gold or an alloy having a different composition from that of the metal wiring material and has a total thickness of 1 µm or less, and the metal underlying film is made of a predetermined metal such as gold or an alloy. The transfer substrate can lower heating temperature on the transfer target side.
摘要:
The present invention provides a transfer substrate for transferring a metal wiring material to a transfer-receiving object, the transfer substrate comprising a substrate, at least one metal wiring material formed on the substrate and an underlying metal film formed between the substrate and the metal wiring material, wherein the metal wiring material is a molded article prepared by sintering, e.g., gold powder having a purity of 99.9% by weight or more and an average particle size of 0.01 µm to 1.0 µm and the underlying metal film is composed of a metal such as gold or an alloy. The transfer substrate is capable of transferring a metal wiring material to the transfer-receiving object even at a temperature for heating the transfer-receiving object of 80 to 300°C.